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Suprem III - Stanford Technology CAD Home Page

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-133-<br />

<strong>Suprem</strong>-<strong>III</strong> User´s Manual<br />

Cross-section of locally oxidized NMOS device simulated in this example.<br />

Simulations through both the active (channel) region and through<br />

the field oxide region are shown. In addition, a Poisson solution<br />

through the channel region is used to extract threshold voltage.

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