Suprem III - Stanford Technology CAD Home Page
Suprem III - Stanford Technology CAD Home Page
Suprem III - Stanford Technology CAD Home Page
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<strong>Suprem</strong>-<strong>III</strong> User´s Manual<br />
being deposited, otherwise, the default dx of the deposited material.)<br />
(synonym: )<br />
GRAINSIZ Num The as-deposited grain size of the deposited polysilicon layer.<br />
(unit: microns.)<br />
(default: calculated from the deposition temperature and pressure.)<br />
(synonym: )<br />
MIN.DX Num The minimum grid spacing that can be used in the layer on which the layer<br />
is to be deposited.<br />
(unit: microns.)<br />
(default: the last value specified.)<br />
(synonym: )<br />
NITRIDE Log Specifies that the material to be deposited is silicon nitride.<br />
(unit: )<br />
(default: false.)<br />
(synonym: )<br />
OXIDE Log Specifies that the material to be deposited is silicon dioxide.<br />
(unit: )<br />
(default: false.)<br />
(synonym: )<br />
PHOSPHOR Log Specifies that the deposited material is to be uniformly doped with phosphorus.<br />
(unit: )<br />
(default: false.)<br />
(synonym: )<br />
POLYSILI Log Specifies that the material to be deposited is poly-crystalline silicon.<br />
(unit: )<br />
(default: false.)<br />
(synonym: )<br />
PRESSURE Num The pressure during the deposition of a polysilicon layer.<br />
(unit: atmospheres.)<br />
(default: 1.0)<br />
(synonym: )<br />
SILICON Log Specifies that the material to be deposited is single crystal silicon.<br />
(unit: )<br />
(default: false.)<br />
(synonym: )<br />
SPACES Num The number of spaces to be used in the deposited layer.<br />
(unit: )<br />
(default: thickness/dx.)<br />
(synonym: )<br />
TEMPERAT Num The temperature during deposition of a polysilicon layer.<br />
(unit: )<br />
(default: degrees Centigrade.)<br />
(synonym: )<br />
THICKNES Num The thickness of the deposited layer.<br />
(unit: microns.)<br />
(default: )<br />
(synonym: )