ITT - Index of

ITT541 0, ITT741 0
TRIPLE 3-INPUT POSITIVE NAND GATES
E LE CTR ICA L CHARACTE R ISTI CS over recommended operating free-air temperature range
(unless otherwise noted)
Parameter Min Typ' Max Unit Test Conditions 2
Vin(l) Logical 1 input voltage 2 V
required at all input
terminals to ensure logical 0
level at,output
Vin(O) Logical'O input voltage 0.8 V
required atany input
terminal to ensure logical 1
level at output
V1 Input Clamp Voltage -1.5 V Vcc = Min Ii = -12 mA
Vout(l ) Logical 1 output voltage 2.4 3.3 V Vee = MIN. Vin= 0.8 V.
Iload = -400 uA
Vout(O) Logical 0 output voitage 0.22 0.4 V Vee = MIN. Vin = 2V.
Isink = 16 mA
lin(O) Logical 0 level input current -1.6 mA Vee = MAX. Vin = 0.4 V
(each input)
lin(1) Logical 1 level input current 40 uA Vee = MAX. Vin = 2.4 V
(each input)
1 mA
Vee = MAX. Vin = 5.5 V
lOS Short-circuit output current 3 -20 -55 rnA Vee = 5.5V ITT541 0
-18 -55 ITT741 0
lee(O) Logical 0 level supply current 9 16.5 mA Vee = MAX. Vin = 5 V
lee(1) Logical 1 level supply current 3 6 mA Vee = MAX. Vin = 0
SWITCHING CHARACTERISTics. Vee = 5V. TA = 25°C. N == 10
Parameter Min Typ Max Unit Test Conditions
tpdO Propagation delay time to 7 15 ns eL = 15pF.RL =400Q
logical 0 level
tpdl Propagation delay time to 11 22 ns eL =.15pF.RL =400Q
logical 1 level
1 All typical values are at V cc = 5 V. T A = 25° C. . ..
2 For conditions shown as MIN or MAX. use the appropriate value specified under recommended operating conditions
for the applicable device type.
3 Not more than one output should be shorted at a time.
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