Bulletin 2011/27 - European Patent Office
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(H01H) I.1(1)<br />

(74) Banzer, Hans-Jörg, Kraus & Weisert <strong>Patent</strong>und<br />

Rechtsanwälte Thomas-Wimmer-Ring<br />

15, 80539 München, DE<br />

H01H 13/88 → (51) H01H 13/82<br />

(51) H01J 37/147 (11) 2 340 549 A1*<br />

H01J 37/317<br />

(25) En (26) En<br />

(21) 09745145.4 (22) 17.09.2009<br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HR HU IE IS IT LI LT LU LV MC MK MT<br />

NL NO PL PT RO SE SI SK SM TR<br />

AL BA RS<br />

(86) US 2009/005182 17.09.2009<br />

(87) WO 2010/033199 2010/12 25.03.2010<br />

(30) 17.09.2008 US 212507<br />

(54) • JUSTIERBARE ABLENKOPTIK FÜR<br />

IONENIMPLANTATION<br />

• ADJUSTABLE DEFLECTION OPTICS FOR<br />

ION IMPLANTATION<br />

• DISPOSITIFS OPTIQUES DE DÉFLEXION<br />

RÉGLABLES POUR IMPLANTATION<br />

IONIQUE<br />

(71) Axcelis Technologies, Inc., 108 Cherry Hill<br />

Drive, Beverly, MA 01915, US<br />

(72) GRAF, Mike, Belmont, MA 02478, US<br />

EISNER, Edward, Lexington, MA 02420, US<br />

VANDERBERG, Bo, Gloucester, MA 01930,<br />

US<br />

(74) Treeby, Philip David William, et al, RGC<br />

Jenkins & Co. 26 Caxton Street, GB-London<br />

SW1H 0RJ, GB<br />

H01J 37/317 → (51) H01J 37/147<br />

(51) H01J 61/52 (11) 2 340 550 A2*<br />

(25) En (26) En<br />

(21) 09741432.0 (22) 13.10.2009<br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HR HU IE IS IT LI LT LU LV MC MK MT<br />

NL NO PL PT RO SE SI SK SM TR<br />

AL BA RS<br />

(86) IB 2009/054487 13.10.2009<br />

(87) WO 2010/046805 2010/17 29.04.2010<br />

(88) 23.09.2010<br />

(30) 21.10.2008 EP 08167124<br />

(54) • GESOCKELTE HOCHDRUCK-GASENTLA-<br />

DUNGSLAMPE<br />

• SOCKETED HIGH PRESSURE GAS DIS-<br />

CHARGE LAMP<br />

• LAMPE DE DÉCHARGE GAZEUSE HAUTE<br />

PRESSION ENCASTRÉE<br />

(71) Koninklijke Philips Electronics N.V., Groenewoudseweg<br />

1, 5621 BA Eindhoven, NL<br />

(72) WOUTERS, Geert, NL-5656 AE Eindhoven,<br />

NL<br />

LAMMERANT, Luc, S., E., NL-5656 AE<br />

Eindhoven, NL<br />

(74) Bekkers, Joost J.J, Philips Intellectual Property<br />

& Standards P.O. Box 220, 5600 AE<br />

Eindhoven, NL<br />

H01L 21/00 → (51) C08L 71/12<br />

(51) H01L 21/02 (11) 2 340 551 A1*<br />

H01C 17/26<br />

(25) En (26) En<br />

(21) 08822948.9 (22) 19.09.2008<br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HR HU IE IS IT LI LT LU LV MC MT NL<br />

NO PL PT RO SE SI SK TR<br />

AL BA MK RS<br />

(86) US 2008/076976 19.09.2008<br />

(87) WO 2010/033122 2010/12 25.03.2010<br />

Europäisches <strong>Patent</strong>blatt<br />

<strong>European</strong> <strong>Patent</strong> <strong>Bulletin</strong><br />

<strong>Bulletin</strong> européen des brevets<br />

(54) • DURCH ELEKTROMAGNETISCHE STRAH-<br />

LUNG VERURSACHTE ALLOTROPE ODER<br />

MORPHOLOGISCHE ÄNDERUNG IN SIL-<br />

CIUM ZUR WIDERSTANDSABSTIMMUNG<br />

VON INTEGRIERTEN SCHALTUNGEN<br />

• ALLOTROPIC OR MORPHOLOGIC CHANGE<br />

IN SILICON INDUCED BY ELECTROMAG-<br />

NETIC RADIATION FOR RESISTANCE<br />

TUNING OF INTEGRATED CIRCUITS<br />

• MODIFICATION ALLOTROPIQUE OU<br />

MORPHOLOGIQUE DANS DU SILICIUM<br />

INDUITE PAR RAYONNEMENT ÉLECTRO-<br />

MAGNÉTIQUE POUR RÉGLAGE DE<br />

RÉSISTANCE DE CIRCUITS INTÉGRÉS<br />

(71) Agere Systems, Inc., 1110 American Parkway,<br />

NE, Allentown, PA 18109, US<br />

(72) BAIOCCHI, Frank, A., Allentown PA 18104,<br />

US<br />

CARGO, James, T., Bethlehem PA 18018, US<br />

DELUCCA, John, M., Wayne PA 19087, US<br />

DUTT, Barry, J., Pen Argyl PA 18072, US<br />

MARTIN, Charles, Windgap PA 18091, US<br />

(74) Williams, David John, Page White & Farrer<br />

Bedford House John Street, London WC1N<br />

2BF, GB<br />

(51) H01L 21/02 (11) 2 340 552 A1*<br />

H01L 23/522 H01L <strong>27</strong>/02<br />

H01L <strong>27</strong>/06<br />

(25) En (26) En<br />

(21) 09771413.3 (22) 22.10.2009<br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HR HU IE IS IT LI LT LU LV MC MK MT<br />

NL NO PL PT RO SE SI SK SM TR<br />

AL BA RS<br />

(86) IB 2009/054678 22.10.2009<br />

(87) WO 2010/049859 2010/18 06.05.2010<br />

(30) 28.10.2008 EP 08167765<br />

(54) • 3D-INTEGRATION EINES MIM-KONDEN-<br />

SATORS UND EINES WIDERSTANDS<br />

• 3D INTEGRATION OF A MIM CAPACITOR<br />

AND A RESISTOR<br />

• INTÉGRATION 3D D'UN CONDENSATEUR<br />

MIM ET D'UNE RÉSISTANCE<br />

(71) NXP B.V., High Tech Campus 60, 5656 AG<br />

Eindhoven, NL<br />

(72) ROEST, Aarnoud, Laurens, Redhill Surrey<br />

RH1 1DL, GB<br />

KLEE, Mareike, Redhill Surrey RH1 1DL, GB<br />

MAUCZOK, Rudiger, Gunter, Redhill Surrey<br />

RH1 1DL, GB<br />

VAN LEUKEN-PETERS, Linda, Redhill Surrey<br />

RH1 1DL, GB<br />

WOLTERS, Robertus, Adrianus, Maria, Redhill<br />

Surrey RH1 1DL, GB<br />

(74) Williamson, Paul Lewis, NXP Semiconductors<br />

IP Department Betchworth House 57-65<br />

Station Road, Redhill Surrey RH1 1DL, GB<br />

H01L 21/28 → (51) H01L <strong>27</strong>/115<br />

H01L 21/336 → (51) H01L <strong>27</strong>/115<br />

H01L 21/48 → (51) H05K 3/00<br />

(51) H01L 21/56 (11) 2 340 553 A1*<br />

H01L 23/495<br />

(25) En (26) En<br />

(21) 09741437.9 (22) 16.10.2009<br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HR HU IE IS IT LI LT LU LV MC MK MT<br />

NL NO PL PT RO SE SI SK SM TR<br />

AL BA RS<br />

(86) IB 2009/054573 16.10.2009<br />

(87) WO 2010/046825 2010/17 29.04.2010<br />

(30) 20.10.2008 EP 08167014<br />

105<br />

Anmeldungen<br />

Applications<br />

Demandes (<strong>27</strong>/<strong>2011</strong>) 06.07.<strong>2011</strong><br />

(54) • VERFAHREN ZUR HERSTELLUNG EINER<br />

MINDESTENS EINE MIKROELEKTRONI-<br />

SCHE ANORDNUNG UMFASSENDEN MIK-<br />

ROELEKTRONISCHEN KAPSELUNG<br />

• METHOD FOR MANUFACTURING A<br />

MICROELECTRONIC PACKAGE COMPRIS-<br />

ING AT LEAST ONE MICROELECTRONIC<br />

DEVICE<br />

• PROCÉDÉ DE PRODUCTION DE BOÎTIER<br />

MICROÉLECTRONIQUE COMPRENANT AU<br />

MOINS UN DISPOSITIF MICROÉLECTRO-<br />

NIQUE<br />

(71) NXP B.V., High Tech Campus 60, 5656 AG<br />

Eindhoven, NL<br />

(72) VAN DE WATER, Peter, Wilhelmus, Maria,<br />

Redhill Surrey RH1 1DL, GB<br />

HESEN, Paulus Martinus Catharina, Redhill<br />

Surrey RH1 1DL, GB<br />

GROENHUIS, Roelf,Anco,Jacob, Redhill<br />

Surrey RH1 1DL, GB<br />

(74) Williamson, Paul Lewis, NXP Semiconductors<br />

IP Department Betchworth House 57-65<br />

Station Road, Redhill Surrey RH1 1DL, GB<br />

(51) H01L 21/60 (11) 2 340 554 A1*<br />

H01L 23/485 H01L 25/065<br />

(25) En (26) En<br />

(21) 09783180.4 (22) 18.09.2009<br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HR HU IE IS IT LI LT LU LV MC MK MT<br />

NL NO PL PT RO SE SI SK SM TR<br />

AL BA RS<br />

(86) EP 2009/062125 18.09.2009<br />

(87) WO 2010/031845 2010/12 25.03.2010<br />

(30) 18.09.2008 US 98194 P<br />

(54) • VERFAHREN UND SYSTEME ZUM BONDEN<br />

VON MATERIALIEN<br />

• METHODS AND SYSTEMS FOR MATERIAL<br />

BONDING<br />

• PROCÉDÉS ET SYSTÈMES D'ASSEM-<br />

BLAGE DE MATÉRIAUX<br />

(71) IMEC, Kapeldreef 75, 3001 Leuven, BE<br />

(72) ZHANG, Wenqi, B-3000 Leuven, BE<br />

BEYNE, Eric, 3001 Leuven, BE<br />

(74) Wauters, Davy Erik Angelo, et al, DenK iP<br />

bvba Pastoor Ceulemansstraat 3, B-3191<br />

Schiplaken (Hever), BE<br />

H01L 21/60 → (51) H01L 23/485<br />

(51) H01L 21/66 (11) 2 340 555 A2*<br />

(25) En (26) En<br />

(21) 09812211.2 (22) 03.09.2009<br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HR HU IE IS IT LI LT LU LV MC MK MT<br />

NL NO PL PT RO SE SI SK SM TR<br />

AL BA RS<br />

(86) US 2009/055872 03.09.2009<br />

(87) WO 2010/028136 2010/10 11.03.2010<br />

(88) 03.06.2010<br />

(30) 08.09.2008 US 206565<br />

(54) • SONDENBLOCKANORDNUNG<br />

• PROBE BLOCK ASSEMBLY<br />

• ENSEMBLE BLOC DE SONDE<br />

(71) 3M Innovative Properties Company, 3M<br />

Center Post <strong>Office</strong> Box 334<strong>27</strong>, Saint Paul,<br />

MN 55133-34<strong>27</strong>, US<br />

(72) FELDMAN, Steven, Saint Paul, MN 55133-<br />

34<strong>27</strong>, US<br />

CASTIGLIONE, Joseph, N., Saint Paul, MN<br />

55133-34<strong>27</strong>, US<br />

JOSHI, Abhay, R., Saint Paul, MN 55133-<br />

34<strong>27</strong>, US<br />

(74) Reinhard - Skuhra - Weise & Partner GbR,<br />

<strong>Patent</strong>- und Rechtsanwälte Friedrichstrasse<br />

31, 80801 München, DE

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