Research in Engineering Education Symposium 2011 - rees2009

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Universidad Politécnica de Madrid (UPM) Página 106 de 957 Virtual Instruments in dimensional metrology Jesús de Vicente y Oliva jvo@etsii.upm.es Universidad Politécnica de Madrid Spain Angel María Sánchez Pérez amsanchez@etsii.upm.es Universidad Politécnica de Madrid Spain Wilmar Hernández Perdomo whernan@ics.upm.es Universidad Politécnica de Madrid Spain Abstract: During the last five years, in order to improve understanding of content related to "Coordinate Metrology", the Laboratorio de Metrología y Metrotecnia (LMM) from the Polytechnic University of Madrid offers its PhD students, as a course work, the construction of a virtual instrument. This virtual instrument simulates the imaging of a part to be measured by optical dimensional metrology instruments (microscopes, profile projectors, vision machines). The LMM provides students with images similar to those they would obtain with real instrumentation for the instrument adjustment and calibration process. Working with these images, students should determine the adjustment parameters of the virtual instrument. Once these parameters are set, the student can perform the proper calibration of the virtual instrument. Beyond this process, the instrument is already able to perform traceable measurement. In order to do that, LMM offers students some images of parts. Students should perform some measurements using those images and estimate the corresponding uncertainties. Introduction Professors of the Laboratorio de Metrología y Metrotecnia (LMM) from the Polytechnic University of Madrid have been teaching more than 30 years the subject "Dimensional Metrology" in doctorate programs. Currently, this course belongs to the Interuniversity PhD Program "Metrology and Industrial Quality" of the National Distance Education University (UNED) and the Polytechnic University of Madrid (UPM). Also, the LMM is the oldest Spanish laboratory accredited by ENAC (Spanish National Accreditation Board) to perform dimensional calibrations. During five years, the LMM has offered its students the construction and use of a virtual instrument as course work into the subject “Dimensional Metrology”. This instrument is a virtual scanner. The student receive, from the LMM, images corresponding to a real o Proceedings of Research in Engineering Education Symposium 2011 Madrid, 4 th - 7 th October 2011
Universidad Politécnica de Madrid (UPM) Página 107 de 957 simulated scanning of a real part in a real instrument. The student will receive from the LMM such images electronically. The objective to be achieved is that the student will improve the understanding of whole process of measurement (JCGM, VIM 3rd, 2008): 1. design and construction of the instrument, 2. adjustment of the instrument (VIM 3rd, 2008, 3.11), 3. instrument calibration (VIM 3rd, 2008, 2.39), 4. estimation of the calibration uncertainty and 5. estimation of instrumental measurement uncertainty (VIM 3rd, 2008, 4.24). Both the chosen instrument (scanner or microscope) and the proposed work plan permit, if student have access to real instrumentation, the repetition of the whole process on a real instrument. In the opposite situation, students can work exclusively with LMM generated images. Instrument choice Authors have chosen a commercial scanner capable of obtaining a photographic image of a plane measurand. Figure 1 shows the image of a scale obtained using the commercial scanner shown at the left: a Canon CanoScan LIDE 200. This instrument has a working area of 210 x 297 mm and an optical resolution up to 4800 dpi (dots per inch). Using this device the LMM has generated all the images sent to students. In fact, it can be used any other optical instrument capable of providing two-dimensional graphic image of a measurand, as it could be a microscope equipped with a digital camera. In practice, the adjustment and calibration techniques presented to students were developed by LMM to be used with microscopes. The main restriction introduced by the commercial scanner over a microscope or profile projector is that the part to be measured must have all geometry to check on the plane that rests directly on the scanner glass. Figure 1: Image of scale obtained with the commercial scanner showed on the left Proceedings of Research in Engineering Education Symposium 2011 Madrid, 4 th - 7 th October 2011
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Research in Engineering Education Symposium 2011 - rees2009

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