09.12.2012 Views

Plenarvorträge - DPG-Tagungen

Plenarvorträge - DPG-Tagungen

Plenarvorträge - DPG-Tagungen

SHOW MORE
SHOW LESS

Create successful ePaper yourself

Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.

Oberflächenphysik Donnerstag<br />

messer 100 ˚A beträgt und ein geschlossener Co Film gewachsen ist. Nach<br />

Deposition von 7 ˚A zeigt der Co Film erstmals ein magnetisches Verhalten.<br />

Anlassen der Probe über 500 K führt zur Koaleszenz der Cluster und<br />

einer fortschreitenden Diffusion von Co Atomen durch das Oxid in das<br />

Substrat, wobei nach dem Anlassen auf 1000 K Co vollständig diffundiert<br />

ist.<br />

O 39.6 Do 17:00 H39<br />

Kinetic lattice Monte-Carlo simulations of stacking fault nucleation<br />

on Ir(111) — •Michael Müller and Karsten Albe — TU<br />

Darmstadt, FB Materialwissenschaft, Petersenstraße 23, 64289 Darmstadt<br />

A prominent fault during epitaxial growth of face-centered-cubic (111)<br />

metal surfaces is the formation of adatom islands that nucleate and<br />

grow in the hexagonal-close-packed stacking. For sub-monolyer growth<br />

on Ir(111) detailed experimental data on the temperature dependence of<br />

the probability of stacking fault island formation is available from scanning<br />

tunneling microscopy. Here, we present kinetic lattice Monte-Carlo<br />

(KLMC) simulations of homoepitaxial island growth on Ir(111) that are<br />

able to reproduce the experimentally observed shape and distribution of<br />

stacking fault islands over a wide temperature range. In our simulations,<br />

atomic positions are not restricted to perfect fcc lattice sites, as it is the<br />

case in conventional KLMC. Therefore, an effective method to implement<br />

a refined lattice that includes fcc as well as hcp sites is presented. Also,<br />

the diffusion behavior of small adatom clusters plays a central role for<br />

the formation of stacking fault islands on Ir(111). Our KLMC simulations<br />

identify adatom clusters on the surface. In addition to single adatoms,<br />

these clusters are also treated as mobile species.<br />

O 39.7 Do 17:15 H39<br />

Epitaxial growth of thin Alumina on a Cr2O3(0001) substrate<br />

— •Karifala Dumbuya 1 , Sven L. M Schroeder 2 , and Klaus<br />

Christmann 1 — 1 Freie Universität Berlin, Institut für Chemie, Takustrasse<br />

3, 14195 Berlin, Germany — 2 Molecular Materials Centre, Department<br />

of Chemical Engineering, UMIST, PO Box 88, Manchester, M60<br />

1QD, UK<br />

The growth of vapour-deposited Al and aluminium oxide on chromia<br />

Cr2O3(0001) has been studied by auger electron spectroscopy (AES), low<br />

energy electron diffraction (LEED), ion scattering spectroscopy (LEIS),<br />

and x-ray photoelectron spectroscopy (XPS). If aluminium is deposited<br />

in the absence of oxygen, aluminium LVV auger signals are found in the<br />

40-56 eV region, indicative of aluminium in the oxidised state (Metallic<br />

Al appears at 67 eV). This led us to conclude that the phenomenon of aluminothermy<br />

must have occured. Controlled evaporation of aluminium in<br />

an oxygen milieu, however, resulted in the growth of well ordered Al2O3<br />

films up to a thickness of 30 ˚A, whereby the epitactic growth could be<br />

monitored by LEED. These films were conducting enough to be subjected<br />

to electron spectroscopy. A gradual attenuation of the XP signals<br />

of Cr indicates layer-by-layer growth. A parallel and recently concluded<br />

investigation of the Cr2O3/Al2O3 system using LEIS and XPS has corroborated<br />

our assumption that alumina grows on the Cr2O3 substrate<br />

in an oriented manner. In addition, LEIS indicated that the uppermost<br />

Al2O3 layers are Cr-free, and from XPS we deduced that Al actually<br />

exists in the Al 3+ valence state.<br />

O 39.8 Do 17:30 H39<br />

Atomic structure of ultrathin Fe films on Cu(100) and Cu(111)<br />

prepared by pulsed laser deposition (PLD) — •Hannes<br />

Schiechl, Albert Biedermann, Michael Schmid, and Peter<br />

Varga — Institut für Allgemeine Physik, Technische Universität Wien,<br />

Wiedner Hauptstrasse 8-10/134, A-1040 Vienna, Austria<br />

O 40 Halbleiteroberflächen und -grenzflächen<br />

Ultrathin Fe films up to 10 ML were grown on Cu(100) and Cu(111)<br />

using pulsed laser deposition (PLD) and analyzed by scanning tunneling<br />

microscopy (STM). We present a survey of the local atomic structure<br />

of these films, which show enhanced layer-by-layer growth compared to<br />

films grown by thermal deposition (TD). At laser intensities near the ablation<br />

threshold we observe a bcc-like Fe phase between 2 and 5 ML film<br />

thickness on Cu(100), similar to our previous results on TD-films, where<br />

this structure can be correlated to the interesting magnetic properties<br />

of these films. Regarding Fe films grown on the Cu(111) surface using a<br />

laser wavelength of 532 nm, we observe a transition of the growth mode<br />

by increasing the laser fluence per pulse. The bilayer growth mode, which<br />

we find on TD-films, changes to layer-by-layer growth.<br />

O 39.9 Do 17:45 H39<br />

Growth and structure of pulsed laser deposited Pd films on<br />

Cu(100) — •Y. Lu, H.L. Meyerheim, W. Wang, J. Barthel,<br />

M. Przybylski, and J. Kirschner — MPI für Mikrostrukturphysik,<br />

Weinberg 2, 06120 Halle<br />

Pd films in the coverage regime between 0.2 to 8 monolayers<br />

(ML, 1ML=1.53×10 15 atoms/cm 2 ) were grown at room temperature on<br />

Cu(001) using pulsed laser deposition (PLD) and studied by scanning<br />

tunneling microscopy (STM), low energy electron diffraction (LEED) and<br />

Auger-electron spectroscopy (AES). Up to a Pd coverage of θ = 4 ML a<br />

well defined layer-by-layer growth mode is observed, at higher coverage<br />

the strain due to the large mismatch (7.6 %) relaxes by formation of<br />

a two-dimensional ordered array of dislocations running parallel to the<br />

〈100〉 directions of the Cu-substrate. In the coverage regime below 4ML,<br />

LEED images do not indicate the formation of any ordered superstructure<br />

such as the c(2x2), which was previously observed at 0.5 ML for<br />

thermally deposited Pd [1]. The two-dimensional misfit dislocation network<br />

formed at θ > 4ML gives rise to the appearance of diffuse lines of<br />

satellite reflections between the (1x1) substrate reflections. For deposition<br />

at 500 K, Pd-growth proceeds by the step flow mode and a better<br />

ordering of the dislocation network is observed. [1] P.W. Murray et al.,<br />

PRB 52, R14404 (1995)<br />

O 39.10 Do 18:00 H39<br />

Self-healing of stacking faults in homoepitaxial growth on<br />

Ir(111) — Carsten Busse 1,2 , •Arne Thoma 1 , and Thomas<br />

Michely 1 — 1 I. Physikalisches Institut der RWTH Aachen, 52056<br />

Aachen, Germany — 2 Present address: Institute of Physics and<br />

Astronomy, University of Aarhus, 8000 Aarhus C, Denmark<br />

The growth of a thin film is studied from the nucleation phase to the<br />

closure of the first monolayer in the face-centered cubic (fcc) system<br />

Ir/Ir(111) using temperature-variable scanning tunneling microscopy.<br />

The island that nucleate in the hexagonal close-packed (hcp) stacking<br />

cannot coalesce with regular islands. Instead, an assimilation process is<br />

observed, where material is transported from the metastable hcp to the<br />

energetically favourable fcc sites. The atomic mechanisms governing this<br />

transfer are identified. Furthermore, the influence of adsorbates on nucleation<br />

of stacking-faults is investigated by exposing the surface to different<br />

gases prior to evaporation.<br />

Zeit: Donnerstag 15:45–18:45 Raum: H45<br />

O 40.1 Do 15:45 H45<br />

Optische Charakterisierung ultradünner Siliziumoxid-Filme mit<br />

der Brewster-Winkel Analyse (BWA) — •Michael Lublow<br />

und H. J. Lewerenz — Hahn-Meitner-Institut Berlin Abteilung Solare<br />

Energetik (SE5) Glienicker Str. 100 14109 Berlin<br />

Die optische Charakterisierung ultradünner Filme mit Schichtdicken<br />

d < 8 nm wird durch den Einfluß rauher Grenzflächen erschwert: die<br />

ermittelten Werte weichen von denen anderer oberflächensensitiver Me-<br />

thoden wie Auger Elektronenspektroskopie oder Photoelektronenspektroskopie<br />

ab. Für das natürliche Oxid auf Si(111) wird die Oberflächeninformation<br />

mittels dynamischer Anpassung des Einfallswinkels<br />

durch eine symmetrische Messung des Reflektivitätssignals um den<br />

Brewster-Winkel des SiOx/Si-Systems herum erfaßt. Charakteristische<br />

Unterschiede gegenüber phasenoptimierter Ellipsometrie werden für naßchemische<br />

Ätzungen des Oxids untersucht. Es wird gezeigt, daß die BWA<br />

die einzelnen Stufen der Oxidabtragung sowie die anschließende Rauhig-

Hooray! Your file is uploaded and ready to be published.

Saved successfully!

Ooh no, something went wrong!