Online proceedings - EDA Publishing Association

11-13
May 2011, Aix-en-Provence, France
Figure 1: Schematic diagram of the contactless DEP microchip
for particle focusing using insulating structures.
(a)
(b)
Figure 5: Transient simulation of tracks of negative
dielectrophoretic latex particles under varying electric field
strengths and inlet velocity. The relative dielectric permittivity
and conductivity of particles were 2.55 and 9.28×10 -4 S/m,
respectively.
(c)
Figure 2: (a) The scanning electron microscopy (SEM) image
of the silicon mold and (b) PDMS replica. (c) The image of the
chip for particle focusing taken by the optical microscope.
Figure 3: The schematic illustration of the experimental set up
for measuring the impedance of the PDMS barrier.
Figure 6: Experimental results of focusing of fluorescent latex
particles at different inlet flow rates and under varying electric
field strengths (at a frequency of 1 MHz). The images of the
last set of X-patterned insulating structures (the region marked
by the dash line in the layout) demonstrate the performance of
focusing.
Figure 4: The measured impedance of the PDMS barrier under
different frequencies and the fitting curve to experimental data
using the least-squares method.
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