09.12.2012 Views

Plenarvorträge - DPG-Tagungen

Plenarvorträge - DPG-Tagungen

Plenarvorträge - DPG-Tagungen

SHOW MORE
SHOW LESS

You also want an ePaper? Increase the reach of your titles

YUMPU automatically turns print PDFs into web optimized ePapers that Google loves.

Symposium Organic and Hybrid Systems for Future Electronics Donnerstag<br />

plane components of the dielectric function the average tilt angle of the<br />

F16PcVO molecular planes with respect to the substrate plane was found<br />

to be 56 0 for fused silica substrates and between 0 0 and 3 0 for KBr substrates.<br />

SYOH 5.29 Do 18:00 B<br />

Strongly Enhanced Thermal Stability of Organic Semiconductor<br />

Thin Films Induced by Aluminum Oxide Capping Layers<br />

— •S. Sellner 1,2 , A. Gerlach 3 , F. Schreiber 3 , M. Kelsch 1 , N.<br />

Kasper 1 , H. Dosch 1,2 , S. Meyer 4 , J. Pflaum 4 , M. Fischer 5 , and B.<br />

Gompf 5 — 1 MPI für Metallforschung, Stuttgart, Germany — 2 Institut<br />

für Theoretische und Angewandte Physik, Universität Stuttgart, Germany<br />

— 3 Physical Chemistry Laboratory, Oxford University, UK — 4 III.<br />

Physikalisches Institut, Universität Stuttgart, Germany — 5 I. Physikalisches<br />

Institut, Universität Stuttgart, Germany<br />

We show that the thermal stability of thin films of the organic semiconductor<br />

diindenoperylene (DIP) can be substantially increased by an<br />

aluminium oxide capping layer (50 nm). The DIP films do not only stay<br />

on the substrate (oxidized silicon), but even remain crystalline on a time<br />

scale of ≥ 1 hour more than 250 K above the desorption temperature<br />

for uncapped films. The results of in-situ X-ray diffraction are supported<br />

by thermal desorption spectroscopy. We argue that this very effective<br />

enhancement of the thermal stability compared to uncapped and also<br />

metal-capped organic layers is related to the low mobility of aluminum<br />

oxide and the relatively well-defined as-grown interfaces with limited interdiffusion.<br />

We discuss possible mechanisms for the eventual breakdown<br />

at high temperatures.<br />

SYOH 5.30 Do 18:00 B<br />

Direct and inverse photoemission spectroscopy on organic<br />

semiconductors in the pristine and reduced state — •Torsten<br />

Schwieger 1 , Martin Knupfer 1 , Weiying Gao 2 , and Antoine<br />

Kahn 2 — 1 Leibniz Institute for Solid State and Materials Research<br />

Dresden, D-01069 Dresden, Germany — 2 Department of Electrical<br />

Engineering, Princeton University, Princeton, NJ 08544, USA<br />

Phthalocyanines and α-NPD are organic semiconductors which are<br />

commonly used in organic electronic devices like transistors and diodes.<br />

We intercalated the organic semiconducting film with potassium in order<br />

to investigate the impact of negative charge to the electronic structure<br />

of the organic system. A combined direct and inverse photoemission<br />

spectroscopy study of the occupied and unoccupied states of the organic<br />

semiconductors ZnPc and α-NPD in the pristine and K-intercalated state<br />

is presented. A combination of PES and IPES allows the determination<br />

of the transport gap in organic materials both in the undoped and doped<br />

state. The observed splitting of the lowest unoccupied molecular orbitals<br />

upon potassium intercalation leads to an evaluation of the size of correlation<br />

effects in both molecular systems. These effects are discussed in<br />

detail.<br />

As expected, the Fermi level is found to shift towards the vacuum level<br />

upon intercalation. However, the results clearly demonstrate that the<br />

Fermi level in potassium intercalated organic semiconductors cannot a<br />

priori be assumed to be pinned at the onset of the lowest unoccupied<br />

molecular orbital in all cases.<br />

SYOH 5.31 Do 18:00 B<br />

Band gap engineering of insulating films due to defects and adsorption<br />

of organic molecules — •C. Tegenkamp and H. Pfnür —<br />

Institut Für Festkörperphysik, Appelstr.2 D-30167 Hannover,Germany<br />

For possible applications of organic molecules in electronic circuits,<br />

the functionality of a chemically designed molecule can be significantly<br />

changed due to fundamental interactions of the molecule with a surface<br />

after adsorption. Generally, the strength of the chemical bond should depend<br />

on serveral parameters like substrate, orientation of the surface and<br />

defects.<br />

As an example of functional organic molecules, we will present results<br />

about the problem of contact charging between insulators. Therefore, we<br />

have studied the adsorption of OH-substituted benzoic acids on insulating<br />

films like NaCl(100) and KCl(100) in the multilayer, monolayer<br />

and submonolayer regime using photoelectron- and electron energy loss<br />

spectroscopy. The experiments were performed on both defect–free surfaces<br />

and on surfaces decorated with anion vancancies. In accordance<br />

with DFT claculations, there are specific molecular orbitals which are<br />

in resonance with the valence band structure of the alkali halides. Interestingly,<br />

defects like anion vancancies only strengthen the bond by<br />

polarization effects. A reactivity of these centers in form of a dissoci-<br />

ation of the molecules as for water has not been found. Although the<br />

molecules are chemisorbed in presence of defects, this is not reflected in<br />

energetic shifts of molecular orbitals of the functional acid- and phenoli<br />

OH–groups, which are most important for our model of contact charging.<br />

Our experimental results are supported by simple DFT calculations.<br />

SYOH 5.32 Do 18:00 B<br />

Electronic properties of organic/organic semiconductor interfaces<br />

CuPC/C60 — •Olga Molodtsova, Torsten Schwieger,<br />

and Martin Knupfer — Leibniz Institute for Solid State and Materials<br />

Research Dresden, D-01069 Dresden, Germany<br />

Phthalocyanines and C60 are typical organic materials which are often<br />

used in organic electronic devices such as diodes, transistors or solar<br />

cells. Especially the electronic structure of their interface in solar cells is<br />

of great interest for the functionality of these devices.<br />

In this contribution we present a study of the interface properties of the<br />

molecular organic semiconductor copper Phthalocyanine (CuPc) on C60<br />

using photoemission (PES) and near-edge X-ray absorption spectroscopy<br />

(NEXAFS). As well we present a study of C60/CuPc-interfaces with different<br />

orientation of the molecules (standing on polycrystalline gold and<br />

lying on gold single crystals). We discuss important electronic parameters<br />

like electron and hole injection barriers and chemical interactions at this<br />

organic/organic interface. Further we will adress the electronic properties<br />

of mixed C60/CuPc-films.<br />

SYOH 5.33 Do 18:00 B<br />

Photo Electron Spectroscopy of Silicon-Organic Pigment Interfaces<br />

— •Ulrich Weiler 1 , Thomas Mayer 1 , Ralf Hunger 1 ,<br />

Wolfram Jaegermann 1 , Christian Kelting 2 , and Derck<br />

Schlettwein 2 — 1 Technische Universität Darmstadt, FB Materialund<br />

Geowissenschaften, FG Oberflächenforschung — 2 Universität<br />

Oldengurg, Physikalische Chemie 1<br />

One of the prerequisites to obtain a photovoltaically active composite<br />

material uniting high light absorption of an organic dye with good charge<br />

separation and transport properties of Si is the specific alignment of the<br />

dye frontier orbitals versus the Si bands: in order to inject both, the<br />

photo excited electrons from the dye LUMO into the Si conduction band<br />

and the holes from the dye HOMO into the Si valence band, the LUMO<br />

should energetically be situated just above the CB and the HOMO just<br />

below the VB. According to the Anderson model, ZnPc should match<br />

perfectly this requirement. As model systems for the composite, the interface<br />

properties of ZnPc and related organics adsorbed on different Si<br />

surfaces have been characterized with photoelectron spectroscopy. Experimental<br />

results of ZnPc on H-terminated Si are in good agreement<br />

to the Anderson model implying that no additional dipoles are formed<br />

at the interface. In addition, the experimental set-up of our deposition<br />

system for silicon organic compounds will be explained on our poster. In<br />

order to conserve the organic dyes during growth of the compound, Si<br />

will be deposited from a remote hot wire source by CVD and the dyes<br />

will be co-sublimated from a second source.<br />

SYOH 5.34 Do 18:00 B<br />

Energy level alignment at organic interfaces: Interface induced<br />

gap states and charge neutrality levels — •Thorsten U. Kampen<br />

and Dietrich R. T. Zahn — Institut für Physik, TU Chemnitz,<br />

D-09107 Chemnitz<br />

The energy level alignment at organic interfaces determines the efficiency<br />

of charge injection into organic films. Quite often the vacuum<br />

level alignment rule has been used to determine the energy level alignment<br />

at organic interfaces. Here, barrier heights can simply be calculated<br />

using the ionisation potentials or electron affinities of semiconductors materials<br />

and work functions of metals. For organic interfaces a conclusion<br />

has been reached that in general the vacuum levels do not align. At intimate,<br />

abrupt, and defect free interfaces of inorganic semiconductors<br />

interface induced gap states are the primary mechanism determining the<br />

energy level alignment. These interface states derive from the bulk states<br />

and their character changes across the band gap from more acceptorlike<br />

closer to the conduction band to predominantly donor-like nearer<br />

to the valence band. The branch point where the character changes has<br />

the significance of a charge neutrality level. This work shows that the<br />

concept of interface induced gap states may also be applied to organic<br />

interfaces. The charge neutrality levels of PTCDA, DiMe-PTCDI, and<br />

CuPc are found to be 1.96 eV, 1.93 eV and 0.51 eV above the HOMO,<br />

respectively.

Hooray! Your file is uploaded and ready to be published.

Saved successfully!

Ooh no, something went wrong!