ITT - Index of

ITT54H 00, ITT74HOO
QUADRUPLE 2-INPUT POSITIVE NAND GATES
ELECTR ICAL CHARACTERISTICS over recommended operating free-air temperature range
(unless otherwise noted)
Parameter Min Typ' Max Unit Test Conditions 2
Vin (1 )
Logical 1 input voltage
required at all input
terminals to ensure logical 0
level at output
2 V
Vin(O) Logical 0 input voltage
required at any input
terminal to ensure logical 1
" level at output
O.S
V
V1 Input Clamp Voltage -1.5 V VIN Ii = -S mA
Vout(1 ) Logical 1 output voltage 2.4 V Vee = MIN. Vin = O.S V.
Iload = -500 uA
Vout(O) Logical 0 output voltage 0.4 V Vee = MIN. Vin = 2 V.
Isink = 20mA
lin(O) Logical 0 level input current -2 mA Vee = MAX. Vin = 0.4 V
(each input)
lin(1 ) Logical 1 level input current 50 uA Vee = MAX. Vin = 2.4 V
(each input)
1 mA Vee - MAX. Vin - 5.5 V
lOS Short-circuit output current 3 -40 -100 mA Vee = MAX
lee(O) Logical 0 level supply current 26 40 mA Vee = MAX. Vin = 4.5 V
lee(1) Logical 1 level supply current 10 16.S mA Vee = MAX. Vin = 0
I
SWITCHING CHARACTERISTICS. Vee = 5V. TA = 25°C. N = 10
Parameter Min Typ Max Unit Test Conditions
tpdO
Propagation delay time to
logical 0 level
6.2 10 ns eL=25pF.R L =2S0Q
tpd1 Propagation delay time to 5.9 10 ns eL = 25 pF. RL = 2S0 Q
logical 1 level
1 All typical values are at VCC = 5 V. TA = 25°C.
2 For conditions shown as MIN or MAX. use the appropriate value specified under recommended operating conditions
for the applicable device type.
3 Not more than one output should be shorted at a time. and duration of short-circuit test should not exceed 1 second.
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