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characterization, modeling, and design of esd protection circuits

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1.6. Outline <strong>and</strong> Contributions 13<br />

Applications <strong>of</strong> 2D device simulation to the study <strong>of</strong> ESD are presented in Chapter 3,<br />

starting with a general discussion <strong>of</strong> simulator features important to ESD <strong>modeling</strong> <strong>and</strong><br />

then delineating specific examples. A review <strong>of</strong> some previous ESD simulation work is<br />

also given. Chapter 4 describes the calibration <strong>of</strong> the simulator ESD models <strong>and</strong> presents<br />

the results <strong>of</strong> simulations which use these models. Simulation results are compared to TLP<br />

experiments, <strong>and</strong> an example <strong>of</strong> circuit <strong>design</strong> using transmission-line pulsing <strong>and</strong><br />

simulation models is described. In Chapter 5 the concepts <strong>of</strong> ESD circuit <strong>design</strong><br />

methodology are re-addressed <strong>and</strong> developed in detail. Key issues include correlation <strong>of</strong><br />

TLP <strong>and</strong> HBM withst<strong>and</strong> levels, identifying critical discharge paths, <strong>and</strong> applying <strong>design</strong><strong>of</strong>-experiments<br />

models to transistor optimization. Chapter 6 reviews the contributions <strong>of</strong><br />

the thesis <strong>and</strong> discusses future work as well as the limitations <strong>of</strong> 2D device simulation in<br />

studying ESD. The principles <strong>of</strong> the curve-tracing technique <strong>and</strong> a user’s manual for the<br />

curve-tracing program are given in an appendix.

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