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Oberflächenphysik Montag UHV conditions lowers the density of thiole molecules at the Au(111) surface which results in an alignment of the thiole molecules parallel to the Au surface. The focus is on the properties of the line-structure phase with the lowest surface density [1][2]. Al clusters are evaporated on the regions of the thiol line-structure in order to investigate where the Al atoms adsorb. With the STM we find that the Al clusters preferably adsorb onto the sulphur head of the thiol. Additionally, we investigate in AFM measurements with Al functionalized tips the forces acting on different parts of the thiol chain. [1] Poirer G.E. Langmuir 1999, 15, 1167-1175 [2] Staub R., Toerker M., Fritz T., Schmitz-Hübsch T., Sellam F., Leo K. Langmuir 1998, 14, 6693-6698 O 14.75 Mo 18:00 Bereich C Nanoscale Conductivity Spectroscopy on Solid Electrolytes using an Atomic Force Microscope — •Ahmet Taskiran, Andre Schirmeisen, Harald Fuchs, Frank Natrup, and Harmut Bracht — Physikalisches Institut and CeNTech, University of Muenster, Wilhelm-Klemm-Str.10, 48149 Muenster, Germany Ion conducting solid materials play an important role as electrolytes in energy conversion systems, such as batteries and fuel cells, and also in electrochemical sensors. An important prerequisite for further progress in this field is a better understanding of the ion transport mechanisms on microscopic and nanoscopic length scales. We are using atomic force microscopy (AFM) to measure the ionic conductivity in nanoscale volumes of dielectric glasses. The AFM is operated in the non-contact mode in vacuum. After a sudden change of the tip voltage, the relaxation of the electrostatic force between tip and sample is measured as a function of time. We measure these relaxation curves as a function of sample temperatures ranging from 100K to 675K. The observed relaxation curves are fitted well with a stretched exponential function and we can determine the activation energy of the conduction processes of the ions. First results indicate a good agreement of the activation energies for several prototype ionic glas conductors with values from macroscopic measurements. This method allows us to study fundamental processes of ionic transport and is in particular interesting for the investigation of nanostructured solid electrolytes. O 14.76 Mo 18:00 Bereich C Optical phase effects and resonance shift in scattering-type near-field infrared microscopy — •Thomas Taubner 1 , Fritz Keilmann 1 , and Rainer Hillenbrand 2 — 1 Max-Planck-Institut für Biochemie, Am Klopferspitz 18a, 82152 Martinsried — 2 Nano-Photonics Group, Max-Planck-Institut für Biochemie, Am Klopferspitz 18a, 82152 Martinsried A scattering-type near-field optical microscope (s-SNOM) detects light scattered at the sharp tip of a probing needle and allows imaging with subwavelength resolution, independent of the wavelength used for illumination[1]. We now study amplitude and phase of light scattered from a s- SNOM’s tip probing a flat SiC sample, at mid-infrared frequencies where surface phonon polaritons resonantly enhance the tip-sample near-field interaction [2]. A nanometer-scale variation of the gap width between tip and sample causes the optical phase to change dramatically and the resonance to shift. Both effects can be explained by theory that treats the system as a point dipole (tip) interacting with its image dipole (sample), in electrostatic approximation. The phase effects and resonance shifts are not restricted to phonon polariton excitation in polar dielectrics like SiC, but should be observable also for resonances related to plasmons and excitons. [1] T. Taubner, R. Hillenbrand and F. Keilmann, Journal of Microscopy 210, 311 (2003) [2] R. Hillenbrand, T. Taubner and F. Keilmann, Nature 418, 159 (2002) O 14.77 Mo 18:00 Bereich C Investigations on nanocrystals in silicondioxide by atomic force microscopy — •E. Beyreuther 1 , R. Beyer 1 , K. Walzer 1 , S. Behrendt 1 , V. Beyer 2 , J. von Borany 2 , J. Weber 1 , and L. Eng 1 — 1 Technische Universität Dresden, Institut für Angewandte Physik, D- 01062 Dresden — 2 Forschungszentrum Rossendorf, Institut für Ionenstrahlphysik und Materialforschung, PF 510119, D-01314 Dresden Nanocrystals in SiO2 are promising structures for future optoelectronic and memory devices. Optimization of the synthesis process needs detailed information about structure and morphology. Within the present work SiO2 layers of 100 nm thickness were ther- mally grown on Si(100). Subsequently Si or Ge nanocrystals were fabricated within those oxide films by ion implantation and rapid thermal annealing. Etching in buffered HF-solution with a low rate of 12nm/min removed the top oxide layer and uncovered the nanocrystals to a certain depth. The surfaces of several samples, which had undergone varied implantation and annealing conditions as well as different etching times were imaged by tapping-mode AFM down to scan sizes of 200x200 µm 2 . The apparent nanocrystal size and density were found to be dependent on the synthesis parameters and the position within the oxide layer. In comparison to TEM investigations of the same structures we discuss critically the determination of the cluster size. O 14.78 Mo 18:00 Bereich C Detection of dopant profiles in silicon by scanning capacitance microscopy and related techniques: the role of the passivation layer — •Reinhard Beyer 1 , Elke Beyreuther 1 , Bernd Schmidt 2 , Stefan Polzin 3 , and Jörg Weber 1 — 1 Technische Universität Dresden, Institut für Angewandte Physik, D-01062 Dresden — 2 Forschungszentrum Rossendorf, Institut für Ionenstrahlphysik und Materialforschung, PF 510119, D-01314 Dresden — 3 Fraunhofer-Institut für Photonische Mikrosysteme, Grenzstrasse 28, D-01109 Dresden Scanning capacitance microscopy (SCM) was employed for the study of dopant profiles in silicon test structures. The samples were fabricated by implantation of boron and phosphorous into n-type silicon. The oxide mask for the implantation was shaped by photolithography. Hence, stripe patterns with a size of 2 µm of the implanted region and different widths of the interregion were obtained. The implantation dose was 5 × 10 12 , 5 × 10 13 and 5 × 10 14 cm −2 for both implanted ions. Samples with native oxide coverage and with a 7 nm thick silicondioxide layer were compared in this study. SCM measurements were performed in the contact-mode. We show, that the contrast of the SCM signal between differently doped regions depends not only on the dc bias applied during the scan, but also on charge instabilities and trapping effects. The latter appeared mostly for samples with native oxide and resulted in hysteresis effects which could be observed with local dC/dV vs. V spectroscopy. The charge instabilities are discussed in a MOS-model. The results are compared with scanning spreading resistance measurements and with non-contact SCM. O 14.79 Mo 18:00 Bereich C Study of particle-substrate interaction by nanomanipulation experiments with dynamic scanning force microscopy — •Claudia Ritter 1 , Markus Heyde 2 , and Klaus Rademann 1 — 1 Humboldt- Universität zu Berlin, Institute of Chemistry, Brook-Taylor-Str. 2, D- 12489 Berlin, Germany — 2 Fritz-Haber-Institute of the Max-Planck- Society, Faradayweg 4-6, D-14195 Berlin, Germany We utilise an advanced homebuilt SFM in the dynamic mode, in conjunction with a special homebuilt software, to perform precise nanomanipulation experiments. The corresponding experimental technique should be denoted as Dynamic Surface Modification (DSM), comprising both the dynamic technique of the SFM, as well as the manipulation (translation, in-plane rotation, cutting) of structurally unchanged particles on a given substrate surface. It is easily possible to switch between imaging mode and DSM mode, enabling the direct manipulation of nanoparticles under ambient conditions with high precision and simultaneously studying particle-substrate interaction to give evidence about motion and tribological values of the sample system. We have successfully manipulated miscellaneous nanoparticles on surfaces, e.g. antimony islands, gold islands, tin islands, nanotubes, small latex spheres as well as cells. O 14.80 Mo 18:00 Bereich C In-situ SPM usage at MOVPE-conditions — •Markus Breusing, Bert Rähmer, Raimund Kremzow, and Wolfgang Richter — TU-Berlin, Institut für Festkörperphysik, Hardenbergstr. 36, 10623 Berlin In-situ scanning probe techniques which are applicable in an MOVPE growth environment to directly give quantitative information about the nano-scale topography of the sample do not exist up to now. Developing a SPM for in-situ MOVPE measurements requires a completely new setup. In comparison to the commercially available SPMsolutions, a number of additional problems have to be solved. The limited space in the MOVPE reactors and the high temperature caused by the thermal conductivity of the carrier gas during growth near the suszeptor requires a special design of the components of the SPM. On the other
Oberflächenphysik Montag hand the influence of the SPM components on all growth relevant parameters should be minimized. Therefore the tip has to be quite long than (2 cm) in order to bridge the distance between linertube and susceptor. Nevertheless the construction has to be stable to achieve a good resolution, especially because of the disturbing influence of vibrations, caused by pumping systems, gas-flow, etc. in MOVPE. The new achievements will be demonstrated. O 14.81 Mo 18:00 Bereich C Reduktion der Oberflächenrauhigkeit isolierender und metallischer Schichten mittels niederenergetischem Plasmastrahl — •D. Hoffmann, P.A. Beck, S.O. Demokritov und B. Hillebrands — Fachbereich Physik und Forschungsschwerpunkt MINAS, Technische Universität Kaiserslautern, Erwin-Schrödinger-Str. 56, 67663 Kaiserslautern Am Beispiel von metallischen Schichten (Cu, CoFe, NiFe) und MgO Substrate wird der Effekt der Glättung von Oberflächen untersucht. Dazu wird eine induktiv gekoppelte HF-Plasmastrahlquelle eingesetzt, die Ionen verschiedener Arbeitsgase (z.B. Ar, O2) mit exakt einstellbaren Energien von 20-100eV erzeugt. Als Analysemethode wird AFM; insitu STM, LEED und Auger-Elektronen-Spektroskopie verwendet. Dabei zeigt sich, dass mittels O2-Ionen nicht nur die Rauhigkeit von MgO stark reduziert werden kann (RMS < 0.1nm), sondern auch die durch den Herstellungsprozess bedingte Kontamination der Oberfläche mit Kohlenstoff vollständig entfernt wird. Einen vergleichbaren Glättungseffekt erzielt man beim Beschuss von metallischen Schichten mit Ar-Ionen. Die Rauhigkeiten werden dabei um mehr als 40% verringert. Der Effekt zeigt eine Selektivität bezüglich des lateralen Maßstabes. Die Rauhigkeit wird mit einer typischen Skala von 5-50nm am besten reduziert. O 14.82 Mo 18:00 Bereich C Micromechanical properties of Tobacco Mosaic Virus studied by AFM — •Nicola Maghelli, Schmatulla Alexander, and Othmar Marti — Abteilung Experimentelle Physik Universitaet Ulm The morphology of the Tobacco Mosaic Virus (TMV) is well known in spite of its very simple structure, consisting of an helix-arranged protein capside (pitch 2.3 nm, radius 9 nm) for a total length of 282 nm. However, very few is still known about its mechanical properties: by means of a self made atomic force microscope we were able to investigate some basic properties, such as stiffness and E modulus, at single virion level. Measurements of the viruses (LGC Promochem ATCC PV-135P) were both carried on in air and in liquid environment employing various techniques (tapping mode, pulse force mode). Different substrates (cleaved mica, glass, polycarbonate, gold Fisher pattern) and probe preparations methods (spin coating, critical point drying) have been employed as well O 15 Hauptvortrag M. A. Schneider as different solvents (DMSO, alcohol, water) when working in liquid environment. The results give a lower limit to the single virion elasticity and E modulus’s values. O 14.83 Mo 18:00 Bereich C Cantilever characterization by noise measurements in an Atomic Force Microscope — •T.D. Long, F. Müller, A.-D. Müller, and M. Hietschold — Chemnitz University of Technology, Institute of Physics, Solid Surface Analysis Group, 09107 Chemnitz This contribution presents an instrumentation for low signal analysis based on the lock-in amplifier principle. The device has been developed for enhanced signal analysis of multiple cantilever devices for the Atomic Force Microscopy, where the individual elongations of the cantilevers are separated by frequency selection. Here, its application is demonstrated at the example of cantilever noise measurements. Resonance spectra are detected for various cantilever types in dependence on the excitation amplitude and the pressure. The quality factor is derived and its dependency on several parameters is presented. O 14.84 Mo 18:00 Bereich C Digital Pulsed Force Mode and Dynamical Friction Measurements — •Alexander Gigler 1 , Peter Spizig 2 , Stefan Walheim 3 , Othmar Marti 1 , and Thomas Schimmel 3 — 1 Experimental Physics, University of Ulm, D-89069 Ulm, Germany — 2 WITec GmbH, www.WITec.de — 3 Institute for Nanotechnology, Forschungszentrum- Karlsruhe GmbH, D-76021 Karlsruhe, Germany As a standard technique force vs. distance plots (FD-plots) allow to acquire local mechanical properties, but they are at least two orders of magnitude too slow when used in a surface imaging mode. In order to measure an entire image at the same scanning speed, the Pulsed-Force- Mode was developed. A recent development is the Digital Pulsed Force Mode, that acquires each force curve for every pixel during a single run of the experiment. Therefore, postprocessing algorithms, i.e. for the calculation of the energy dissipated in each cylce, can be used to analyze the sample in various ways without scanning the sample more often and possibly destroying it. To access friction parameters and the properties accessible by PFM at thesame time, the system has been extended to the COmbined- DYnamical-Mode and is now also capable of dynamical friction measurements. The concurrent measurement of both friction and adhesion is especially important, since both seem to be closely related. In this poster, the principles of this measurement system, the implementation on our WITec α-SNOM setup and results on a SAM based on a lift-off technique using µ-contact printing will be shown. Zeit: Dienstag 09:30–10:15 Raum: H36 Hauptvortrag O 15.1 Di 09:30 H36 Electron Spectroscopy of Many-Body Interaction using Scanning Tunneling Microscopy — •M. Alexander Schneider, Lucia Vitali, Peter Wahl, Lars Diekhöner, Gero Wittich, Michael Vogelgesang, and Klaus Kern — Max-Planck-Institut für Festkörperforschung, Heisenbergstr. 1, 70569 Stuttgart Electron spectroscopy is pivotal to solid state physics. When traditional spectroscopy methods like photoelectron spectroscopy, Auger electron spectroscopy, electron energy loss spectroscopy, etc. reach their limits to study electronic states in nanostructures, molecules or atoms, O 16 Hauptvortrag Schäfer microscopy is the method of choice. Scanning Tunneling Spectroscopy (STS), is a microscopy method that can provide the wanted spectroscopical information in many cases with atomic scale resolution. In this talk I will discuss the possibilities of STS with regard to many-body interaction in nanostructures. Among these are electronelectron processes that limit the life time of hot electrons in surface or image-potential states. But also the interaction of a magnetic adatom or molecule with a non-magnetic substrate can lead to the formation of a correlated many-body state, the Kondo state. The spectroscopy of single impurity Kondo systems provides insight into this interaction of a magnetic impurity with the electrons at the surface of metals. Zeit: Dienstag 10:15–11:00 Raum: H36 Hauptvortrag O 16.1 Di 10:15 H36 Electronic Interactions and Phase Transitions at Surfaces and in Low Dimensions — •Jörg Schäfer — Institut für Physik, Universität Augsburg, 86135 Augsburg Low-dimensional and magnetic systems provide particularly clear-cut cases for the study of modified electron states that result from coupling with elementary excitations. Electronic quasiparticles of enhanced mass have been observed on the energy scale of phonons, and very recently on that of spin waves. Such mechanisms play a role in superconducting pair formation, with spin fluctuations being considered for high-temperature superconductivity. These interactions together with a nesting condition in the Fermi surface can lead to charge or spin density waves. The phase transition is characterized by the opening of an energy gap and is accompanied by a
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Symposium Physics of Foams Mittwoch
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Symposium Quantum Shot Noise in Nan
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Symposium X-RAY Magneto-Optics Tage
Page 515 and 516:
Symposium X-RAY Magneto-Optics Dien
Page 517 and 518:
Lehrertage Regensburg Hauptvorträg
Page 519 and 520:
A. D., Mirlin .................HL 1
Page 521 and 522:
Breidenbach, Boris ........ AKB 50.
Page 523 and 524:
Elli, Alexandra .............SYLS 3
Page 525 and 526:
Greer, Lindsay ......... M 9.1, M 1
Page 527 and 528:
Horn-von Hoegen, M. O 13.2, O 14.40
Page 529 and 530:
Korn, Tobias ...............MA 13.6
Page 531 and 532:
Martin, Tobias ............. MA 13.
Page 533 and 534:
Partyka, Ewa ................ M 18.
Page 535 and 536:
Rugeramigabo, Eddy Patrick O 14.38,
Page 537 and 538:
Sihler, J. .................... DS
Page 539 and 540:
Volz, K. .................... HL 44
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