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characterization, modeling, and design of esd protection circuits

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18 Chapter 2. ESD Circuit Characterization <strong>and</strong> Design Issues<br />

into a device. In this case, however, the 200pF capacitor is tied directly to the device under<br />

test, which means the 1500Ω resistor is replaced by a parasitic resistance <strong>of</strong> a few ohms<br />

<strong>and</strong> a series inductance <strong>of</strong> about 1µH. The resulting current waveform is oscillatory in<br />

nature (Fig. 2.3), with a rise time on the order <strong>of</strong> a few nanoseconds. This model simulates<br />

the discharge from a tool or machine such as a h<strong>and</strong>ler or marker. Unlike the HBM, there<br />

is no established st<strong>and</strong>ard for the MM. This is most likely because the very low series<br />

resistance implies that the dynamic impedance <strong>of</strong> the device under test <strong>and</strong> the values <strong>of</strong><br />

the parasitic capacitance <strong>and</strong> inductance have a large effect on the MM waveform, making<br />

test reproducibility difficult [18]. Fig. 2.3 illustrates the drastic change in rise time <strong>and</strong><br />

peak current <strong>of</strong> the waveform when the series inductance is changed from 0.5µH to<br />

2.5µH.<br />

In the integrated-circuit industry, the human-body model test is <strong>of</strong>ten the sole means <strong>of</strong><br />

qualifying EOS/ESD reliability because it is simple to conduct <strong>and</strong> has been accepted<br />

current / A<br />

8.0<br />

0.0<br />

-8.0<br />

L s =0.5µH L s =2.5µH<br />

0 100 200<br />

time / ns<br />

Fig. 2.3 SPICE-generated short-circuit MM output current waveforms<br />

for V c =400V, C c =200pF, R c =5Ω, C s =1pF, <strong>and</strong> C t =10pF.

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