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ITT - Index of

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GENERAL INFORMATION <strong>ITT</strong>54/74 SERIES TTL FAMILY<br />

7. Similarly extemal inputs should be brought on<br />

to the printed circuit con~ections at right angles<br />

to the other wiring, the printed circuit itself being<br />

laid out to ensure least coupling between<br />

inputsand other ·connections.<br />

8. If system speed is high, allowance should be<br />

made when calculating power supply requirements<br />

for the' increased network supply currents<br />

due to current spiking and line driving .. An allowance<br />

at 10 MHz <strong>of</strong> 15% for spiking and up<br />

to 0.5 mA per each gate node for the line driving<br />

wi" be adequate for this.<br />

9. Decouple' every'1 0 gates or their equivalent in<br />

MSI functions with 0.01 uF to 0.1 uF capacitors<br />

<strong>of</strong> R. F. rating.<br />

In conclusion, a careful perusal <strong>of</strong> the data sheet<br />

together with the points mentioned above, will help<br />

in achieving a trouble free logic design at the first<br />

attempt.<br />

DRIVING DTllOGIC FROM TTL DEVICES<br />

When driving <strong>ITT</strong>930 series DTL from 74/5400 series<br />

TTL the full fan-out <strong>of</strong> the TTL is available<br />

. DRIVING TTl L.OGIC FROM DTl DEVICES<br />

Driving <strong>ITT</strong>7400 series TTL from <strong>ITT</strong>930 series DTL<br />

necessitates a reduction <strong>of</strong> the full fan-out from 8<br />

to 3 for standa(d'igates and from 25 to 20 for<br />

buffers. Increas~d' f~n-out can be achieved with<br />

standard DTL gates by using an additional pull-up<br />

resistor.<br />

SYMBOLS AND THEIR DEFINITIONS<br />

Fan-out<br />

ICCL<br />

Load capacitor iri switching test circuit<br />

(includes probe and jig capacitance):<br />

Number <strong>of</strong> unit loads an output car)<br />

drive.<br />

Maximum clOck frequency.<br />

Supply current for highest dissipation<br />

logic state.<br />

Supply current for lowest dissipation<br />

logic:; state.<br />

Input forward current.<br />

Input reverse. current.<br />

Output short circuit current.<br />

Output leakage current.<br />

Low state output current.<br />

'i OH<br />

ICC<br />

IIN+<br />

IIN­<br />

Pdyn<br />

RL<br />

TA<br />

th<br />

th+<br />

thtcp<br />

tp<br />

tpo<br />

tpd+<br />

t-min<br />

t sp+<br />

tsp -<br />

VCC<br />

VH<br />

V IH<br />

VIL<br />

VOL<br />

V OH<br />

VOH(M).<br />

VIN<br />

V OUT<br />

VT+<br />

VT-<br />

WIRED-OR<br />

High state output current.<br />

Supply current.<br />

Input current at VT+<br />

Input current at VT­<br />

Dynamic power dissipation.<br />

Load resistor in switching test circuit.<br />

Ambient temperature.<br />

Input hold time ..<br />

Logical '1' hold time.<br />

Logical '0' hold time.<br />

, Clock pulse width.<br />

Preset,or clear pulse width.<br />

Output pulse width.<br />

Propagation delay to logical '1' on output.<br />

Propagation delay to logical '0' on output.<br />

State <strong>of</strong> output (or input) before the<br />

active edge <strong>of</strong> the clock pulse.<br />

State <strong>of</strong> output (or input) after the active<br />

edge <strong>of</strong> the clock pulse.<br />

Minimum width trigger pulse.<br />

Logical '1' input set up time.<br />

Logical '0' input set up time.<br />

Supply voltage.<br />

Hysteresis voltage.<br />

Input high voltage to ensure VOL (or<br />

VOH)" ,<br />

Input low voltage to ensure VOH (or<br />

VOL)"<br />

Output low voltage.<br />

Output high voltage.<br />

Output brl,lakdown voltage <strong>of</strong> open<br />

collector device.<br />

Voltage at an input.<br />

Voltage at an output.<br />

Positive edge threshold voltage.<br />

Negative edge threshold voltage.<br />

The commoning <strong>of</strong> open collector outputs<br />

with a pull-up resistor to perform<br />

the AN D, function.<br />

"Output'level dependent on device logic as found<br />

from truth table.<br />

3-11

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