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characterization, modeling, and design of esd protection circuits

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2.2. Transmission Line Pulsing 27<br />

I<br />

Fig. 2.8 A screen capture <strong>of</strong> a Tektronix TDS 684A digitizing oscilloscope<br />

displays the device voltage (Ch1) <strong>and</strong> current (Ch2) response <strong>of</strong> a<br />

50 ⁄ 0.6µm device to a 4.6V, 150ns input pulse. After some initial<br />

ringing, the device voltage settles to a value approximately equal to the<br />

input voltage <strong>and</strong> the device current is very small. The current probe<br />

registers 5mV per 1mA <strong>of</strong> current.<br />

flowing. If the input voltage is stepped carefully enough, the voltage drop due to second<br />

breakdown can also be captured (Fig. 2.10).<br />

It is important to note that beyond snapback, the curve resulting from plotting the current<br />

points vs. the voltage points in Fig. 2.9 is different from the overall TLP curve <strong>of</strong> Fig.<br />

2.6a. Notice that while snapping back the voltage does not drop all the way to Vsb <strong>and</strong><br />

then rise back up to its final level, but rather just drops to the final level. Also, for reasons<br />

discussed in Section 2.3, the peak voltage will probably be less than Vt1 because the<br />

voltage rise, as measured in V/ns, is faster for larger pulse heights. In this respect the TLP<br />

curve below the second-breakdown point really is a dc curve which doesn’t account for<br />

device heating. However, it still represents how the device responds to an ESD stress<br />

because it reveals the operating points after the initial turn-on transient. Since Vt1 is<br />

dependent on the voltage ramp rate, it is equal to the maximum input voltage during an<br />

V

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