UNIVERSIDAD COMPLUTENSE DE MADRID

Bibliografía
[Enl91] Enlow et alt., “Response of Advanced Bipolar Processes to Ionizing Radiation”,
IEEE Transactions on Nuclear Science, vol. 38, nº. 6, pp. 1342-1351, December
1991.
[Fac00] F. Faccio, “COTS for LHC radiation environment: The rules of the game”.
Proceedings of the 6 th Workshop on Electronics for the LHC Experiments (LEB2000),
Krakow, Poland, 2000, pp 50-63.
[Fer01] A.C. Fernandes, I.C. Gonçalves, J.G. Marques, J. Santos, A.J.G. Ramalho, M. Osvay.
“Mixed-field dosimetry of a fast neutron beam at the Portuguese Research Reactor
for the irradiation of electronic circuits – measurements and calculations”,
Proceedings of the 11 th International Symposium. on Reactor Dosimetry, Brussels,
19-23 Aug. 2002.
[Fla96] O. Flament, J. L. Autran, P. Roche, J. L. Leray, O. Musseau, R. Truche and E. Orsier,
“Enhanced Total Dose Damage in Junction Field Effect Transistors and Related
Linear Integrated Circuits”, IEEE Transactions on Nuclear Science, vol. 43, nº 6, pp.
3060-3067, December 1996.
[Fla98] O. Flament, C. Chabrerie, V. Ferlet-Cavrois, J. L. Leray, F. Faccio and P. Jarron, “A
Methodology to Study Lateral Parasitic Transistors in CMOS Technologies”, IEEE
Transactions on Nuclear Science, Vol. 45, nº. 3, pp. 1385-1389, June 1998.
[For99] S. Forster, A. Hoffmann, J. P. Charles, S. E. Kerns, D. V Kerns Jr., M. De la
Bardonnie and P. Mialhe, “Electrical and Optical Analysis of Low Fluence Fast
Neutron Damage to JFETs”, Proceedings of the Fifth Workshop on Radiation Effects
on Components and Systems, pp. 508-510, Fontevraud (France), September1999.
[Gil00] K. Gill, “Radiation effects on electronics components and systems for the LHC”,
CERN training course, Ginebra (Suiza), 10-12 de Abril de 2000.
[Giu01] F. Giustino, “Radiation Effects on Semiconductor Devices. Study of the Enhanced
Low Dose Rate Degradation”, Tesis doctoral, Instituto Politecnico di Torino, Marzo
2001.
[Gor99] J. L. Gorelick, S. S. McClure and C. Swink, “Radiation evaluation of plastic
encapsulated transistors and microcircuits for use in space applications”, Proceedings
of the IEEE Radiation Effects Data Workshop, Norfolk (USA), July, 12 th -17 th , 1999,
pp. 102-106.
[Gov84] J. E Gover and M. A. Rose, short course at the IEEE Nuclear Science and Radiation
Effect Conference, Colorado Springs, CO, USA, 1984.
[Gra95] P. R. Gray and R. G. Meyer, Análisis y diseño de circuitos integrados analógicos, 3ª
edición, Prentice Hall Hispanoamericana, S. A, México, 1995. Versión en castellano
de Análisis and Design of Analog Integrated Circuits”, John Wiley & Sons, Inc.,
1993.
[Gre97] E. W. Greeneich, Analog Integrated Circuits, Chapman & Hall, International
Thomson Publishing, United States of America, 1997.
[Guc01] D. Guckenberger, D. M. Hiemstra, “Simultaneous Cryogenic Temperature (77K) and
Total Dose Ionizing Radiation Effects on COTS Amplifiers”, Proceedings of the
IEEE Radiation Effects Data Workshop, Vancouver (Canada), July 16 th –20 th , 2001,
pp. 14-18.
[Gun03] S. T. Gunaseelan, C. R. Selvakumar and D. Hiemstra, “Radiation Effects and
Annealing Behaviour of Operational Amplifiers for Space Application”, Proceedings
262