ITT - Index of

CIRCUIT TYPES ITT54H20. ITT74H20
DUAL 4-INPUT POSITIVE NAND GATES
ElECTR ICAl CHARACTERISTICS over recommended operating free-air temperature range
(unless otherwise noted)
Parameter Min Typ' Max Unit Test Conditions 2
Vin(1) Logical 1 input voltage 2 V
required at all input
terminals to ensure logical 0
voltage output
Vin(O) Logical 0 input voltage 0.8 V
required at any input
terminal to ensure logical 1
level at output
V 1 Input Clamp Voltage -1.5 V Vcc = Min Ii = -8 mA
Vout(1) Logical 1 output voltage 2.4 V Vee = MIN, Vin = 0.8 V,
Iload = - 500 uA
Vout(O) Logical 0 output voltage 0.4 V Vee = MIN, Vin = 2 V,
Isink = 20 mA
lin(O)
Logical 0 level input current
(each input)
-2 mA Vee = MAX, Vin = 0.4 V
lin(1 ) Logical 1 level input current 50 uA Vee = MAX, Vin = 2.4 V
(each input)
1 mA Vee = MAX, Vin = 5.5 V
lOS Short-circuit output current 3 -40 -100 mA Vee = MAX
lee(O) Logical 0 level supply current 13 20 mA Vee = MAX, Vin = 4.5 V
lee(1) Logica I 1 level su pply current 5 8.4 mA Vee = MAX, Vin = 0
SWITCHING CHARACTERISTICS, Vee = 5V, TA = 25°C, N = 10
Parameter Min Typ Max Unit Test Conditions
tpdO
tpd1
Propagation delay time to
logical 0 level
Propagation delay time to
logical 1 level
7 10 ns eL = 25 pF, RL = 280 st
6 10 ns eL = 25 pF, RL = 280 st
, All typical values are at vee = 5 V, T A = 25°C.
2 For conditions shown as M IN or MAX, use the appropriate value specified under recommended operating conditions
for the applicable device type.
3 Not more than one output should be shorted at a time, and duration of short-circuit test should not exceed 1 second.
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