ITT - Index of

TYPE TAP
PLASTIC ENCAPSULATED
TANTALUM CAPACITORS MINIATURE
TYPE SOLID-ELECTROLYTE
CHARACTERISTIC CURVES (continued)
,
1
e
~
.
'0'
/
.0
1 ,"
•
g •
~
• z
0
~ •
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• §
•
\
IOl2Sb-l----.J" ••......L-,J
=-"--..
TEMPERATURE -C -
,l,-J-l.,o•
......L.,d ••
Fig. 13 vs Ambient Temperature
,
0.1 0.' 0.:5 0.4 0.80.8 I
•
CIRCUIT RESISTANCE £l/V -
Fig. 14 vs Circuit Resistance
Operational Reliability
The reliability is measured by the reject rate.
FR = m
nXh
where m =:; number of rejects. n X h = components
X hours.
The reject rate increases with applied voltage
Vn and ambient temperature ilu' and falls with
increased circuit resistance R,. As a result of
comprehensive life-tests the reject rate has
been determined as a function of Vn. il u and Rs.
The reject rate for catastrophic failures for
the particular case can be determined from
Fig. 12 to 14 as follows:
1. Determine the reject rate of FR" as a function
of the applied voltage from Fig. 12 with
ilu = +85°C and Rs = 3nN.
2. Multiply FR" with the corresponding factor
from Fig. 13 for the actual ambient temperature
to obtain the reject rate FR'.
3. Determine the final reject rate FR as a
function of the circuit resistance by multiplying
FR' with the corresponding correction factor
obtained from Fig. 13 (ambient temperature as
parameter).
EXAMPLE: Determination of F for
VB = 50% F
R
" = 6.2.10- 8 • h-' (from Fig. 12)
3 U = 125°C F' = 6.2.10- 8 .9. h- 1-
R
(from Fig. 13)
RS = 1nIV F' = 6.2.10-
R
.9.2.8. h-' (from Fig. 14)
FR = 7.56 x 70- 6 • h- 1
16-10