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Suprem III - Stanford Technology CAD Home Page

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-46-<br />

<strong>Suprem</strong>-<strong>III</strong> User´s Manual<br />

only the cross sections change as the ions cross any interface. When any ion scatters to an energy less than about<br />

5% of the initial energy, or when an ion is scattered back toward the target surface, that ion is considered stopped at<br />

that depth and becomes part of the range distribution. The calculation proceeds until the concentration of the implanted<br />

profile drops to 10ˆ-5 of its peak value.<br />

The other three models are based on fitting the as-implanted distribution to an analytical function. The<br />

three functions available are a simple Gaussian, a two sided Gaussian, or a Pearson type-IV distribution. The necessary<br />

moments, or range statistics, are read from the implant moment data file specified via the appropriate impuritys<br />

statement.

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