Das Forschungszentrum Jülich - d-nb, Archivserver DEPOSIT.D-NB ...

I01
Bolten D.*,Böttger U.*,Waser R.
Reversible and irreversible piezoelectric and ferroelectric response in ferroelectric ceramics and thin films
Journal of the European Ceramic Society, 24 (2004), 725 - 732
I01
Boulyga S. F.*,Pickhardt C.,Becker J. S.
New Approach of Solution-based Calibration in Laser Ablation Inductively Coupled Plasma Mass Spectrometry of Trace
Elements in Metals and Reduction of Fractionation Effects
Atomic Spectroscopy, 25 (2004), 2, 53 - 63
I01
Buca D.,Holländer B.,Trinkaus H.,Mantl S.,Carius R.,Loo R.*,Caymax M.*,Schaefer H.*
Tensely strained silicon on SiGe produced by strain transfer
Applied Physics Letters, 85 (2004), 13, 2499 - 2501
I01,E02
Cade N. I.*,Roshan R.*,Hauert M.*,Maciel A. C.*,Ryan J. F.*,Schwarz A.*,Schäpers Th.,Lüth H.
Carrier relaxation in GaAs v-groove quantum wires and the effects of localization
Physical Review B, 70 (2004), 195308-1 - 195308-8
I01
Cherepanov V.,Filimonov S.,Myslivecek J.,Voigtländer B.
Scaling of submonolayer island sizes in surfactant-mediated epitaxy of semiconductors
Physical Review B, 70 (2004), 085401
I01
Cherepanov V.,Voigtländer B.
Influence of material, surface reconstruction and strain of diffusion at a Ge(111) surface
Physical Review B, 69 (2004), 125331
I01
Cherpak N. T.*,Barannik A. A.*,Prokopenko Y. V.*,Vitusevich S. A.
Microwave impedance characterization of large-area HTS-films: novel approach
Superconductor Science and Technology, 17 (2004), 899 - 903
I01
Choi K. J.*,Biegalski M.*,Li Y. L.*,Sharan A.*,Schubert J.,Uecker R.*,Reiche P.*,Chen C. Z.*,Pan X. Q.*,Gopalan V.*,Chen L.-
Q.*,Schlom D. G.*,Eom C. B.*
Enhancement of Ferroelectricity in Strained BaTiO3 Thin Films
Science, 306 (2004), 1005 - 1009
I01
Danilchenko B. A.*,Zelensky S. E.*,Drok E.*,Vitusevich S. A.,Danylyuk S. V.,Klein N.,Lüth H.,Belyaev A. E.*,Kochelap V. A.
Hot electron transport in AlGaN/GaN two-dimensional conducting channels
Applied Physics Letters, 85 (2004), 22, 5421 - 5423
I01
Danilchenko B. A.*,Zelensky S. E.*,Drok E.*,Vitusevich S. A.,Danylyuk S. V.,Klein N.,Lüth H.,Belyaev A. E.*,Kochelap V. A.*
Hot-electron transport in AlGaN/GaN two-dimensional conducting channels
Applied Physics Letters, 85 (2004), 22, 5421 - 5423
I01
Dietrich M.*,Buchal Ch.,Correia J. G.*,Deicher M.*,Schmid M.,Uhrmacher M.*,Vetter U.*,Wahl U.*
Annealing of BaTiO3 thin films after heavy ion implantation
Nuclear Instruments and Methods in Physics Research Section B, 216 (2004), 110 - 115
I01
Edge L. F.*,Schlom D. G.*,Brewer R. T.*,Chabal Y. J.*,Williams J. R.*,Chambers S. A.*,Hinkle C.*,Lucovsky G.*,Yang
Y.*,Stemmer S.*,Copel M.*,Holländer B.,Schubert J.
Suppression of subcutaneous oxidation during the deposition of amorphous lanthanum aluminate on silicon
Applied Physics Letters, 84 (2004), 23, 4629 - 4631
I01
Edge L. F.*,Schlom D. G.*,Chambers S. A.*,Cicerrella E.*,Freeouf J. L.*,Holländer B.,Schubert J.
Measurement of the band offsets between amorphous LaAlO3 and silicon
Applied Physics Letters, 84 (2004), 5, 726 - 729
I01
Ellerkmann U.*,Liedtke R.*,Böttger U.*,Waser R.
Interface related thickness dependence of the tunability in BaSrTiO3 thin films
Applied Physics Letters, 85 (2004), 4708 - 4710
I01
Enciso Aguilar M.*,Rodriguez M.*,Zerounian N.*,Aniel F.*,Hackbarth T.*,Herzog H.-J.*,König U.*,Mantl S.,Holländer
B.,Chrastina D.*,Isella G.*,von Känel H.*,Lyutovich K.*,Oehme M.*
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