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Suprem III - Stanford Technology CAD Home Page

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-50-<br />

<strong>Suprem</strong>-<strong>III</strong> User´s Manual<br />

HEAT.SEG Num The activation energy of the equilibrium segregation factor at polysilicon<br />

grain boundaries.<br />

(unit: electron volts.)<br />

(default: the current value.)<br />

(synonym: )<br />

IMPLANT Log Specifies that the impurity clustering coefficients apply to the impurity<br />

from an implanted source.<br />

(unit: )<br />

(default: false.)<br />

(synonym: )<br />

IONFILE1 Char Specifies the primary ion implant range data file for implants using the<br />

analytic distributions. This file will be searched for the range statistics<br />

when implanting the atomic ion of this impurity.<br />

(unit: )<br />

(default: the last file specified.)<br />

(synonym: )<br />

IONFILE2 Char Specifies the secondary ion implant range data file for implants using the<br />

analytic distributions. This file will be searched for the range statistics<br />

when implanting the compound ions containing this impurity.<br />

(unit: )<br />

(default: the last file specified.)<br />

(synonym: )<br />

K.A Num Used in R. Reif’s epitaxial doping model (see reference in EPITAXY<br />

statement). K.a is a thermodynamic constant relating the dopant<br />

species concentration in solid silicon and adsorbed layer.<br />

(unit: centimeters)<br />

(default: the current value.)<br />

(synonym: )<br />

K.MF Num Used in R. Reif’s epitaxial doping model (see reference in EPITAXY<br />

statement). K.mf is a kinetic coefficient controling the rate-limiting<br />

step of the dopant incorporation process.<br />

(unit: centimetersˆ(-2) minutesˆ(-1) atmospheresˆ(-1))<br />

(default: the current value.)<br />

(synonym: )<br />

K.P Num Used in R. Reif’s epitaxial doping model (see reference in EPITAXY<br />

statement). K.p is a thermodynamic constant relating the dopant<br />

species concentration in solid silicon and gas phase.<br />

(unit: centimetersˆ(-3) atmospheresˆ(-1))<br />

(default: the current value.)<br />

(synonym: )<br />

MISFITST Num The prefactor in the high concentration dependent expression for calculating<br />

the bandgap narrowing due to the lattice misfit strain from high<br />

concentrations of phosphorus.<br />

(unit: electron volts-cmˆ3.)<br />

(default: the current value.)<br />

(synonym: )<br />

MSF100FA Num The orientation factor in orientation silicon for bandgap narrowing<br />

due to lattice misfit strain from high concentrations of phosphorus.<br />

(unit: )<br />

(default: the current value.)<br />

(synonym: )

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