Plenarvorträge - DPG-Tagungen
Plenarvorträge - DPG-Tagungen
Plenarvorträge - DPG-Tagungen
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Halbleiterphysik Montag<br />
basierend auf Streumatrixmethoden[2] verglichen.<br />
[1] A. Christ et al., Phys. Rev. Lett. 91, 183901 (2003)<br />
[2] Chapter 1 in K. Busch et al., Photonic Crystals – Advances in Design,<br />
Fabrication, and Characterization, Wiley VCH (2004)<br />
HL 8.5 Mo 16:15 H15<br />
Focussing Effects in 2D Photonic Crystals — •Frank Hagmann<br />
1 , Kurt Busch 1,2 , and Peter Wölfle 1 — 1 Institut für Theorie<br />
der Kondensierten Materie, Universität Karlsruhe — 2 School of Optics/CREOL<br />
and Department of Physics/University of Central Florida,<br />
Orlando, U.S.A.<br />
HL 9 Heterostrukturen I<br />
Using the multiple multipole method [1] we analyze the optical properties<br />
of finite-sized two-dimensional Photonic Crystal waveguiding structures.<br />
In particular, we study the beaming and focussing abilitites of<br />
various types of straight waveguides and the connection of these effects<br />
to surfaces modes. We show how different surface terminations as<br />
well as surface impedance variations of waveguides allow one to obtain<br />
control over the focussing properties. These enhanced beaming properties<br />
will aid in the design and development of future Photonic Crystal<br />
based devices and of optical interconnects between Photonic Crystal<br />
functional elements and standard index guiding optical components.<br />
[1] A.A.Asatryan, K.Busch, R.C.McPhedran, L.C.Botton, C.M.de Sterke<br />
and N.A.Nicorovici, Waves in Random Media 13,9(2003)<br />
Zeit: Montag 15:15–16:30 Raum: H17<br />
HL 9.1 Mo 15:15 H17<br />
Sputter depth profiling of GaN/InAlGaN multi quantum well<br />
structures — •Gernot Ecke 1 , Rastislav Kosiba 1 , Gabriel Kittler<br />
1 , Nikos Pelekanos 2 , and Oliver Ambacher 1 — 1 Center of<br />
Micro- and Nanotechnologies, TU Ilmenau, D-98693 Ilmenau, Germany<br />
— 2 Foundation for Research and Technology - Hellas, P.O. Box 1527,<br />
GR 71110 Heraklion, Crete, Greece<br />
Multi quantum well (MQW) structures play a crucial role in the design<br />
of many optoelectronic devices. The regularity of these structures,<br />
the composition of the layers, and the quality of the interfaces between<br />
the layers are very important for the device functionality. In this contribution,<br />
the sputter depth profiles across the MQW consisting of seven<br />
GaN/InAlGaN layer pairs with thickness of 7 nm will be presented. The<br />
sputter depth profiling was carried out by Auger electron spectroscopy<br />
in conjunction with argon ion sputtering. Grazing incidence and low ion<br />
energy provided good sputtering conditions for highly depth resolved<br />
measurements. For the evaluation of the depth profiles the factor analysis<br />
of the nitrogen KLL and overlapping Al LMM and Ga MNN Auger<br />
transitions was applied. The deterioration of the true depth profile due<br />
to the sputtering itself as well as due to the information depth of the<br />
Auger electrons was followed by the dynamic Monte Carlo simulation<br />
code TRIDYN. From the good agreement between the measurement and<br />
the simulation the regularity of the measured MQW structure as well as<br />
good interface quality could be proven.<br />
HL 9.2 Mo 15:30 H17<br />
Time-domain THz spectroscopy of electronic exitations in<br />
GaAs/AlGaAs superlattices — •André Dreyhaupt, Stephan<br />
Winnerl, Thomas Dekorsy, and Manfred Helm — Institut<br />
für Ionenstrahlphysik und Materialforschung, Forschungszentrum<br />
Rossendorf, Postfach 51 01 19, 01314 Dresden<br />
We investigate the electronic properties of weakly and more strongly<br />
coupled n-doped GaAs/AlGaAs superlattices by time-domain THz spectroscopy<br />
in the low frequency range from about 0.5 to 3.5 THz. The<br />
sample properties are modulated either by applying an AC voltage via a<br />
gate electrode or by injecting a vertical current. The transmission signal<br />
is detected at the frequency of the modulation voltage with a lock-in amplifier<br />
leading to a signal-to-noise ratio superior compared to conventional<br />
FTIR spectroscopy in this frequency range. We will discuss the observation<br />
of inter-miniband transitions, confined donor transitions, plasmon<br />
excitations and the measurement of intra-miniband THz conductivity in<br />
a wide range of lattice temperatures.<br />
HL 9.3 Mo 15:45 H17<br />
Dynamics of Excitons in Coupled Quantum Well Structures —<br />
•Andreas Gärtner 1 , D. Schuh 2 , and J. P. Kotthaus 1 — 1 CeNS<br />
und Sektion Physik der LMU, München — 2 Walter Schottky Institut,<br />
TU München<br />
The experiments to learn more about motion and interaction of longliving<br />
excitons in coupled quantum wells (QW) [1] are carried out in<br />
semiconductor heterostructures at low temperatures (4 K). These epitaxially<br />
grown samples contain two GaAs-QWs which are separated by<br />
a thin tunnelling barrier.<br />
Metallic gates applied to a sample generate an electrical field perpendicular<br />
to the QW layers. This causes the transition from direct to<br />
spatially indirect excitons, i.e. electron and hole are located in different<br />
QWs. Thus, the overlap of their wave functions is reduced and the exci-<br />
tonic life time increases.<br />
By means of the quantum confined stark effect (QCSE) the vertical electric<br />
field affects the effective excitonic potential [2]. It can be modulated<br />
by interdigitated gate structures [3] leading to in-plane dift phenomena.<br />
In our experimental pump-and-probe-setup we observed these effects<br />
on photo generated excitons by analyzing their emitted photoluminescence<br />
spatially, temporally and spectrally. An intensified CCD-Camera<br />
featuring a temporal resolution in the sub-nanosecond regime allows further<br />
detailed studies on the dynamics of excitonic drift.<br />
[1] Butov et al., Nature 417, 47 (2002)<br />
[2] S. Zimmermann et al., Phys. Rev. B 56, 13414 (1997)<br />
[3] J. Krauß et al., Phys. Rev. Lett. 88, 036803 (2002)<br />
HL 9.4 Mo 16:00 H17<br />
Piezo-electric fields in InGaAsP induced by spontaneous selfordering<br />
— •S. Krämer 1 , G. H. Döhler 1 , S. Neumann 2 , W.<br />
Prost 2 , and T. J. Tegude 2 — 1 Institut für Technische Physik I,<br />
Universität Erlangen-Nürnberg, Erwin-Rommel-Str. 1, D-91058 Erlangen<br />
— 2 Fachbereich Halbleitertechnik/Halbleitertechnologie, Universität<br />
Duisburg, Lotharstr. 55 LT, D-47048 Duisburg<br />
InGaAsP grown by MOCVD under specific growth conditions form<br />
a monolayer superlattice along the [111] B direction (”spontaneous selfordering”).<br />
This superlattice can be formed by InP-GaAs or InAs-GaP.<br />
Because of the different bond lengths in these combinations the resulting<br />
two ”versions” of InGaAsP would have varying distances between<br />
the alternating layers compared to unstrained bulk material. For In-<br />
GaAsP, grown lattice matched on an InP-substrate, these different layer<br />
sequences lead to significant piezo-electric fields in the range of about 100<br />
kV/cm. The existence of order-induced piezo-electric fields for ordered<br />
GaInP, lattice matched to GaAs, has been discussed controversially in<br />
the literature [1], [2], [3]. To investigate the occurrence, sign, and magnitude<br />
of piezo-electric fields in the InGaAsP-system, we embedded an<br />
InGaAsP - quantum well in an InP - pin and - nip structure, respectively.<br />
By observing the quantum confined Stark effect in the photocurrent signal<br />
in both structures we were able to determine the strength (and sign)<br />
of the piezo-electric field to about 130 kV/cm in ordering direction.<br />
[1]: S. Froyen et al. APL 68, 2852 (1996)<br />
[2]: P. Ernst et al. ICPS 23 World Scientific 1996<br />
[3]: J. D. Perkins et al. JAP, 84 (1998)<br />
HL 9.5 Mo 16:15 H17<br />
Distribution of C-acceptors in delta-doped GaAs studied with<br />
Cross-sectional Scanning Tunneling Microscopy — •L. Winking<br />
1 , M. Wenderoth 1 , T.C.G. Reusch 1 , R.G. Ulbrich 1 , P.-J.<br />
Wilbrandt 2 , R. Kirchheim 2 , S. Malzer 3 , and G. Döhler 3 — 1 IV.<br />
Phys. Inst., Universität Göttingen, Tammannstr.1, D-37077 Göttingen —<br />
2 Inst. f. Materialphysik, Universität Göttingen, Tammannstr.1, D-37077<br />
Göttingen — 3 Inst. f. Techn. Physik I, Universität Erlangen-Nürnberg,<br />
Erwin-Rommel-Str. 1, D-91058 Erlangen<br />
We present XSTM investigations of the C-acceptor-distribution in<br />
delta-doped GaAs. At the intended positions of the C-delta-layers we<br />
found at area-densities of 3×10 12 cm −2 up to extremely high area-densities<br />
of 1 × 10 14 cm −2 a monolayer-sharp spatial distribution of C-acceptors in<br />
growth direction. The slight broadening of less than 0.85nm is found to<br />
be almost symmetric around the intended position of the delta-layer up<br />
to the highest concentration investigated. These results point out that<br />
even at the elevated growth temperature of 570 ◦ C and a very high dopant