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I__. - International Military Testing Association

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EKie<br />

;;<br />

;:<br />

;:<br />

v7<br />

V8<br />

VQ<br />

VlO<br />

Vll<br />

v12<br />

v13<br />

v14<br />

v15<br />

V16<br />

v17<br />

V18<br />

v19<br />

V2CJ<br />

v21<br />

Contents of Variable<br />

Subject’s Social Security Number<br />

Equipment (hardware subsystem) number<br />

(1 = USH26)<br />

Episode number (1)<br />

Found Solution (1 = Yes, 0 = No)<br />

Number of Test Points<br />

Number of Out-of-Bounds tests<br />

Number of Valid Checks<br />

Number of Invalid Checks<br />

Number of Redundant Checks<br />

Number of Proof Points subject tested<br />

Total number of Proof Points in the episode<br />

% proof pts tested: o/l0 % Vl l)*lOO, rounded<br />

to a whole number<br />

Total Time spent on the episode (in minutes)<br />

To Be Determined<br />

Number of Equipment Selection events<br />

Number of Front Panel events<br />

Number of Maintenance Panel events<br />

Number of Fallback test events<br />

Number of Reference Designator test events<br />

Number of Replace LRU events<br />

Number of Review Symptoms events<br />

APPENDIX A<br />

TAE DATA and ANALYSIS RESULTS<br />

TABLE A-l. Variables for TAE Episode 1<br />

TABLE A-2. Experience<br />

Variable<br />

Name<br />

Contents of Variable<br />

To be determined<br />

E Number of Diagnostic Test events<br />

V24 Number of Load Operational Program events<br />

v25 Number of Step Procedure events<br />

V26 Number of Revision events (instructor intervention)<br />

V27 Number of INCORRECT Replace LRU events<br />

V28 Number of GOOD FAULT Replace LRU events<br />

Time to first Reference Designator Test (in minutes)<br />

E Time to first Diagnostic Test (in minutes)<br />

v31 Sum of all steps of episode: ALL events, except Inst.<br />

actions.<br />

V32 Number of Waveform tests performed<br />

V33 Number of Voltage tests performed<br />

V34 Number of Read Meter tests performed<br />

V35 Number of Logic tests performed<br />

V36 Number of Current tests performed<br />

v37 Number of Frequency tests performed<br />

V38 Number of Continuity tests performed<br />

v39 Number of Adjustment tests performed<br />

V40 Final Score of the episode<br />

v41 To be determined - for possible future expansion<br />

V42 To be determined -for possible future expansion<br />

v43 To be determined -for possible future expansion<br />

HI TAE Student TAE Test Score & instructor TAE Test Score<br />

Group Mean N Variable l:TAESCORE<br />

1 70.396 48 Source Sum of Sqs D.F. Mean Sq FRatio Prob.<br />

G&d 70.980 73.422 59 11 Within Between 2057.124 81.073 57 1 81.973 36.090 2.271 .1373<br />

Mean Total 2139.098 58<br />

Correlational Hypothesis Statement N Correlation Critical Value<br />

H3 TAE Score vs TIS 59 .13676 .21638<br />

Correlational Hypothesis Statement<br />

H3 TAE vs School Final<br />

TAE vs School Camp<br />

TABLE A-3. Electronic Knowledge<br />

H4 Avg. TAE Subsystem 48<br />

1 vs. School Subsys 1 .27704’<br />

2vs.” “2 .17579<br />

3v.s” “3 - .18146<br />

4vs.” “4 - .21972<br />

H5 TAE vs ASVABS 48<br />

AFQT - .00398<br />

AR - .32510’<br />

El - 96673<br />

ASVABl - .02672<br />

ASVABT - .13055<br />

ii<br />

N<br />

Correlation Critical Value<br />

.30181* .24045<br />

.17311 .244X5<br />

TABLE A-4. Electronic Performance Proficiency.<br />

.24045<br />

.24045<br />

.24045<br />

a24045<br />

.24045<br />

.24045<br />

.24045<br />

.24045<br />

.24045<br />

Correlational Hypothesis Statement N<br />

Correlation Critical Value -<br />

H6 TAE vs Invalid Checks 59<br />

- .17107 .21638<br />

H7 TAE vs Illogical Approaches<br />

59 - 34057” .21638<br />

H8 TAE vs Incorrect Solutions<br />

59 - .69676”* .21638<br />

H9 TAE vs Redundant Checks<br />

59 - 98543 .21638<br />

HlO TAE vs Proof Points<br />

59 .56997*** .21638<br />

Hl 1 TAE vs X of Tests<br />

59 - .55201*** .21638 - - -<br />

378<br />

-<br />

_<br />

,

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