Plenarvorträge - DPG-Tagungen
Plenarvorträge - DPG-Tagungen
Plenarvorträge - DPG-Tagungen
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Symposium Organic and Hybrid Systems for Future Electronics Donnerstag<br />
devices. Our work will present dielectric spectra of organic heterojunctions<br />
formed by di-(pyridyl)-perylenetetracarboxylic diimide (Py-PTC)<br />
and copper phthalocyanine (CuPc). This organic junction exhibits a photovoltaic<br />
effect with effective photogeneration of charge carriers occuring<br />
near the Py-PTC/CuPc interface. The main processes determining<br />
the heterojunction performance will be discussed. Acknowledgement: The<br />
work was supported by Marie-Curie Host Fellowships: Project MODERN<br />
No.HPMD-CT-2001-00083 and by KBN: Project No.4T11B 057 22.<br />
SYOH 5.54 Do 18:00 B<br />
An impedance spectroscopy study of Ag/PTCDA/n-GaAs(100)<br />
heterostructures — •A. Bekkali, I. Thurzo, T. U. Kampen und<br />
D. R. T. Zahn — Insitut für Physik, TU Chemnitz, D-09107 Chemnitz<br />
In this work impedance spectroscopy (IS) was applied to investigate<br />
Ag/PTCDA/n-GaAs(100) heterostructures. Describing the samples<br />
using an equivalent circuit consisting of resistors and capacitors, the potential<br />
drop across each relevant area of the sample, that is, the GaAs and<br />
PTCDA bulk as well as the Ag/PTCDA and PTCDA/GaAs interface,<br />
can be determined. The IS characteristics can be simulated by modeling<br />
the Ag/PTCDA interface using a parallel RoCo circuit connected in series<br />
with a bulk resistance Rb for the PTCDA layer. All the elements are<br />
found to be nonlinear with respect to the applied bias and frequency independent.<br />
The depletion layer in GaAs is correctly characterized by its<br />
parallel resistance Rd and capacitance Cd. The most important feature<br />
of the Ag/PTCDA interface is the capacitance Co, which consists of a<br />
geometric capacitance and an excess capacitance δC, the latter originating<br />
from recharging a Gaussian density of states (DOS). This Gaussian<br />
DOS is attributed to surface states Nss(E), their respective capacitance<br />
δCss(E) = q 2 Nss(E) peaking for an applied bias of 0.2 V. This value<br />
agrees with the thermal activation energy for carrier transport in the<br />
PTCDA layer.<br />
SYOH 5.55 Do 18:00 B<br />
Characterization of polymeric metal-insulator-semiconductor<br />
diodes — •Silviu Grecu, Markus Bronner, Andreas Opitz, and<br />
Wolfgang Brütting — Experimentalphysik IV, Universität Augsburg,<br />
86135 Augsburg, Germany<br />
Metal-insulator-semiconductor (MIS) diodes are the two-terminal pendants<br />
of thin film transistors sharing the same basic layer structure. However,<br />
instead of the current-voltage characteristics one has to study the<br />
capacitance-frequency and capacitance-voltage behavior, which can give<br />
information about mobile charges and trapping processes in these devices.<br />
We have investigated MIS structures based on poly(alkyl-thiophene) as<br />
semiconductor which were fabricated on glass substrates with polymeric<br />
insulator layers and compared their response to devices fabricated on<br />
Si/SiO2 substrates. From capacitance-voltage measurements the acceptor<br />
dopant concentration is determined for different preparation conditions.<br />
Typically these measurements show hysteresis between forward and reverse<br />
bias sweeps. We have investigated this behavior as a function of<br />
external parameters like sweep speed and temperature and discuss their<br />
possible origin. The analysis of the frequency response using appropriate<br />
equivalent circuits allows the extraction of material parameters, like<br />
conductivity and charge carrier mobility, which are compared to data<br />
obtained on thin film transistor structures.<br />
SYOH 5.56 Do 18:00 B<br />
Charge injection into thin fullerene films — •Elizabeth von<br />
Hauff, Vladimir Dyakonov, Jürgen Parisi, and Zivayi Chiguvare<br />
— Energy and Semiconductor Research Laboratory, Institute of<br />
Physics, University of Oldenburg, D-26129, Oldenburg, Germany<br />
In this study, charge injection currents into thin film fullerene diodes<br />
composed of a thin film of PCBM sandwiched between a metal and an<br />
ITO (indium tin oxide) electrode. Decreasing the thickness of the semiconductor<br />
layer in the diodes results in a transition from bulk limited to<br />
injection limited currents. From the injection limited currents through the<br />
thin film fullerene diodes, parameters describing the energy barrier between<br />
metal and semiconductor, the transport level within the bulk, and<br />
the activation energy could be calculated according to an already existing<br />
hopping model. The model describes charge carriers being injected from<br />
the metal into energy sites in the semiconductor medium distributed in a<br />
Gaussian density of states. The barrier height experienced by the charge<br />
carriers described by the above model was compared to a value calculated<br />
earlier from the Fowler-Nordheim model for quantum mechanical<br />
tunneling. In an attempt to shed more light on the metal/semiconductor<br />
interface, the fullerene diodes were futher investigated via capacitance-<br />
voltage measurements.<br />
SYOH 5.57 Do 18:00 B<br />
Quantum transport through carbon-based nanojunctions —<br />
•Miriam del Valle 1,2 , Carlos Tejedor 1 , and Gianaurelio Cuniberti<br />
2 — 1 Dpto. Física Teórica de la Materia Condensada, UAM,<br />
Spain — 2 Institut für Theoretische Physik, Universität Regensburg<br />
We present a quantum transport study of two- and three-terminal carbon<br />
nanotube (CNT) based junctions. We concentrate our analysis on<br />
functionalized and recapped zig-zag CNTs exhibiting peculiar surface<br />
electronic states localized at the zig-zag cut and at the cap defect atoms<br />
respectively. We calculate the linear conductance by means of the Green<br />
function technique, within a π-orbital description of the carbon network,<br />
and show the interplay between these peculiar localized states and the<br />
open transport channels through the device. In correspondence of the<br />
energies of the localized states, the conductance behavior shows a Fanolike<br />
resonance. Possible experimental conditions and setup in which such<br />
effect could be detected are also discussed.<br />
SYOH 5.58 Do 18:00 B<br />
Electron Transport in Carbon Nanotube-Metal Systems: Contact<br />
Effects — •Rafael Gutierrez 1 , Nitesh Ranjan 2 , Stefan<br />
Krompiewski 3 , and Gianaurelio Cuniberti 1 — 1 Institute for Theoretical<br />
Physics, University of Regensburg, D-93040 Regensburg, Germany<br />
— 2 Institute for Physical-Chemistry and Electrochemistry,Technical University<br />
Dresden, 01062 Dresden, Germany — 3 Institute of Molecular<br />
Physics, Polish Academy of Sciences,PL-60179 Poznan, Poland<br />
Carbon nanotubes (CNT) posses a very large application potential in<br />
the rapid developing field of molecular electronics. Infinite single-wall<br />
metallic CNTs have theoretically a conductance of 2×G0, (G0 = 2e2)<br />
be- h<br />
cause of the two electronic bands crossing the Fermi level. For finite size<br />
CNTs experiments have shown that other values are also possible, indicating<br />
a very strong influence of the contacts. We study electron transport<br />
in single- and double-wall CNTs contacted to metallic electrodes with a<br />
fcc(111) surface within the Landauer transport formalism combined with<br />
Green function techniques. The electronic structure of the CNTs is described<br />
with a simple π-orbital model.We show that the symmetry of the<br />
contact region may lead in some cases to blocking of one of the transport<br />
channels reducing the conductance to 1×G0 for single-wall CNTs. In the<br />
case of double-wall systems with both inner and outer shells being metallic,<br />
non-diagonal selfenergy contributions from the electrodes may induce<br />
mixing of the CNT’s channels, again reducing the conductance from the<br />
theoretically expected value (4×G0). Finally, we discuss the influence of<br />
inter-wall interactions on the conductance.<br />
SYOH 5.59 Do 18:00 B<br />
Nonequilibrium-Transport through Metallic Point Contacts<br />
and Single-Molecule Junctions — •Fabian Pauly 1 , J. Heurich 1 ,<br />
J.C. Cuevas 1 , W. Wenzel 2 , and Gerd Schön 1,2 — 1 Institut für<br />
Theoretische Festkörperphysik, Universität Karlsruhe, 76128 Karlsruhe,<br />
Germany — 2 Institut für Nanotechnologie, Forschungszentrum<br />
Karlsruhe, 76021 Karlsruhe, Germany<br />
The future of molecular electronics depends crucially on our understanding<br />
of the transport mechanism in single-molecule junctions. From<br />
the theoretical point of view an important problem, not yet fully solved,<br />
is the way of dealing with the high voltage applied in the experiments.<br />
Building upon traditional quantum-chemistry density functional calculations,<br />
we extend our method [1,2] to compute ab initio current-voltage<br />
characteristics of molecular devices. We show our first results on the<br />
bias-dependent conductance of metallic point contacts, illustrating the<br />
predictive power of the developed method.<br />
[1] J. Heurich, J.C. Cuevas, W. Wenzel, G. Schön, Phys. Rev. Lett. 88,<br />
256803 (2002)<br />
[2] J.C. Cuevas, J. Heurich, F. Pauly, W. Wenzel, G. Schön, Nanotechnology<br />
14 (2003)<br />
SYOH 5.60 Do 18:00 B<br />
Transport properties of [2,2]-paracyclophane thin films<br />
— •Bruno Gompf 1 , Wenping Hu 1 , Martin Dressel 1 , Jens<br />
Pflaum 2 , and Dieter Schweitzer 2 — 1 1. Physikalisches Institut,<br />
Universität Stuttgart — 2 3. Physikalisches Institut, Universität<br />
Stuttgart<br />
The transport properties of [2,2]-paracyclophane thin films prepared by<br />
molecular beam epitaxy were studied by space charged limited current<br />
measurements. This organic semiconductor, which has a three dimen-