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SEMICONDUCTORS<br />

SMALL' SIGNAL CHIPS AND WAFERS<br />

INTRODUCTION<br />

<strong>ITT</strong> has a wide selection <strong>of</strong> planar transistor chips<br />

and wafers available for those who require devices<br />

in this form. Since the large number <strong>of</strong> JEDEC<br />

specifications are derived from a few chip types,<br />

many differing applications can be satisfied with<br />

a relatively small quantity <strong>of</strong> basic chip families.<br />

SPECIFICATIONS<br />

The accompanying DC parameters identifying<br />

each family are tested on each chip in the wafer.<br />

These are the probe speCifications. As shipped<br />

from our factory, THE PROBE PARAMETERS ARE<br />

GUARANTEED TO AN AQL = 2.5%.<br />

The design parameters such as V CE(SAT)" ton, t<strong>of</strong>f,<br />

COb, etc. are not probed. These characteristics<br />

can best be tested after the chip is suitably<br />

mounted; and, therefore, have little significance<br />

in chip form.<br />

The chips will have a high yield to the specified<br />

limits. The actual yield will vary with the mechanical<br />

techniques used to assemble the device,<br />

and the type <strong>of</strong> package used.<br />

In all cases, the lowest useable voltage and the<br />

lowest useable hFE should be chosen in specifying<br />

chip parameters. This will provide the highest<br />

possible yield and the most economical design.<br />

USE<br />

The entire wafer is manufactured with approximately<br />

3000 A ° <strong>of</strong> gold for die attach to a suitable<br />

substrate or base. Recommended die attach temperature<br />

for all families is 450°C, maximum. 9,000<br />

to 12,000 angstroms <strong>of</strong> aluminum are deposited<br />

on the chip for metalization purposes. <strong>ITT</strong> recommends<br />

aluminum wire for connection to the aluminum<br />

base and emitter bonding pads. Ultrasonic<br />

techniques may be used for the, wire-bond operation.<br />

PACKAGING FOR SHIPMENT<br />

Chips will be shipped in appropriate containers,<br />

with the devices packaged to protect them from<br />

damage in shipment. Wafers will be shipped in a<br />

similar manner. Unless otherwise specified, wafers<br />

will not be scribed prior to shipment.<br />

CROSS REFERENCE CHART<br />

The list <strong>of</strong> JEDEC specifications, together with<br />

the respective chip specification, will provide a<br />

means <strong>of</strong> ordering the proper chip required in<br />

an application. This chart is not exhaustive, and<br />

is provided as a guide. Specific requirements may<br />

necessitate a different chip specification from<br />

available JEDEC "2N" numbers. In such cases,<br />

the accompanying list <strong>of</strong> chip parameters will<br />

provide the necessary information.<br />

ORDERING<br />

All chips and wafers should be ordered according<br />

to the alpha-numeric coding system referred to<br />

in the speCification chart. The four-digit geometry<br />

family, together with the voltage letter and DC<br />

gain number (from the accompanying geometry<br />

parameter chart) will completely determine the<br />

specification which <strong>ITT</strong> will provide. A third letter<br />

specifies in which form, chip or wafer, the product<br />

is to be shipped.<br />

E.G.:<br />

IDENTIFICATION<br />

Q Family<br />

Q 1.- § §!.l\Q ~<br />

C = Chi<br />

Voltage Gain W = Wafer<br />

All small-signal transistor dice will be identified<br />

by the appropriate four-digit family number together<br />

with the particular classification code for<br />

voltage and current gain.<br />

By way <strong>of</strong> example:<br />

The 2N2222 is a "0018" chip. The voltage class<br />

is "M," the current gain is "A." Therefore, when<br />

ordering a 2N2222 in chip or wafer form, the<br />

correct part would be a "0018MA" chip. This<br />

method applies to dice and to a wafer which has<br />

been tested 1 00%.<br />

If a wafer is needed which does not require all<br />

the chips to be tested, then the alpha-numeric<br />

suffix will apply. For a 2N2222 device, in wafer<br />

form, sample probe-tested only, the proper part<br />

number will be a "0018S1."<br />

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