UNIVERSIDAD COMPLUTENSE DE MADRID

267
Bibliografía
[Sco89] J. H. Scofield and T. P. Doerr, “Correlation Between Preirradiation 1/f Noise and
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[Sex85] F. W. Sexton and J. R. Schwank, “Correlation of Radiation Effects in Transistors and
Integrated Circuits”, IEEE Transactions on Nuclear Science, vol. 32, nº 6, pp. 3975-
3981, December 1985.
[Sha02] R. E. Sharp and S. L. Pater, “High total dose effects on input bias current for COTS
operational amplifiers”, Proceedings of the 7th Workshop on Radiation Effects on
Components and Systems, pp. 71-74, Padova (Italy), September 2002.
[Sha90] M. R. Shaneyfelt, J. R. Schwank, D. M. Fleetwood, P. S. Winokur, K. L. Hughes and
F.W. Sexton, “Field Dependence on Interface-Trap Buildup in Polysilicon and Metal
Gate MOS Devices”, IEEE Transactions on Nuclear Science, vol. 37, nº 6, pp. 1632-
1640, December 1990
[Sha92] M. R. Shaneyfelt, J. R. Schwank, D. M. Fleetwood, P. S. Winokur, K. L. Hughes G.
L. Hash and M. P. Connors, “Interface-Trap Buildup Rates in Wet and Dry Oxides”,
IEEE Transactions on Nuclear Science, vol. 39, nº 6, pp. 2244-2251, December 1992.
[Sha96] A. K. Sharma, K. Sahu and S. Brashears “Total Ionizing Dose (TID) Evaluation
Results of Low Dose Rate Testing for NASA Programs”, Proceedings of the IEEE
Radiation Effects Data Workshop, Indian Wells (US), July, 19, 1996, pp. 13-18
[Smi77] L. T. Smith, L. Apodaca, V. R. De Martino and J. W. Trew, “Charge loss and
recovery characteristics of irradiated tantalum capacitors”, IEEE Transactions on
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[Smi94] D. Smith, M. Koen, A. F. Witalski, “Evolution of High-Speed operational
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[Soc85] S. Soclof, “Analog Integrated Circuits”, Prentice-Hall Inc., Eaglewood Cliffs, NJ,
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[Sro88] J. R. Srour and J. M. McGarrity “Radiation Effects on Microelectronics in Space”,
Proceedings of the IEEE, Vol.76, nº 11, pp.1443-1469, Nov 1988.
[Sta67] R. Stata, “User’s guide to applying and measuring operational amplifiers
specifications”, Application notes from Analog Devices, March 1967.
[Ste02] A. L. Sternberg, L. W. Massengill, R. D. Schrimpf, Y. Boulghassoul, H. J. Barnaby,
S. Buchner, R.L.Pease and J. W. Howard, “Effect of Amplifier Parameters on Single-
Event Transients in an Inverting Operational Amplifier”, IEEE Transactions on
Nuclear Science, vol. 49, nº 3, pp. 1496-1501, June 1992.
[Sum87] G. P. Summers, E. A. Burke, C. J. Dale, E. A. Wolicki, P. W. Marshall and M.A.
Gehlhausen, “Correlation of Particle Induced Displacement Damage in Silicon”,
IEEE Transactions on Nuclear Science, Vol. 34, pp. 1134-1139, December 1987.
[Sum88] G. P. Summers, E. A. Burke, M. A. Xapsos, C. J. Dale, P. W. Marshall and E. L.
Petersen, “Displacement Damage in GaAs structures”, IEEE Transactions on Nuclear
Science, Vol. 35, nº 6, pp. 1121-1226, December 1988.
[Sum93] G. P. Summers, E. A. Burke, P. Shapiro, S. R. Messenger and R. J. Walters, “Damage
Correlations in Semiconductors Exposed to Gamma, Electron and Proton