ITT - Index of

CIRCUIT TYPES ITT54H01, ITT74H01
QUADRUPLE 2-INPUT POSITIVE NAND GATES
(WITH OPEN-COLLECTOR OUTPUT)
ELECTRICAL CHARACTERISTICS over recommended operating free-air temperature range
(unless otherwise noted)
Parameter Min Typ' Max Unit Test Conditions 2
Vin(l) Logical 1 input voltage required 2 V
at both input terminals to ensure
logical 0 (on) level at output
·Vin(O) Logical 0 input voltage requ·ired O.S V
at either input terminal to ensure
logical 1 (off) level at output
V1 Input Clamp Voltage -1.5 V Vee = Min. Ii = -S mA
10ut(1 ) Output reverse current 250 uA Vee = MIN. Vin = O.SV.
Vout(l) = 5.5V
Vout(O) Logical 0 output voltage (on 0.4 V Vee = MIN. Vin = 2V.
level)
Isink = 20 mA
lin(O) Logical 0 level input current -2 mA Vee = MAX. Vin = 0.4V
(each input)
lin(l ) Logical 1 level input current 50 uA Vee = MAX. Vin = 2.4V
(each input)
1 mA Vee = MAX. Vin = 5.5V
lee(O) Logical 0 level supply current 26 40 mA Vee = MAX. Vin = 4.5V
lee(1) Logical 1 level supply current 6.S 10 mA Vee = MAX. Vin = 0
SWITCHING CHARACTERISTICS. Vee = 5V. TA = 25°e. N = 10
Parameter Min Typ Max Unit Test Conditions
tpdO Propagation delay time to logical 7.5 12 ns eL = 25 pF. RL = 2S011
o level
tpd1 Propagation delay time to logical 10 15 ns eL = 25 pF. RL = 2S011
1 level
, All typical values are at Vee = 5V. TA = 25°C.
2 For conditions shown as MIN or MAX. use the appropriate value specified under recommended operating conditions
for the applicable device type.
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