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Plenarvorträge - DPG-Tagungen

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Symposium Organic and Hybrid Systems for Future Electronics Donnerstag<br />

sional π-system comparable to that of C60 is an interesting new material<br />

for molecular electronics applications due to its remarkably high mobility<br />

and its insensitivity against photo-oxidation. The I-V characteristics<br />

were recorded using a coplanar electrode geometry. This geometry has<br />

the advantage, that after deposition no further processing of the organic<br />

semiconducting layer is necessary. In polycrystalline films hole mobilities<br />

up to 10 −2 cm 2 V −1 s −1 were observed at room temperature.<br />

SYOH 5.61 Do 18:00 B<br />

Single crystalline organic field effect transistors — M. Fischer<br />

1 , •J. Niemax 2 , B. Gompf 1 , M. Dressel 1 , and J. Pflaum 2<br />

— 1 1.Physikalisches Institut, Universität Stuttgart — 2 3.Physikalisches<br />

Institut, Universität Stuttgart<br />

Organic field effect transistors are receiving increased attention during<br />

the last few years due to their potential application in low cost electronics.<br />

It has been proven that grain boundaries significantly influence<br />

charge transport in these devices. In order to evaluate the maximum<br />

performance that can be achieved for a certain type of organic molecule,<br />

it is thus necessary to investigate the charge carrier transport in single<br />

crystalline devices.<br />

We have studied the field effect in organic single crystals. The crystals<br />

were grown by a sublimation technique in a stream of vapor. We have<br />

investigated the influence of different organic materials (Tetracene, Anthracene),<br />

different gate insulators (Mylar, PPX) and different electrode<br />

materials (silver paste, colloidal graphite) on the field effect.<br />

SYOH 5.62 Do 18:00 B<br />

Downscaling of thiophene based organic field-effect transistors<br />

to the nanometer regime — •M. Leufgen 1 , U. Bass 1 , T.<br />

Borzenko 1 , G. Schmidt 1 , J. Geurts 1 , T. Muck 2 , and V. Wagner 2<br />

— 1 Physikalisches Institut der Universität Würzburg, EP III, Am Hubland,<br />

D-97074 Würzburg — 2 International University Bremen, School of<br />

Engineering and Science, Campus Ring 8, D-28759 Bremen<br />

For future electronics high-performing organic field-effect transistors<br />

(OFETs) are required. Downscaling to channel lengths L in the nanometer<br />

regime means higher accessible frequency, integration and current of<br />

transistors. To vary L from 2 µm down to 50 nm, we use an assembly<br />

of n-type silicon wafer as common gate with thermally grown oxide<br />

as insulator layer and Au/Ti source and drain interdigitated electrodes,<br />

defined by electron beam lithography. In order to keep good characteristics<br />

downscaling the channel requires a thinner insulator layer because<br />

of the ratio of horizontal and transversal electrical field in the device.<br />

The thickness of the SiO2 investigated ranges from 200 nm down to 30<br />

nm. The active material is the soluble hexyl substituted quaterthiophene<br />

(DH4T). For the 30 nm oxide layers our results show high mobility of<br />

about 2 × 10 −2 cm 2 /Vs for a 200 nm channel DH4T-device with ratio<br />

W/L of 800. Moreover, the linear and saturation regime are proven and<br />

on/off-ratios for devices with L down to 200nm are as high as 10 5 . Below<br />

200nm field-effect is still observed, but the transistor performance<br />

decreases.<br />

SYOH 5.63 Do 18:00 B<br />

Organic phototransistors based on intramolecular charge transfer<br />

— •Tobat Saragi, Robert Pudzich, Thomas Fuhrmann, and<br />

Josef Salbeck — Makromolekulare Chemie und Molekulare Materialien,<br />

Fachbereich Naturwissenschaften und Center for Interdisciplinary<br />

Nanostructure Science and Technology, Universität Kassel<br />

The conductivity of organic field effect transistors is based on the<br />

generation of radical ions as additional charge carriers by the field effect.<br />

Similarly, charge carriers can be produced by intramolecular charge<br />

transfer reactions in an organic photoconductor. Using an asymmetric<br />

spiro compound, 2,7-bis-(N,N’-diphenylamino)-2’,7’-bis(biphenyl-4- yl)-<br />

9,9’-spirobifluorene (Spiro-DPSP), which consists of a hole transport moiety<br />

in one molecular half and an electron-accepting chromophore in the<br />

other, we demonstrate an one-component organic phototransistor. The<br />

sensitivity of the photosensing device is better than 1 A/W for UV light.<br />

SYOH 5.64 Do 18:00 B<br />

Influence of contact metal on the serial resistance in organic<br />

field effect transistors — •U. Bass 1 , M. Leufgen 1 , T. Muck 2 , J.<br />

Geurts 1 , and V. Wagner 2 — 1 Physikalisches Institut der Universität<br />

Würzburg, EP III, Am Hubland, D-97074 Würzburg — 2 International<br />

University Bremen, School of Engineering and Science, Campus Ring 8,<br />

D-28759 Bremen<br />

The performance of organic field effect transistors (OFETs) depends<br />

essentially on the channel resistance of the organic material and the resistance<br />

between the organic material and the metal contacts. With improving<br />

film morphology and reducing channel lengths the relative influence<br />

of the contact resistance increases and becomes the dominating factor<br />

of the OFETs performance. We present a systematic study of various<br />

noble metals as source and drain contact materials for OFETs, based on<br />

DH4T. We applied gold and platinum, which both required a titanium<br />

adhesion layer, and palladium, which we could deposit directly on the<br />

SiO2 substrate. The smallest contact resistance was obtained when using<br />

Pd. However, these contacts turned out to be rather vulnerable during<br />

the chemical processing prior to the deposition of the organic active layer.<br />

From the contacts with Ti adhesion layers, the Au results were superior<br />

to those of Pt. For a more detailed study of the Au/Ti system, we varied<br />

the Ti adhesion layer thickness from 10 nm down to 1 nm, yielding an<br />

increasing performance with decreasing Ti thickness. Finally, a reduction<br />

of the channel resistance of the DH4T film was achieved by employing a<br />

pretreatment of the SiO2 substrate with octadecyltrichlorosilane (OTS)<br />

instead of hexamethyldisilane (HMDS).<br />

SYOH 5.65 Do 18:00 B<br />

In situ electrical characterization of DH4T transistors — •T.<br />

Muck 1 , V. Wagner 1 , M. Leufgen 2 , J. Geurts 2 , E. Bentes 3 , and<br />

H. L. Gomes 3 — 1 International University Bremen, School of Engineering<br />

and Science, Campus Ring 8, D-28759 Bremen — 2 Experimentelle<br />

Physik II, Universität Würzburg, Am Hubland, D-97074 Würzburg —<br />

3 University of the Algarve, Campus de Gambelas, FCT, 8000, Portugal<br />

The performance of organic field effect transistors (OFETs) was<br />

improved over the last years enormously, e.g., dihexyl-quaterthiohene<br />

(DH4T) has proven high mobility values and is compatible with cheap<br />

solution processing, which is of high interest due to low cost production.<br />

The transport properties of OFETs are influenced by different parameters,<br />

e.g., temperature, film morphology, and the ambient atmosphere.<br />

For a systematic analysis we performed in situ electrical measurements on<br />

DH4T thin film transistors during the deposition of the active layer onto<br />

prepatterned templates by organic molecular beam deposition (OMBD).<br />

Here we get information about the charge transport in the first monolayers<br />

and the dependence of the mobility values on film thickness. Results<br />

for different substrate temperatures will be discussed, including the phase<br />

transition of the active layer at elevated temperatures.<br />

Applying a gate voltage leads to filling of traps (bias stress). This effect is<br />

influenced by the ambient atmosphere. Performing these measurements<br />

in situ as well as in air enables us to systematically analyze these stress<br />

effects.<br />

SYOH 5.66 Do 18:00 B<br />

Transparent organic field effect transistors based on rf magnetron<br />

sputtered alumina films — •Michael Voigt and Moritz<br />

Sokolowski — Institut für Physikalische und Theoretische Chemie,<br />

Universität Bonn, Wegelerstrasse 12, 53115 Bonn<br />

Organic field effect transistors (OFETs) were fabricated by evaporation<br />

of pentacene (Pc) onto alumina insulator films (d = 160–320 nm).<br />

The alumina films were prepared on ITO covered glass (gate–electrode)<br />

by rf magnetron sputtering and show under optimized sputter conditions<br />

breakdown fields of 1.2 MV/cm and a dielectric constant of ∼7. AFM<br />

investigations reveal that their surface is rather rough (rms = 3.6 nm).<br />

Source and drain contacts (Au; d = 50 nm) were prepared by shadow<br />

mask technique either on top of the Pc films or on top of the alumina.<br />

The channel length L was 50 µm. In the first case, a charge mobility of<br />

0.01 cm 2 /Vs was observed, a value of the same order as we obtained for<br />

comparable OFETs on SiO2. In the second case, no field effect mobility<br />

was observed, which we relate to a detrimental influence of Au clusters on<br />

the alumina surface on the Pc film formation. Since the OFET–channel<br />

is transparent, we can control growth of the Pc films by polarization microscopy.<br />

Supported through the DFG-priority program ”Organic field<br />

effect transistors”.<br />

SYOH 5.67 Do 18:00 B<br />

Field Effect Transistor and Space Charge Limited Current Measurements<br />

on Tetracene and Perylene Single Crystals — •G.<br />

Ulbricht 1 , J. H. Smet 1 , J. Niemax 2 , Ch. Herb 2 , and K. von Klitzing<br />

1 — 1 MPI-FKF, Stuttgart — 2 3. Phys. Inst. Uni Stuttgart<br />

The study of charge carrier transport in organic single crystals is an<br />

experimental challenge. Among other things, the intrinsic carrier concentration<br />

is very low and doping quite difficult. Increasing the amount of

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