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wilamowski-b-m-irwin-j-d-industrial-communication-systems-2011

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47-6 Industrial Communication Systems<br />

CPU1<br />

Fail<br />

safe<br />

unit<br />

Integrated<br />

silicon<br />

switch<br />

First<br />

switch<br />

CPU2<br />

Second<br />

switch<br />

Output<br />

Safe output<br />

FIGURE 47.4<br />

Schematic of safety-related output.<br />

By performing this procedure, the microcontroller is able to check the switching capability of the input<br />

optocoupler and the functional connectivity of all components.<br />

According to the two-channel architecture, the output stage is split into two switching elements as<br />

shown in Figure 47.4. Only if both stages switch on, the output is activated. It is preferable that both<br />

switching elements use different technologies in order to avoid common cause failures. Hence, the decision<br />

to switch on must be done from both channels together. Only then the output is switched on. For<br />

testing purpose the state of the two stages is read back and additional in one state the output is switched<br />

off for a short period of time in order to test the switching capability. Obviously, the off-time must be<br />

shorter than the reaction time of the switched element.<br />

Even if there are two stages that are able to switch off, there is the possibility that both channels are not<br />

able to perform any actions but are stuck at on state (e.g., due to a common cause of power supply failure).<br />

To overcome that static issue, a frequently triggered control element is added. The fail safe unit only<br />

enables its output if it is permanently triggered from the controlling device. The output of the fail safe<br />

unit supplies the two switching elements of the output stage. Hence, if the fail safe unit is not triggered<br />

anymore, there is no supply control voltage for the switching elements and the output is switched off. So<br />

it is guaranteed that the output enters the safe state if both control channels are stuck at one state and are<br />

not able to perform any more operations. A simple way to design the fail safe unit is to use a transformer<br />

in combination with a capacitor on the output. In order to charge the output capacitor the input signal for<br />

the transformer must periodically change the signal. Both controllers are involved in generating the input<br />

signal of the transformer. One controller is applying the supply voltage and the other one ties the transformer<br />

to ground. Thus, both controllers are able to switch off the fail safe unit if one detects a failure. On<br />

the other hand, if the controller that creates the periodical signal does not work correctly, the periodical<br />

signal fails and as a result the output described in Figure 47.5 switches off automatically.<br />

The 1oo2 hardware structure also affects external devices. Similar to the internal 1oo2 structure all<br />

external devices are connected via two channels. On these channels short test pulses are applied in order<br />

to detect a wiring failure (e.g., no connection or a shortcut between two wires). Therefore, test pulses<br />

must be generated in such a way that one channel is tested at a time. If the emitted test pulse is not<br />

detected or detected on several lines a failure has occurred. Intelligent devices that are not supplied by<br />

the SafetyLon node have to send their own test pulses which are detected by the SafetyLon node.<br />

Figure 47.5 shows how to connect a simple two-channel switch. The two-channel switch is supplied<br />

by the SafetyLon node. In normal operation the switch is closed and a high level is detected on the<br />

input pins of the SafetyLon device. Then the external wiring and the switch are tested. Periodically,<br />

one of the two channels is switched off for a very short time. So all failures are detected that occur on<br />

the external wiring from and to the switch. The switch itself is implicitly checked as the same signal<br />

level must be detected on both inputs. In case of an opened switch, no tests are necessary because<br />

low signals on both inputs are defined as the safe state. In that state, the SafetyLon device has to enter<br />

© <strong>2011</strong> by Taylor and Francis Group, LLC

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