Bulletin 2010/15 - European Patent Office
Bulletin 2010/15 - European Patent Office
Bulletin 2010/15 - European Patent Office
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(G01B) I.1(2)<br />
• Appareil d'inspection de paquets de médicaments<br />
(71) JVM Co., Ltd., 100-23 Galsan-Dong, Dalseo-<br />
Gu, Daegu 704-900, KR<br />
(72) Kim, Jun-Ho, Daegu 706-014, KR<br />
(74) Kling, Simone, et al, LAVOIX Bayerstrasse<br />
85a, 80335 Munich, DE<br />
G01B 11/245 → (51) G01B 11/25<br />
(51) G01B 11/25 (11) 2 175 231 A1<br />
(25) En (26) En<br />
(21) 09172042.5 (22) 02.10.2009<br />
(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />
GR HR HU IE IS IT LI LT LU LV MC MK MT<br />
NL NO PL PT RO SE SI SK SM TR<br />
AL BA RS<br />
(30) 10.10.2008 US 249513<br />
(54) • Systemaspekte für ein Sondensystem, das<br />
strukturiertes Licht verwendet<br />
• System aspects for a probe system that<br />
utilizes structured-light<br />
• Aspects de système pour un système de<br />
sonde utilisant une lumière structurée<br />
(71) General Electric Company, 1 River Road,<br />
Schenectady, NY 12345, US<br />
(72) Bendall, Clark Alexander, Syracuse NY New<br />
York 132<strong>15</strong>, US<br />
Harding, Kevin George, Niskayuna NY New<br />
York 12309, US<br />
Karpen, Thomas, Skaneateles NY New York<br />
13<strong>15</strong>2, US<br />
Song, Guiju, Pudong New Area Shanghai<br />
210203, CN<br />
Tao, Li, Pudong Shanghai 201204, CN<br />
(74) Illingworth-Law, William Illingworth, Global<br />
<strong>Patent</strong> Operation - Europe GE International<br />
Inc., <strong>15</strong> John Adam Street London WC2N<br />
6LU, GB<br />
(51) G01B 11/25 (11) 2 175 232 A1<br />
G01B 11/245 G01B 11/255<br />
G06T 1/00<br />
(25) Ja (26) En<br />
(21) 08777908.8 (22) 04.07.2008<br />
(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />
GR HR HU IE IS IT LI LT LU LV MC MT NL<br />
NO PL PT RO SE SI SK TR<br />
AL BA MK RS<br />
(86) JP 2008/062193 04.07.2008<br />
(87) WO 2009/016924 2009/06 05.02.2009<br />
(30) 27.07.2007 JP 2007196192<br />
(54) • EINRICHTUNG, VERFAHREN UND PRO-<br />
GRAMM ZUR MESSUNG EINER DREI-<br />
DIMENSIONALEN FORM UND<br />
AUFZEICHNUNGSMEDIUM<br />
• THREE-DIMENSIONAL SHAPE MEASUR-<br />
ING DEVICE, THREE-DIMENSIONAL<br />
SHAPE MEASURING METHOD, THREE-<br />
DIMENSIONAL SHAPE MEASURING PRO-<br />
GRAM, AND RECORDING MEDIUM<br />
• DISPOSITIF DE MESURE DE FORME<br />
TRIDIMENSIONNELLE, PROCÉDÉ DE<br />
MESURE DE FORME TRIDIMENSION-<br />
NELLE, PROGRAMME DE MESURE DE<br />
FORME TRIDIMENSIONNELLE ET SUP-<br />
PORT D'ENREGISTREMENT<br />
(71) Omron Corporation, 801, Minamifudodo-cho<br />
Horikawahigashiiru Shiokoji-dori Shimogyoku,<br />
Kyoto-shi, Kyoto 600-8530, JP<br />
(72) MITSUMOTO, Daisuke, Kyoto-shi Kyoto 600-<br />
8350, JP<br />
HONMA, Yuki, Kyoto-shi Kyoto 600-8350, JP<br />
(74) Giovannini, Francesca, et al, Osha Liang 32,<br />
avenue de l'Opéra, 75002 Paris, FR<br />
(51) G01B 11/25 (11) 2 175 233 A1<br />
(25) En (26) En<br />
Europäisches <strong>Patent</strong>blatt<br />
<strong>European</strong> <strong>Patent</strong> <strong>Bulletin</strong><br />
<strong>Bulletin</strong> européen des brevets<br />
(21) 09172738.8 (22) 12.10.2009<br />
(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />
GR HR HU IE IS IT LI LT LU LV MC MK MT<br />
NL NO PL PT RO SE SI SK SM TR<br />
AL BA RS<br />
(30) 13.10.2008 KR 20080099998<br />
(54) • Vorrichtung und Verfahren zum Messen<br />
einer dreidimensionalen Form mithilfe von<br />
Mustern verschiedener Wellenlängen<br />
• Apparatus and method for measuring<br />
three-dimensional shape by using multiwavelength<br />
patterns<br />
• Appareil et procédé pour mesurer la forme<br />
tridimensionnelle en utilisant des motifs à<br />
plusieurs longueurs d'onde<br />
(71) Koh Young Technology Inc., 14F ACE<br />
Techno Tower 470-5 Gasan-dong Geumcheon-gu,<br />
Seoul, KR<br />
(72) Kim, Min-Young, Seoul, KR<br />
(74) Hano, Christian, et al, v. Füner Ebbinghaus<br />
Finck Hano <strong>Patent</strong>anwälte Mariahilfplatz 3,<br />
8<strong>15</strong>41 München, DE<br />
(51) G01B 11/25 (11) 2 175 234 A1<br />
G01N 21/95 H01L 21/66<br />
(25) En (26) En<br />
(21) 09172740.4 (22) 12.10.2009<br />
(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />
GR HR HU IE IS IT LI LT LU LV MC MK MT<br />
NL NO PL PT RO SE SI SK SM TR<br />
AL BA RS<br />
(30) 13.10.2008 KR 20080100003<br />
(54) • Verfahren zum Messen einer dreidimensionalen<br />
Form<br />
• Method of measuring a three-dimensional<br />
shape<br />
• Procédé de mesure d'une forme tridimensionnelle<br />
(71) Koh Young Technology Inc., 14F ACE<br />
Techno Tower 470-5 Gasan-dong Geumcheon-gu,<br />
Seoul, KR<br />
(72) Kim, Min-Young, Seoul, KR<br />
Hwang, Bong-Ha, Incheon, KR<br />
(74) Hano, Christian, et al, v. Füner Ebbinghaus<br />
Finck Hano <strong>Patent</strong>anwälte Mariahilfplatz 3,<br />
8<strong>15</strong>41 München, DE<br />
G01B 11/255 → (51) G01B 11/25<br />
(51) G01C 11/02 (11) 2 175 235 A2<br />
(25) De (26) De<br />
(21) 09075447.4 (22) 27.09.2009<br />
(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />
GR HR HU IE IS IT LI LT LU LV MC MK MT<br />
NL NO PL PT RO SE SI SK SM TR<br />
AL BA RS<br />
(30) 29.09.2008 DE 102008049438<br />
14.07.2009 DE 102009009741<br />
(54) • Systeme zur automatisierten Erfassung von<br />
Schrägluftbildern<br />
• Systems for automated capturing of oblique<br />
aerial images<br />
• Systèmes pour acquisition d'images obliques<br />
aériennes<br />
(71) Alpha Luftbild Gmbh, ., Wolliner Str. 16,<br />
10435 Berlin, DE<br />
(72) Henrik Pohl, 10435 Berlin, DE<br />
(74) Wehlan, Helmut, <strong>Patent</strong>anwälte Wehlan &<br />
Wehlan Möllendorffstrasse 49, 10367 Berlin,<br />
DE<br />
(51) G01C 19/56 (11) 2 175 236 A2<br />
G01C 21/16 G01C 25/00<br />
(25) En (26) En<br />
(21) 09169692.2 (22) 08.09.2009<br />
(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />
GR HR HU IE IS IT LI LT LU LV MC MK MT<br />
NL NO PL PT RO SE SI SK SM TR<br />
293<br />
Anmeldungen<br />
Applications<br />
Demandes (<strong>15</strong>/<strong>2010</strong>) 14.04.<strong>2010</strong><br />
(30) 11.09.2008 US 283364<br />
(54) • Selbstkalibrierendes Gyroskopsystem<br />
• Self calibrating gyroscope system<br />
• Système de gyroscope à auto-étalonnage<br />
(71) Northrop Grumman Guidance and Electronics<br />
Company, Inc., 21240 Burbank Boulevard,<br />
Woodland Hills, CA 91367-6675, US<br />
(72) Rozelle, David M., Woodland Hills, CA<br />
91367, US<br />
(74) Colombo, Stefano Paolo, et al, MARCHI &<br />
PARTNERS S.r.l. Via G.B. Pirelli, 19, 20124<br />
Milano, IT<br />
(51) G01C 21/12 (11) 2 175 237 A1<br />
G01C 21/16 G05D 1/02<br />
G06T 7/00 G06T 7/20<br />
(25) En (26) En<br />
(21) 09172481.5 (22) 07.10.2009<br />
(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />
GR HR HU IE IS IT LI LT LU LV MC MK MT<br />
NL NO PL PT RO SE SI SK SM TR<br />
AL BA RS<br />
(30) 13.10.2008 US 250457<br />
(54) • System und Verfahren zur bildbasierten<br />
Navigation mithilfe der Übereinstimmung<br />
von Linienmerkmale<br />
• System and methods for image-based<br />
navigation using line features matching<br />
• Système et procédés pour la navigation<br />
basée sur des images et utilisant la<br />
concordance entre des caractéristiques de<br />
lignes<br />
(71) Honeywell International, Inc., 101 Columbia<br />
Road, Morristown NJ 07962, US<br />
(72) Susca, Sara, Morristown, NJ 07962-2245,<br />
US<br />
Krishnaswamy, Kailash, Morristown, NJ<br />
07962-2245, US<br />
(74) Buckley, Guy Julian, <strong>Patent</strong> Outsourcing<br />
Limited 1 King Street, Bakewell Derbyshire<br />
DE45 1DZ, GB<br />
G01C 21/16 → (51) G01C 19/56<br />
G01C 21/16 → (51) G01C 21/12<br />
(51) G01C 21/20 (11) 2 175 238 A2<br />
(25) En (26) En<br />
(21) 09251456.1 (22) 01.06.2009<br />
(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />
GR HR HU IE IS IT LI LT LU LV MC MK MT<br />
NL NO PL PT RO SE SI SK TR<br />
AL BA RS<br />
(30) 25.07.2008 US 179692<br />
(54) • Positionierung von offenen Gebietsplänen<br />
• Positioning open area maps<br />
• Positionnement de cartes de zones ouvertes<br />
(71) Navteq North America, LLC, 425 West<br />
Randolph Street, Chicago, IL 60606, US<br />
(72) Mays, Joseph P, Chicago, Illinois 60614, US<br />
Gale, William N, Oak Park, Illinois 60302, US<br />
Seegers, Peter A, Evanston, Illinois 60201,<br />
US<br />
Stroila, Matei N, Chicago, Illinois 60618, US<br />
(74) Palmer, Jonathan R., Boult Wade Tennant<br />
Verulam Gardens 70 Gray's Inn Road,<br />
London WC1X 8BT, GB<br />
(51) G01C 21/26 (11) 2 175 239 A1<br />
B60L 11/18 G08G 1/0969<br />
G09B 29/00 G09B 29/10<br />
(25) Ja (26) En<br />
(21) 08777801.5 (22) 26.06.2008<br />
(84) AT BE BG CH CY CZ DE DK EE ES FI FR GB<br />
GR HR HU IE IS IT LI LT LU LV MC MT NL<br />
NO PL PT RO SE SI SK TR
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