UNIVERSIDAD COMPLUTENSE DE MADRID

263
Bibliografía
of the IEEE Canadian Conference on Electrical and Computer Engineering, 4-7 May
2003, Vol. 1, 303-306.
[Hie97] D. M. Hiemstra, “Total Dose Performance of a Commercial off the Shelf Ultra-Low
Noise Precision Bipolar Operational Amplifier”, Proceedings of the IEEE Radiation
Effects Data Workshop, Snowmass Village (Colorado, USA), July 24 th , 1997, pp. 80-
83
[Hie98] D. M. Hiemstra, “Dose rate and total dose dependence of the 1/f noise performance of
an operational amplifier fabricated on a complimentary bipolar process on bondend
wafer”, IEEE Transactions on Nuclear Science, vol. 42, nº. 6, pp. 1615-1621,
December 1995
[Hoh87] J. H. Hohl and K. F. Galloway, “Analytical model for Single Event Burn Out of
Power Mosfet”, IEEE Transactions on Nuclear Science, vol. 34, pp. 1275-1280,
1987.
[Hor90] P. Horowitz, W. Hill, The Art of Electronics, 2 nd Edition, Cambridge University
Press, United States of America, 1990.
[Int96] “Recommended Test Procedures for Operational Amplifiers”, Application Note
551.1 from Intersil. 1996.
[Jan88] B. K. Janousek, W. E. Yamada and W. L. Bloss, “Neutron Irradiation Effects in
GaAs Junction Field Effect Transistors”, IEEE Transactions on Nuclear Science, Vol.
35, nº 6, pp. 1480-1486, December 1988.
[Joh00] A. H. Johnston and T. F. Miyahira, “Characterization of Proton Damage in Light-
Emitting Diodes”, IEEE Transactions on Nuclear Science, Vol. 47,nº. 6, pp. 2500-
2507, December 2000.
[Joh03] A. H. Johnston and S. M. Guertin, “The Effects of Space Radiation on Linear
Integrated Circuits”, IEEE Aerospace Conference Proceedings, 18-25 March 2000,
Big Sky (USA), Vol. 5, pp. 363-369.
[Joh76] A. H. Johnston, “Hand Analysis Techniques for Neutron Degradation of Operational
Amplifiers”, IEEE Transactions on Nuclear Science, vol. 23 ,nº. 6 pp. 1709-1714,
December 1976.
[Joh84] A. H. Johnston, “Super-recovery of Total Dose Damage in MOS Devices”, IEEE
Transactions on Nuclear Science, Vol. 31, nº. 6 pp. 1487-1492, December 1984.
[Joh94] A. H. Johnston et alt. “Total Dose Effects in Conventional Bipolar Transistors and
Linear Integrated Circuits”, IEEE Transactions on Nuclear Science, vol. 41, nº. 6, pp.
2427-2436, December 1994.
[Joh96] A. H. Johnston “Characterization of Proton Damage in Light-Emitting Diodes”, IEEE
Transactions on Nuclear Science, Vol. 47, nº. 6, pp. 2500-2507, December 2000.
[Joh96b] A. H. Johnston et alt. “Enhanced Damage in Bipolar Devices at Low Dose Rates:
Effects at Very Low Dose Rates”, IEEE Transactions on Nuclear Science, Vol. 43, nº.
6, pp. 3049-3059, December 1996.
[Jun00] W. Jung “References and Low Dropout Regulators”, Technical Article from Analog
Devices.
[Ken00] R. Kenyon, “A quick guide to voltage references”, EDN, p. 160-167, April 13, 2000
(www.ednmag.com).