Das Forschungszentrum Jülich - d-nb, Archivserver DEPOSIT.D-NB ...

Symposium proceedings ; 805). - 1-55899-743-1. - S. MM 7.2.1.
M02
Hoffmann B.
Biomembranes
Physics meets biology : from soft matter to cell biology ; lecture notes of the 35th Spring School of the Institut für
Festkörperforschung / ed.: G. Gompper ... - Jülich, Forschungszentrum, 2004. - (Schriften des Forschungszentrums Jülich -
Reihe Materie und Material / Matter and Material ; 19). - 3-89336-348-3. - S. D1.1 - D1.16
M02
Holm C.*,Hofmann T.*,Joanny J. F.*,Kremer K.*,Netz R. R.*,Reineker P.*,Seidel C.*,Vilgis T. A.*,Winkler R. G.
Polyelectrolyte Theory
Polyelectrolytes with Defined Molecular Architecture II / ed.: M Schmidt. - Berlin, 2004. - (Advances in Polymer Science ; 166). -
3-540-00556-0. - S. 244
M02
Houben L.,Luysberg M.,Brammer T.*
Electron beam illumination effects on electronstatic potential mapping in holographic imaging of semiconductors in TEM
Microscopy of Semiconducting Materials / ed.: Cullis ... - IoP, 2004. - (Institute of Physics Conference Series ; 180). - 0-7503-
0979-2. - S. 49
M02
Houben L.,Thust A.,Urban K.
Analysis of aberration corrected grain boundary phase images from focal series reconstruction in YBa2Cu3O7
Proceedings of the 13th European Microscopy Congress, Antwerpen, 22.08.04-27.08.04. - 1 (2004). - S. 137
M02
Hu X. S.*,Lal J.*,Prud'homme R. K.*,Monkenbusch M.
Study of static and dynamics of non-ionic surfactant lamellar phases on addition of charge
M02
Hueging N.,Tillmann K.,Luysberg M.,Trinkaus H.,Urban K.
Quantitative TEM analysis of structural defects in helium implanted silicon
Microscopy of Semiconducting Materials / ed.: Cullis ... - IoP, 2004. - (Institute of Physics Conference Series ; 180). - 0-7503-
0979-2. - S. 373 - 378
M02
Hueging N.,Tillmann K.,Luysberg M.,Trinkaus H.,Urban K.
Quantitative diffraction contrast analysis on the pressure of helium filled nanocracks in implanted silicon
Proceedings of EMC 2004, 22.08.-27.08.2004, Antwerpen. - 2004. - CD-ROM, Beitrag MS07.05
M02
Ikonomov J.
STM studies of islands on Cu and Pt surfaces
Forschungszentrum, Zentralbibliothek
Jülich
2004
Berichte des Forschungszentrums Jülich ; 4144
Düsseldorf, Univ., Diss., 2004
JUEL-4144
M02
Jones R. O.
Material Science
NIC Symposium 2004 : Symposium, 17. - 18. February 2004, Forschungszentrum Jülich, Proceedings / ed.: D. Wolf ... - Jülich,
NIC, 2004. - (NIC series ; 20). - 3-00-012372-5. - S. 169
M02
Jäger N. D.,Marso M.*,Urban K.,Weber E. R.*,Ebert P.
Simultaneous potential and dopant mapping at p-n junctions using scanning tunneling microscopy
Proceedings of the 13th International Conference on Microscopy of Semiconducting Materials, Cambridge, UK / eds.: A. Cullis,
P. Midgley. - Bristol, IoP, 2004. - (Institute of Physics Conference series ; 180). - 0-7503-0979-2
M02
Kang K.,Gapinski J.*,Lettinga M. P.,Buitenhuis J.,Meier G.,Dhont J. K. G.,Patkowski A.*
DLS and FCS on Tracer Spheres in Concentrated Rod Dispersions
Proceedings of the 2004 Photon Correlation and Scattering Conference cosponsored by ESA,OSA, NASA Glenn Research
Center, NCMR, the University of Amsterdam, and the Van der Waals-Zeemann Institute Amsterdam, The Netherlands August
16-18, 2004
M02
Lentzen M.,Thust A.,Urban K.
Accuracy of Aberration Measurements forHRTEM Using Zemlin Tableaus
Proceedings of EMC, 2004, Antwerpen. - S. IM01.P04
M02
Lettinga P. M.
326