Bulletin 2012/02 - European Patent Office
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(G01N) I.1(2)<br />

(30) 18.08.2006 GB 0616448<br />

(54) • Verfahren und Vorrichtung zur Abgabe von<br />

Pulverproben<br />

• Method and apparatus for dispensing<br />

powder samples<br />

• Procédé et appareil pour distribuer des<br />

échantillons de poudre<br />

(71) Brunob II B.V., Velperweg 76, 6824 BM<br />

Arnhem, NL<br />

(72) Caroll, John, Stockton on Tees, Cleveland<br />

TS17 0YA, GB<br />

(74) Sewell, Adrian David, Murgitroyd & Company<br />

165-169 Scotland Street, Glasgow,<br />

Strathclyde G5 8PL, GB<br />

(62) 07789235.4 / 2 052 228<br />

(51) G01N 1/20 (11) 2 405 251 A2<br />

G01N 33/34<br />

(25) De (26) De<br />

(21) 11172858.0 (22) 06.07.2011<br />

(84) AL AT BE BG CH CY CZ DE DK EE ES FI FR<br />

GB GR HR HU IE IS IT LI LT LU LV MC MK<br />

MT NL NO PL PT RO RS SE SI SK SM TR<br />

BA ME<br />

(30) 08.07.2010 DE 1<strong>02</strong>010031097<br />

(54) • Probenentnahme<br />

• Sample taking<br />

• Prélèvement d'échantillon<br />

(71) Voith <strong>Patent</strong> GmbH, Sankt Pöltener Strasse<br />

43, 89522 Heidenheim, DE<br />

(72) Leiss, Horst, 74861 Neudenau, DE<br />

Pflügel, Reinhold, 89561 Dischingen, DE<br />

Strempfl, Christoph, 89542 Herbrechtingen,<br />

DE<br />

G01N 1/20 → (51) G01N 1/18<br />

G01N 1/32 → (51) H01J 37/3<strong>02</strong><br />

G01N 1/32 → (51) H01J 37/305<br />

G01N 15/00 → (51) G01S 17/58<br />

(51) G01N 15/14 (11) 2 405 252 A2<br />

G01N 21/53 G01N 21/64<br />

G01J 3/12<br />

(25) En (26) En<br />

(21) 11169278.6 (22) 09.06.2011<br />

(84) AL AT BE BG CH CY CZ DE DK EE ES FI FR<br />

GB GR HR HU IE IS IT LI LT LU LV MC MK<br />

MT NL NO PL PT RO RS SE SI SK SM TR<br />

BA ME<br />

(30) 09.07.2010 JP 2010156382<br />

(54) • Verfahren zum Ausgleich der Fluoreszenzintensität<br />

und Vorrichtung zur Fluoreszenzintensitätsberechnung<br />

• Fluorescence Intensity Compensation<br />

Method and Fluorescence Intensity Calculation<br />

Device<br />

• Procédé de compensation d'intensité de<br />

fluorescence et dispositif de calcul d'intensité<br />

de fluorescence<br />

(71) Sony Corporation, 1-7-1 Konan Minato-ku,<br />

Tokyo 108-0075, JP<br />

(72) Kato, Yasunobu, Minato-Ku, Tokyo, JP<br />

Sakai, Yoshitsugu, Minato-Ku, Tokyo, JP<br />

(74) Lewis, Darren John, D Young & Co LLP 120<br />

Holborn, London EC1N 2DY, GB<br />

G01N 15/14 → (51) G01N 33/48<br />

(51) G01N 21/21 (11) 2 405 253 A1<br />

A61B 5/1455<br />

(25) Ja (26) En<br />

(21) 09841128.3 (22) 04.03.2009<br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HR HU IE IS IT LI LT LU LV MC MK MT<br />

NL NO PL PT RO SE SI SK TR<br />

Europäisches <strong>Patent</strong>blatt<br />

<strong>European</strong> <strong>Patent</strong> <strong>Bulletin</strong><br />

<strong>Bulletin</strong> européen des brevets<br />

(86) JP 2009/054592 04.03.2009<br />

(87) WO 2010/100766 2010/36 10.09.2010<br />

(54) • VORRICHTUNG UND VERFAHREN ZUM<br />

MESSEN VON OPTISCHER DREHUNG<br />

• OPTICAL ROTATION MEASURING DEVICE<br />

AND OPTICAL ROTATION MEASURING<br />

METHOD<br />

• DISPOSITIF DE MESURE DE ROTATION<br />

OPTIQUE ET PROCÉDÉ DE MESURE DE<br />

ROTATION OPTIQUE<br />

(71) Global Fiberoptics, Ltd., 1205, Residia Suidobashi<br />

3-2-6, Misaki-cho Chiyoda-ku,<br />

Tokyo 101-0061, JP<br />

Shionogi & Co., Ltd., 1-8, Doshomachi 3chome<br />

Chuo-ku Osaka-shi, Osaka 541-0045,<br />

JP<br />

(72) KAJIOKA, Hiroshi, Tokyo 1<strong>02</strong>-0082, JP<br />

TOTTORI, Yusaku, Ageo-Shi Saitama 362-<br />

0<strong>02</strong>1, JP<br />

(74) Müller-Boré & Partner <strong>Patent</strong>anwälte, Grafinger<br />

Straße 2, 81671 München, DE<br />

(51) G01N 21/35 (11) 2 405 254 A1<br />

G01N 21/85<br />

(25) De (26) De<br />

(21) 10168397.7 (22) 05.07.2010<br />

(84) AL AT BE BG CH CY CZ DE DK EE ES FI FR<br />

GB GR HR HU IE IS IT LI LT LU LV MC MK<br />

MT NL NO PL PT RO SE SI SK SM TR<br />

BA ME RS<br />

(54) • Optoelektronische Vorrichtung zur Gasanalyse<br />

und Verfahren<br />

• Optoelectronic device and method for gas<br />

analysis<br />

• Dispositif et procédé optoélectronique pour<br />

l'analyse du gaz<br />

(71) SICK MAIHAK GmbH, Erwin-Sick-Strasse 1,<br />

79183 Waldkirch, DE<br />

(72) Kaufmann, Jürgen, 79211, Denzlingen, DE<br />

Nuber, Frank, 79312, Emmendingen, DE<br />

Overdick, Dr. Michael, 79312, Emmendingen,<br />

DE<br />

Schiffler, Rolf, 79341, Kenzingen, DE<br />

(74) Ludewigt, Christoph, Sick AG Intellectual<br />

Property Erwin-Sick-Strasse 1, 79183 Waldkirch,<br />

DE<br />

(51) G01N 21/47 (11) 2 405 255 A1<br />

G01N 21/77<br />

(25) En (26) En<br />

(21) 11183976.7 (22) 13.<strong>02</strong>.2006<br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HU IE IS IT LI LT LU LV MC NL PL PT RO<br />

SE SI SK TR<br />

AL BA HR MK YU<br />

(30) 14.<strong>02</strong>.2005 US 58155<br />

(54) • SM-Glasfaserlesesystem und Verfahren zur<br />

Befragung resonanter Wellenleiter-Gittersensoren<br />

• Single mode (sm) fiber optical reader<br />

system and method for interrogating<br />

resonant waveguide-grating sensor(s)<br />

• Système lecteur monomodal à fibres<br />

optiques et procédé pour interroger un ou<br />

plusieurs capteurs de réseau de guides<br />

d'ondes résonants<br />

(71) Corning Incorporated, 1 Riverfront Plaza,<br />

Corning, New York 14831, US<br />

(72) Gollier, Jacques, Painted Post, NY 14831, US<br />

Piech, Garrett A, Horseheads, NY 14845, US<br />

(74) Anderson, James Edward George, Elkington<br />

and Fife LLP Prospect House 8 Pembroke<br />

Road, Sevenoaks, Kent TN13 1XR, GB<br />

(62) 06720698.7 / 1 856 507<br />

G01N 21/47 → (51) G01S 17/58<br />

G01N 21/53 → (51) G01N 15/14<br />

265<br />

Anmeldungen<br />

Applications<br />

Demandes (<strong>02</strong>/<strong>2012</strong>) 11.01.<strong>2012</strong><br />

(51) G01N 21/64 (11) 2 405 256 A1<br />

A61B 5/00<br />

(25) En (26) En<br />

(21) 11173248.3 (22) 08.07.2011<br />

(84) AL AT BE BG CH CY CZ DE DK EE ES FI FR<br />

GB GR HR HU IE IS IT LI LT LU LV MC MK<br />

MT NL NO PL PT RO RS SE SI SK SM TR<br />

BA ME<br />

(30) 09.07.2010 US 363005 P<br />

(54) • Quantitative In-vivo-Lebenszeitabbildung<br />

mit einer Zeitbereichsplattform mit Superkontinuum-abstimmbarem<br />

Laser für<br />

erweiterte spektrale Abdeckung<br />

• Quantitative in vivo lifetime imaging using<br />

a time-domain platform with a supercontinuum<br />

tunable laser for extended<br />

spectral coverage<br />

• Imagerie de durée de vie in vivo quantitative<br />

utilisant une plateforme de domaine<br />

temporel avec un laser réglable supercontinuum<br />

pour couverture spectrale étendue<br />

(71) SoftScan HealthCare Group, 2300 Alfred-<br />

Nobel Blvd., Saint-Laurent QC H4S 2A4, CA<br />

(72) Mincu, Niculae, Quebec H9R 5W8, CA<br />

Huang, Dao Chao, Montreal, Quebec H1L<br />

5V4, CA<br />

Piche, Marilyse, Laval, Quebec H7N 2H3, CA<br />

Ma, Guobin, Dorval, Quebec H9S 2M2, CA<br />

(74) Wittmann, Günther, et al, Wittmann Hernandez<br />

<strong>Patent</strong> Attorneys Boschetsrieder Straße<br />

67, 81379 München, DE<br />

G01N 21/64 → (51) G01N 15/14<br />

G01N 21/64 → (51) G01N 33/574<br />

(51) G01N 21/65 (11) 2 405 257 A1<br />

(25) Ja (26) En<br />

(21) 107488<strong>02</strong>.5 (22) 04.03.2010<br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HR HU IE IS IT LI LT LU LV MC MK MT<br />

NL NO PL PT RO SE SI SK SM TR<br />

(86) JP 2010/053509 04.03.2010<br />

(87) WO 2010/101209 2010/36 10.09.2010<br />

(30) 04.03.2009 JP 2009051105<br />

22.07.2009 JP 2009171354<br />

(54) • TESTSUBSTRAT MIT OBERFLÄCHENVER-<br />

STÄRKTER RAMAN-STREUUNGSAKTIVI-<br />

TÄT<br />

• ASSAYING SUBSTRATE WITH SURFACE-<br />

ENHANCED RAMAN SCATTERING ACTIV-<br />

ITY<br />

• SUBSTRAT DE DOSAGE AVEC ACTIVITÉ<br />

DE DIFFUSION RAMAN À EXALTATION DE<br />

SURFACE<br />

(71) Hasegawa, Yuki, 4652-4 Funatsu-cho,<br />

Himeji-shi, Hyogo 679-2101, JP<br />

(72) HASEGAWA, Katsuyuki, Himeji-shi Hyogo<br />

679-2101, JP<br />

(74) Sielewiesiuk, Jakub, AOMB Polska Sp. z o.o.<br />

Emilii Plater 53, 28th floor, 00-113 Warszawa,<br />

PL<br />

G01N 21/77 → (51) G01N 21/47<br />

(51) G01N 21/84 (11) 2 405 258 A2<br />

(25) De (26) De<br />

(21) 11075165.8 (22) 08.07.2011<br />

(84) AL AT BE BG CH CY CZ DE DK EE ES FI FR<br />

GB GR HR HU IE IS IT LI LT LU LV MC MK<br />

MT NL NO PL PT RO RS SE SI SK SM TR<br />

BA ME<br />

(30) 09.07.2010 DE 1<strong>02</strong>010<strong>02</strong>7144<br />

(54) • Trainingsverfahren für einen adaptiven<br />

Auswertealgorithmus, ein hyperspektrales<br />

Messgerät, sowie eine Vorrichtung zum<br />

Ausbringen eines Betriebsmittels

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