Bulletin 2010/31 - European Patent Office
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Bulletin 2010/31 - European Patent Office

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(G01N) I.1(2)<br />

Lee, Jong-Gun, Gyeonggi-do, KR<br />

(74) Grünecker, Kinkeldey, Stockmair & Schwanhäusser<br />

Anwaltssozietät, Leopoldstrasse 4,<br />

80802 München, DE<br />

(51) G01N 35/00 (11) 2 214 024 A1<br />

(25) En (26) En<br />

(21) 10158350.8 (22) 29.06.2005<br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HU IE IS IT LI LT LU MC NL PL PT RO SE<br />

SI SK TR<br />

(30) 30.06.2004 JP 2004192880<br />

(54) • Probenherstellungsvorrichtung, Probenherstellungs-/-analysesystem<br />

und Probenplatte<br />

• Specimen preparation apparatus, specimen<br />

preparation/analysis system and specimen<br />

plate<br />

• Appareil de préparation de spécimens,<br />

système de préparation/analyse de spécimens<br />

et plaque de spécimens<br />

(71) Sysmex Corporation, 1-5-1 Wakinohama-<br />

Kaigandori Chuo-ku, Kobe-shi, Hyogo 651-<br />

0073, JP<br />

(72) Nakaya, Masanori, Hyogo 651-0073, JP<br />

Hyousa, Yoshihiro, Hyogo 651-0073, JP<br />

Kitagawa, Shigeru, Hyogo 651-0073, JP<br />

Kobayashi, Eisuke, Hyogo 651-0073, JP<br />

Higuchi, Hideyuki, Hyogo 651-0073, JP<br />

(74) HOFFMANN EITLE, <strong>Patent</strong>- und Rechtsanwälte<br />

Arabellastrasse 4, 81925 München, DE<br />

(62) 05014030.0 / 1 612 537<br />

(51) G01N 35/00 (11) 2 214 025 A1<br />

G01N 37/00<br />

(25) Ja (26) En<br />

(21) 08845860.9 (22) 27.10.2008<br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HR HU IE IS IT LI LT LU LV MC MT NL<br />

NO PL PT RO SE SI SK TR<br />

AL BA MK RS<br />

(86) JP 2008/003040 27.10.2008<br />

(87) WO 2009/057267 2009/19 07.05.2009<br />

(30) 29.10.2007 JP 2007279738<br />

07.03.2008 JP 2008057113<br />

05.06.2008 JP 2008147520<br />

09.07.2008 JP 2008178536<br />

(54) • ANALYSEVORRICHTUNG SOWIE ANALY-<br />

SEGERÄT UND ANALYSVERFAHREN<br />

DAMIT<br />

• ANALYSIS DEVICE AND ANALYSIS<br />

APPARATUS AND ANALYSIS METHOD<br />

USING THE SAME<br />

• DISPOSITIF D'ANALYSE ET APPAREIL<br />

D'ANALYSE ET PROCÉDÉ D'ANALYSE LES<br />

UTILISANT<br />

(71) Panasonic Corporation, 1006, Oaza Kadoma,<br />

Kadoma-shi Osaka 571-8501, JP<br />

(72) SAIKI, Hiroshi, Osaka-shi, Osaka 540-6207,<br />

JP<br />

FUJII, Yoshiyuki, Osaka-shi, Osaka 540-<br />

6207, JP<br />

HIGASHI, Nobuyasu, Osaka-shi, Osaka 540-<br />

6207, JP<br />

KITOH, Masaaki, Osaka-shi, Osaka 540-<br />

6207, JP<br />

OKADA, Kenji, Osaka-shi, Osaka 540-6207,<br />

JP<br />

SUGIMOTO, Hirofumi, Osaka-shi, Osaka<br />

540-6207, JP<br />

(74) Grünecker, Kinkeldey, Stockmair & Schwanhäusser<br />

Anwaltssozietät, Leopoldstrasse 4,<br />

80802 München, DE<br />

G01N 35/00 → (51) G01N 37/00<br />

(51) G01N 35/02 (11) 2 214 026 A1<br />

G01N 21/77 G01N 33/52<br />

Europäisches <strong>Patent</strong>blatt<br />

<strong>European</strong> <strong>Patent</strong> <strong>Bulletin</strong><br />

<strong>Bulletin</strong> européen des brevets<br />

G01V 8/12<br />

(25) Ja (26) En<br />

(21) 08842887.5 (22) 25.10.2008<br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HR HU IE IS IT LI LT LU LV MC MT NL<br />

NO PL PT RO SE SI SK TR<br />

AL BA MK RS<br />

(86) JP 2008/069380 25.10.2008<br />

(87) WO 2009/054516 2009/18 30.04.2009<br />

(30) 26.10.2007 JP 2007278829<br />

(54) • PROBENDETEKTOR UND DAMIT AUSGE-<br />

STATTETE MESSVORRICHTUNG<br />

• SAMPLE DETECTOR AND MEASUREMENT<br />

DEVICE EQUIPPED WITH THE SAME<br />

• DÉTECTEUR D'ÉCHANTILLONS ET DIS-<br />

POSITIF EN ÉTANT ÉQUIPÉ<br />

(71) ARKRAY, Inc., 57 Nishiaketa-cho Higashikujo<br />

Minami-ku, Kyoto-shi, Kyoto 601-8045,<br />

JP<br />

(72) SEKIMOTO, Shinjiro, Kyoto-shi Kyoto 601-<br />

8045, JP<br />

(74) Sajda, Wolf E., Meissner, Bolte & Partner<br />

GbR Postfach 86 06 24, 81633 München, DE<br />

G01N 35/10 → (51) G01N 37/00<br />

(51) G01N 37/00 (11) 2 214 027 A1<br />

G01N 35/00 G01N 35/10<br />

(25) Ja (26) En<br />

(21) 08851388.2 (22) 20.11.2008<br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HR HU IE IS IT LI LT LU LV MC MT NL<br />

NO PL PT RO SE SI SK TR<br />

AL BA MK RS<br />

(86) JP 2008/071148 20.11.2008<br />

(87) WO 2009/066737 2009/22 28.05.2009<br />

(30) 20.11.2007 JP 2007300445<br />

25.06.2008 JP 2008165644<br />

(54) • FLÜSSIGKEITSZUFUHRCHIP UND ANALY-<br />

SEVERFAHREN<br />

• LIQUID-FEEDING CHIP, AND ANALYZING<br />

METHOD<br />

• CRISTAUX D'ALIMENTATION EN LIQUIDE<br />

ET PROCÉDÉ D'ANALYSE<br />

(71) Toray Industries, Inc., 1-1, Nihonbashi-<br />

Muromachi 2-chome Chuo-ku, Tokyo 103-<br />

8666, JP<br />

(72) ISHII, Kentaro, Kamakura-shi Kanagawa 248-<br />

8555, JP<br />

HIGASA, Masashi, Kamakura-shi Kanagawa<br />

248-8555, JP<br />

HIRAMATSU, Shingo, Kamakura-shi Kanagawa<br />

248-8555, JP<br />

(74) Kador & Partner, Corneliusstrasse 15, 80469<br />

München, DE<br />

G01N 37/00 → (51) G01N 35/00<br />

G01P 1/02 → (51) B81C 1/00<br />

(51) G01P 5/20 (11) 2 214 028 A1<br />

G01S 17/58<br />

(25) En (26) En<br />

(21) 10150939.6 (22) 18.01.<strong>2010</strong><br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HR HU IE IS IT LI LT LU LV MC MK MT<br />

NL NO PL PT RO SE SI SK SM TR<br />

AL BA RS<br />

(30) 30.01.2009 US 362595<br />

(54) • System zur Messung der Windgeschwindigkeit<br />

• Wind velocity measurement system<br />

• Système de mesure de la vitesse du vent<br />

(71) General Electric Company, 1 River Road,<br />

Schenectady, NY 12345, US<br />

(72) Wu, Juntao, Niskayuna NY New York 12309,<br />

US<br />

335<br />

Anmeldungen<br />

Applications<br />

Demandes (<strong>31</strong>/<strong>2010</strong>) 04.08.<strong>2010</strong><br />

Zheng, Danian, Simpsonville SC South<br />

Carolina 29681, US<br />

Chen, Rui, Clifton Park NY New York 12065,<br />

US<br />

Lee, Boon Kwee, Clifton Park NY New York<br />

12065, US<br />

Monk, David James, Rexford NY New York<br />

12148, US<br />

Dolinsky, Sergei Ivanovich, Clifton Park NY<br />

New York 12065, US<br />

Yan, Weizhong, Clifton Park NY New York<br />

12065, US<br />

Guida, Renato, Wyantskill NY new York<br />

12198, US<br />

(74) Bedford, Grant Richard, Global <strong>Patent</strong><br />

Operation - Europe GE International Inc. 15<br />

John Adam Street, London WC2N 6LU, GB<br />

G01P 13/02 → (51) F03D 7/02<br />

(51) G01P 15/13 (11) 2 214 029 A2<br />

(25) En (26) En<br />

(21) 101519<strong>31</strong>.2 (22) 28.01.<strong>2010</strong><br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HR HU IE IS IT LI LT LU LV MC MK MT<br />

NL NO PL PT RO SE SI SK SM TR<br />

AL BA RS<br />

(30) 30.01.2009 JP 2009019925<br />

(54) • Servo-Geschwindigkeitsmesser<br />

• Servo accelerometer<br />

• Accéléromètre asservi<br />

(71) JAPAN AVIATION ELECTRONICS INDUSTRY<br />

LIMITED, 21-2, Dogenzaka 1-chome, Shibuya-ku<br />

Tokyo 150-0043, JP<br />

(72) Yamamoto, Shuichi, Tokyo 150-0043, JP<br />

(74) MERH-IP Matias Erny Reichl Hoffmann,<br />

Paul-Heyse-Strasse 29, 80336 München, DE<br />

(51) G01P 21/00 (11) 2 214 030 A1<br />

(25) En (26) En<br />

(21) 09151748.2 (22) 30.01.2009<br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HR HU IE IS IT LI LT LU LV MC MK MT<br />

NL NO PL PT RO SE SI SK TR<br />

AL BA RS<br />

(54) • Verfahren zum Kalibrieren eines Beschleunigungsmessers<br />

eines elektronischen<br />

Geräts, Beschleunigungsmesser und elektronisches<br />

Gerät mit einem Beschleunigungsmesser<br />

mit verbesserten<br />

Kalibrierfunktionen<br />

• A Method for Calibrating an Accelerometer<br />

of an Electronic Device, an Accelerometer,<br />

and an Electronic Device having an Accelerometer<br />

with Improved Calibration Features<br />

• Procédé d'étalonnage de l'accéléromètre<br />

d'un dispositif électronique, accéléromètre<br />

et dispositif électronique doté d'un accéléromètre<br />

doté de propriétés d'étalonnage<br />

améliorées<br />

(71) RESEARCH IN MOTION LIMITED, 295 Phillip<br />

Street, Waterloo, Ontario N2L 3W8, CA<br />

(72) Yanni, Mamdouh Kamal, Waterloo Ontario<br />

N2L 3W8, CA<br />

(74) Reichl, Wolfgang, et al, MERH-IP Matias<br />

Erny Reichl Hoffmann Paul-Heyse-Straße 29,<br />

80336 München, DE<br />

G01R 33/60 → (51) G01N 24/10<br />

(51) G01S 5/14 (11) 2 214 0<strong>31</strong> A1<br />

(25) Ja (26) En<br />

(21) 07830667.7 (22) 26.10.2007<br />

(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />

GR HU IE IS IT LI LT LU LV MC MT NL PL PT<br />

RO SE SI SK TR<br />

AL BA HR MK RS

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