Bulletin 2012/02 - European Patent Office
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(G01N) I.1(1)<br />

(87) WO 2010/104497 2010/37 16.09.2010<br />

(54) • ANALYSEGERÄT UND WAHRNEHMUNGS-<br />

VERFAHREN UNTER VERWENDUNG<br />

DAVON<br />

• ANALYZER AND METHOD FOR SENSING<br />

USING THE SAME<br />

• DISPOSITIF D'ANALYSE ET PROCÉDÉ DE<br />

DÉTECTION AU MOYEN DE CE DISPOSITIF<br />

(71) Hewlett-Packard Development Company, L.<br />

P., 11445 Compaq Center Drive West,<br />

Houston, TX 77070, US<br />

(72) WU, Wei, Palo Alto, CA 94304-1100, US<br />

XIA, Qiangfei, Palo Alto, CA 94304-1100, US<br />

WANG, Shih-Yuan, Palo Alto, CA 94304-<br />

1100, US<br />

LI, Jingjing, Palo Alto, CA 94304-1100, US<br />

(74) Lawman, Matthew John Mitchell, EIP Fairfax<br />

House 15 Fulwood Place, GB-London WC1V<br />

6HU, GB<br />

G01N 21/25 → (51) G01N 35/<strong>02</strong><br />

G01N 21/45 → (51) G01N 21/17<br />

G01N 21/51 → (51) G01N 15/<strong>02</strong><br />

G01N 21/51 → (51) G01N 15/14<br />

G01N 21/63 → (51) G01N 21/64<br />

G01N 21/63 → (51) G01R 31/26<br />

(51) G01N 21/64 (11) 2 404 161 A1*<br />

G01N 21/63<br />

(25) Nl (26) En<br />

(21) 10707143.3 (22) 03.03.2010<br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HR HU IE IS IT LI LT LU LV MC MK MT<br />

NL NO PL PT RO SE SI SK SM TR<br />

(86) NL 2010/050105 03.03.2010<br />

(87) WO 2010/101460 2010/36 10.09.2010<br />

(30) 06.03.2009 NL 1036677<br />

(54) • VERFAHREN UND VORRICHTUNG ZUR<br />

QUALITÄTSBESTIMMUNG VON PFLAN-<br />

ZENMATERIAL UNTER VERWENDUNG<br />

VON ABBILDUNGEN, DIE INFORMATIO-<br />

NEN ÜBER DIE QUANTENEFFIZIENZ UND<br />

DAS ZEITVERHALTEN DES PHOTOSYN-<br />

THESESYSTEMS ENTHALTEN<br />

• METHOD AND DEVICE FOR DETERMINING<br />

PLANT MATERIAL QUALITY USING<br />

IMAGES CONTAINING INFORMATION<br />

ABOUT THE QUANTUM EFFICIENCY AND<br />

THE TIME RESPONSE OF THE PHOTO-<br />

SYNTHTIC SYSTEM<br />

• PROCÉDÉ ET DISPOSITIF DE DÉTERMI-<br />

NATION DE QUALITÉ DE MATÉRIEL<br />

VÉGÉTAL À L'AIDE D'IMAGES CONTE-<br />

NANT DES INFORMATIONS QUI CONCER-<br />

NENT LE RENDEMENT QUANTIQUE ET LA<br />

RÉPONSE TEMPORELLE DU SYSTÈME<br />

PHOTOSYNTHÉTIQUE<br />

(71) Stichting Dienst Landbouwkundig Onderzoek,<br />

Costerweg 50, 6701 BH Wageningen,<br />

NL<br />

(72) JALINK, Hendrik, NL-6669 GJ Dodewaard,<br />

NL<br />

VAN DER SCHOOR, Rob, NL-6611 BS<br />

Overasselt, NL<br />

(74) Bras, Pieter, Octrooibureau Vriesendorp &<br />

Gaade B.V. Dr. Kuyperstraat 6, 2514 BB Den<br />

Haag, NL<br />

(51) G01N 21/64 (11) 2 404 162 A2*<br />

G01N 33/487 G01N 33/50<br />

(25) En (26) En<br />

(21) 10749212.6 (22) <strong>02</strong>.03.2010<br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HR HU IE IS IT LI LT LU LV MC MK MT<br />

NL NO PL PT RO SE SI SK SM TR<br />

Europäisches <strong>Patent</strong>blatt<br />

<strong>European</strong> <strong>Patent</strong> <strong>Bulletin</strong><br />

<strong>Bulletin</strong> européen des brevets<br />

(86) US 2010/<strong>02</strong>5938 <strong>02</strong>.03.2010<br />

(87) WO 2010/101931 2010/36 10.09.2010<br />

(88) 06.01.2011<br />

(30) 03.03.2009 US 209116 P<br />

29.01.2010 US 299525 P<br />

11.<strong>02</strong>.2010 US 303567 P<br />

(54) • NACHWEISSYSTEM UND VERFAHREN<br />

FÜR HOCHSENSITIVE FLUORESZENZ-<br />

TESTS<br />

• DETECTION SYSTEM AND METHOD FOR<br />

HIGH SENSITIVITY FLUORESCENT<br />

ASSAYS<br />

• SYSTÈME ET PROCÉDÉ DE DÉTECTION<br />

POUR DOSAGES FLUORESCENTS À<br />

HAUTE SENSIBILITÉ<br />

(71) Access Medical System Co., Ltd., 1455<br />

Adams Drive 1322, Menlo Park, California<br />

94<strong>02</strong>5, US<br />

(72) TAN, Hong, Menlo Park California 94<strong>02</strong>5, US<br />

ZUK, Robert F., Menlo Park California 94<strong>02</strong>5,<br />

US<br />

TAN, Yushan, Menlo Park California 94<strong>02</strong>5,<br />

US<br />

CAO, Erhua, Menlo Park California 94<strong>02</strong>5,<br />

US<br />

XIA, Min, Menlo Park California 94<strong>02</strong>5, US<br />

CHEN, Jun, Menlo Park California 94<strong>02</strong>5, US<br />

(74) den Hartog, Jeroen H.J., et al, Hoyng<br />

Monegier Rembrandt Tower, 31st Floor<br />

Amstelplein 1, 1096 HA Amsterdam, NL<br />

G01N 21/64 → (51) G01N 21/05<br />

(51) G01N 22/00 (11) 2 404 163 A2*<br />

G01R 27/26 H01P 7/10<br />

(25) De (26) De<br />

(21) 10716269.5 (22) 23.<strong>02</strong>.2010<br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HR HU IE IS IT LI LT LU LV MC MK MT<br />

NL NO PL PT RO SE SI SK SM TR<br />

(86) DE 2010/00<strong>02</strong>00 23.<strong>02</strong>.2010<br />

(87) WO 2010/099778 2010/36 10.09.2010<br />

(88) 03.06.2011<br />

(30) <strong>02</strong>.03.2009 DE 1<strong>02</strong>009011069<br />

<strong>02</strong>.03.2009 US 208937 P<br />

(54) • HALBOFFENE RESONATORANORDNUNG<br />

IN FORM EINES TOPFKREISES UND VER-<br />

FAHREN ZUR UNTERSUCHUNG EINER<br />

PROBE MIT DER RESONATORANORD-<br />

NUNG<br />

• SEMI-OPEN RESONATOR ASSEMBLY IN<br />

THE FORM OF A REENTRANT CAVITY AND<br />

METHOD FOR ANALYZING A SAMPLE<br />

USING THE RESONATOR ASSEMBLY<br />

• DISPOSITIF RÉSONATEUR SEMI-OUVERT<br />

EN FORME D'UNE CAVITÉ RÉENTRANTE<br />

ET PROCÉDÉ D'EXAMEN D'UN ÉCHAN-<br />

TILLON AU MOYEN DU DISPOSITIF<br />

RÉSONATEUR<br />

(71) Forschungszentrum Jülich GmbH, 52425<br />

Jülich, DE<br />

(72) KLEIN, Norbert, Staines Middx, TW18 4LB,<br />

GB<br />

VITUSEVICH, Svetlana, 52353 Düren, DE<br />

DANYLYUK, Serhiy, 52428 Jülich, DE<br />

(51) G01N 23/00 (11) 2 404 164 A1*<br />

(25) En (26) En<br />

(21) 10749119.3 (22) 25.<strong>02</strong>.2010<br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HR HU IE IS IT LI LT LU LV MC MK MT<br />

NL NO PL PT RO SE SI SK SM TR<br />

(86) US 2010/<strong>02</strong>5388 25.<strong>02</strong>.2010<br />

(87) WO 2010/101765 2010/36 10.09.2010<br />

(30) 01.03.2009 IL 19732909<br />

126<br />

Anmeldungen<br />

Applications<br />

Demandes (<strong>02</strong>/<strong>2012</strong>) 11.01.<strong>2012</strong><br />

(54) • RASTERSONDENMIKROSKOP OHNE<br />

INTERFERENZ- ODER GEOMETRISCHE<br />

BESCHRÄNKUNG FÜR EINZEL- ODER<br />

MEHRFACHSONDENBETRIEB IN LUFT<br />

ODER FLÜSSIGKEIT<br />

• A SCANNED PROBE MICROSCOPE WITH-<br />

OUT INTERFERENCE OR GEOMETRIC<br />

CONSTRAINT FOR SINGLE OR MULTIPLE<br />

PROBE OPERATION IN AIR OR LIQUID<br />

• MICROSCOPE-SONDE À BALAYAGE SANS<br />

INTERFÉRENCE NI CONTRAINTE GÉOMÉ-<br />

TRIQUE POUR UN FONCTIONNEMENT DE<br />

SONDE UNIQUE OU DE SONDES MULTI-<br />

PLES DANS L'AIR OU DANS UN LIQUIDE<br />

(71) Nanonics Imaging Ltd., The Manhat Technology<br />

Park Malcha, 93707 Jerusalem, IL<br />

(72) LEWIS, Aaron, 93707 Jerusalem, IL<br />

LEWIS, David, 93707 Jerusalem, IL<br />

DEKHTER, Rima, 96264 Jerusalem, IL<br />

FISH, Galina, 71700 Modiin, IL<br />

KOKOTOV, Michael, 76284 Rehovot, IL<br />

KOKOTOV, Sofia, 98533 Maale Adumim, IL<br />

FEDOSYEYEV, Oleg, 90805 Mevaseret Zion,<br />

IL<br />

KOMISSAR, Anatoly, 97536 HaYerushalmit,<br />

IL<br />

(74) Manley, Nicholas Michael, W.P. Thompson &<br />

Co. Coopers Building Church Street, Liverpool<br />

L1 3AB, GB<br />

G01N 27/06 → (51) G01N 27/22<br />

G01N 27/07 → (51) G01N 27/22<br />

G01N 27/08 → (51) G01N 27/22<br />

(51) G01N 27/22 (11) 2 404 165 A1*<br />

C10G 1/04<br />

(25) En (26) En<br />

(21) 10713739.0 (22) 01.03.2010<br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HR HU IE IS IT LI LT LU LV MC MK MT<br />

NL NO PL PT RO SE SI SK SM TR<br />

(86) US 2010/<strong>02</strong>5807 01.03.2010<br />

(87) WO 2010/101845 2010/36 10.09.2010<br />

(30) <strong>02</strong>.03.2009 US 395953<br />

(54) • DIELEKTRISCHE CHARAKTERISIERUNG<br />

EINES STOFFS<br />

• DIELECTRIC CHARACTERIZATION OF A<br />

SUBSTANCE<br />

• CARACTÉRISATION DIÉLECTRIQUE D'UNE<br />

SUBSTANCE<br />

(71) HARRIS CORPORATION, 1<strong>02</strong>5 W. Nasa<br />

Boulevard, MS A-111, Melbourne, FL 32919,<br />

US<br />

(72) HERNANDEZ, Victor, Merritt Island Florida<br />

32952, US<br />

WHITE, John, Melbourne Florida 32934, US<br />

(74) Schmidt, Steffen, Wuesthoff & Wuesthoff<br />

<strong>Patent</strong>- und Rechtsanwälte Schweigerstrasse<br />

2, 81541 München, DE<br />

(51) G01N 27/22 (11) 2 404 166 A1*<br />

G01N 27/06 G01N 27/07<br />

G01N 27/08 G01N 27/447<br />

G01N 30/64 G01N 30/95<br />

G01N 33/483<br />

(25) En (26) En<br />

(21) 10748270.5 (22) 04.03.2010<br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HR HU IE IS IT LI LT LU LV MC MK MT<br />

NL NO PL PT RO SE SI SK SM TR<br />

(86) CA 2010/000310 04.03.2010<br />

(87) WO 2010/099618 2010/36 10.09.2010<br />

(30) 04.03.2009 US 2<strong>02</strong>493 P<br />

(54) • SYSTEM UND VERFAHREN ZUR ERKEN-<br />

NUNG DER LEITFÄHIGKEIT<br />

• CONDUCTANCE DETECTION SYSTEM AND<br />

METHOD

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