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Chapter 10 Memory Subsystem.pdf

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CLK<br />

CMD WRITE<br />

DQ<br />

DQS<br />

CLK<br />

CMD<br />

DQ<br />

DQS<br />

DQ<br />

DQS<br />

DQ<br />

DQS<br />

READ<br />

Public Version<br />

www.ti.com SDRAM Controller (SDRC) <strong>Subsystem</strong><br />

Figure <strong>10</strong>-57. Generic DDR Data-Write and Data-Read Waveforms<br />

DDR data-write<br />

CAS latency<br />

DDR data-read<br />

Figure <strong>10</strong>-58 shows the DDR SDRAM data and data strobe DQS signals exiting synchronously and in<br />

phase during a data read. DQS signals are used to sample incoming data internally and, hence, must be<br />

delayed to create data-setup and data-hold time at the synchronization flip-flop inputs, as shown in the<br />

bottom waveforms of Figure <strong>10</strong>-58. This is the goal of the DLL/CDL module.<br />

<strong>10</strong>.2.4.4.11.2 DLL/CDL Module Architecture<br />

Figure <strong>10</strong>-58. Required Synchronization DFF Input Signals<br />

Data and data strobe from DDR-SDRAM<br />

Data strobe is internally delayed<br />

to respect data setup and hold time<br />

Figure <strong>10</strong>-59 shows how the DLL/CDL interacts with the synchronization flip-flops. See Table <strong>10</strong>-<strong>10</strong>2 for<br />

more information on device pins and SDRC data-lane configurations regarding DQS.<br />

SPRUGN4L–May 20<strong>10</strong>–Revised June 2011 <strong>Memory</strong> <strong>Subsystem</strong><br />

Copyright © 20<strong>10</strong>–2011, Texas Instruments Incorporated<br />

sdrc-014<br />

sdrc-015<br />

2243

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