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MMC2107 - Freescale Semiconductor

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<strong>Freescale</strong> <strong>Semiconductor</strong>, Inc.<br />

JTAG Test Access Port and OnCE<br />

Introduction<br />

21.14.12.3 Control State Register . . . . . . . . . . . . . . . . . . . . . . . . .577<br />

21.14.12.4 Writeback Bus Register . . . . . . . . . . . . . . . . . . . . . . . .579<br />

21.14.12.5 Processor Status Register . . . . . . . . . . . . . . . . . . . . . .579<br />

21.14.13 Instruction Address FIFO Buffer (PC FIFO) . . . . . . . . . . .580<br />

21.14.14 Reserved Test Control Registers . . . . . . . . . . . . . . . . . . .581<br />

21.14.15 Serial Protocol . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .581<br />

21.14.16 OnCE Commands . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .582<br />

21.14.17 Target Site Debug System Requirements . . . . . . . . . . . .582<br />

21.14.18 Interface Connector for JTAG/OnCE Serial Port . . . . . . .582<br />

nc...<br />

<strong>Freescale</strong> <strong>Semiconductor</strong>, I<br />

21.2 Introduction<br />

The <strong>MMC2107</strong> has two JTAG (Joint Test Action Group) TAP (test<br />

access port) controllers:<br />

1. A top-level controller that allows access to the <strong>MMC2107</strong>’s<br />

boundary scan (external pins) register, IDCODE register, and<br />

bypass register<br />

2. A low-level OnCE (on-chip emulation) controller that allows<br />

access to <strong>MMC2107</strong>’s central processor unit (CPU) and<br />

debugger-related registers<br />

At power-up, only the top-level TAP controller will be visible. If desired,<br />

a user can then enable the low-level OnCE controller which will in turn<br />

disable the top-level TAP controller. The top-level TAP controller will<br />

remain disabled until either power is removed and reapplied to the<br />

<strong>MMC2107</strong> or until the test reset signal, TRST, is asserted (logic 0).<br />

The OnCE TAP controller can be enabled in either of two ways:<br />

1. With the top-level TAP controller in its test-logic-reset state:<br />

a. Deassert TRST, test reset (logic1)<br />

b. Assert DE, the debug event (logic 0) for two TCLK, test clock,<br />

cycles<br />

2. Shift the ENABLE_MCU_ONCE instruction, 0x3, into the top-level<br />

TAP controller’s instruction register (IR) and pass through the TAP<br />

controller state update-IR.<br />

Refer to Figure 21-1.<br />

<strong>MMC2107</strong> – Rev. 2.0<br />

Technical Data<br />

MOTOROLA JTAG Test Access Port and OnCE 535<br />

For More Information On This Product,<br />

Go to: www.freescale.com

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