ITT - Index of

ITT5400, ITT7400
QUADRUPLE 2-INPUT POSITIVE NAND GATES
E LE CTR I CAL C H ARACTE R ISTI CS over recommended operating free-a ir temperature range
(unless otherwise noted)
Parameter Min Typ' Max Unit Test Conditions 2
Vin(l ) Logica I 1 input voltage 2 V
required at all input
terminals to ensure logical 0
level at output
Vin(O) Logical 0 input voltage 0.8 V
required at either input
terminal to ensure logical 1
level at output
V 1 Input Clamp Voltage -1.5 V Vcc = Min Ii = -12 mA
Vout(1) Logica I 1 outp ut voltage 2.4 3.3 V Vee = MIN, Vin = 0.8 V,
Iload = -400 uA
Vout(O) Logical 0 output voltage 0.22 0.4 V Vee = MIN, Vin = 2V,
Isink = 16 mA
lin(O) Logical 0 level input current -1.6 mA Vee = MAX, Vin = 0.4 V
(each input)
lin(l ) Logical 1 level input current 40 uA Vee = MAX, Vin = 2.4 V
(each input)
Vee = MAX, Vin = 5.5 V
1 mA
lOS Short-circuit output current 3 -20 -55 mA Vee = MAX ITT5400
-18 -55 ITT7400
lee(O) Logical 0 level supply current 12 22 mA Vee = MAX, Vin = 5 V
lee(1) Logical 1 level supply current 4 8 mA Vee = MAX, Vin = 0
SWITCHING CHARACTERISTICS. Vec = 5V, TA = 25°C, N = 10
Parameter Min Typ Max Unit Test Conditions
tpdO Propagation delay time to 7 15 ns CL = 15pF,RL = 400n
logical 0 level
tpd 1
Propagation delay time to
logical 1 level
11 22 ns CL = 15 pF, R L = 400.Q
, All typical values are at Vee = 5 V, T A = 25°e.
2 For conditions shown as M IN or MAX, use the appropriate value specified under recommended operating conditions
for the applicable device type.
3 Not more than one output should be shorted at a time.
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