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Suprem III - Stanford Technology CAD Home Page

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-17-<br />

<strong>Suprem</strong>-<strong>III</strong> User´s Manual<br />

K.MF Num Used in R. Reif’s epitaxial doping model (see reference in EPITAXY<br />

statement). K.mf is a kinetic coefficient controlling the rate-limiting<br />

step of the dopant incorporation process.<br />

(unit: centimetersˆ(-2) minutesˆ(-1) atmospheresˆ(-1))<br />

(default: the current value.)<br />

(synonym: )<br />

K.P Num Used in R. Reif’s epitaxial doping model (see reference in EPITAXY<br />

statement). K.p is a thermodynamic constant relating the dopant<br />

species concentration in solid silicon and gas phase.<br />

(unit: centimetersˆ(-3) atmospheresˆ(-1))<br />

(default: the current value.)<br />

(synonym: )<br />

NAME Char The name of the impurity.<br />

(unit: )<br />

(default: the last name specified.)<br />

(synonym: )<br />

NITRIDE Log Specifies that the material dependent parameters apply to arsenic in silicon<br />

nitride.<br />

(unit: )<br />

(default: false.)<br />

(synonym: )<br />

OXIDE Log Specifies that the material dependent parameters apply to arsenic in silicon<br />

dioxide.<br />

(unit: )<br />

(default: false.)<br />

(synonym: )<br />

POLYSILI Log Specifies that the material dependent parameters apply to arsenic in<br />

polysilicon.<br />

(unit: )<br />

(default: false.)<br />

(synonym: )<br />

Q.SITES Num Effective density of segregation sites at a grain boundary.<br />

(unit: sites/cmˆ2.)<br />

(default: the current value.)<br />

(synonym: )<br />

SILICON Log Specifies that the material dependent parameters apply to silicon.<br />

(unit: )<br />

(default: false.)<br />

(synonym: )<br />

The ARSENIC statement is an alias for the IMPURITY statement with an index of three and is used to define<br />

or modify the parameters and coefficients associated with arsenic as an impurity. Not all of the parameters of<br />

the IMPURITY statement apply to arsenic and so are not listed here.

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