ITT - Index of

CIRCUIT TYPES ITT54H30, ITT74H30
8-INPUT POSITIVE NAND GATES
ELECTRICAL CHARACTERISTICS over recommended operating free-air temperature range
(unless otherwise noted)
Parameter Min Typ 1 Max Unit Test Conditions 2
Vin (1 ) Logical 1 input voltage 2 V
required at all input
terminals to ensure logical 0
level at output
Vin(O) Logical 0 input voltage 0.8 V
required at any input
terminal to ensure logical 1
level at output
V1 Input Clamp Voltage -1.5 V Vcc = Min Ii = -8 mA
Vout(1 ) Logical 1 output voltage 2.4 V Vee = MIN. Vin = 0.8 V.
Iload = -500 uA
Vout(O) Logical 0 output voltage 0.4 V Vee = MIN. Vin = 2 V.
Isink = 20 mA
lin(O) Logical 0 level input current -2 mA Vee = MAX. Vin = 0.4 V
(each input)
lin( 1) Logical 1 level input current 50 uA Vee = MAX. Vin = 2.4 V
(each input)
1 mA Vee = MAX. Vin = 5.5 V
I
I
I
•I
lOS Short-circuit output current 3 -40 -100 mA Vee = MAX
lee(O) Logical 0 level supply current 6.5 10 mA Vee = MAX. Vin = 4.5 V
lee(1) Logical 1 level supply current 2.5 4.2 mA Vee = MAX. Vin = 0
SWITCHING CHARACTERISTICS. Vee = 5V. TA = 25°C. N = 10
tpdO
Parameter Min Typ Max Unit Test Conditions
Propagation delay time to
logical 0 level
8.9 12 ns eL = 25 pF. R L = 280 S1
tpd1 Propagation delay time to 6.8 10 ns eL = 25 pF. RL = 280 S1
logical 1 level
1 All typical values are atVcc = 5 V. TA = 25°C.
2 For conditions shown as MIN or MAX. use the appropriate value specified under recommended operating conditions
for the applicable device type.
3 Duration of short-circuit test should not exceed 1 second.
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