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MMC2107 - Freescale Semiconductor

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<strong>Freescale</strong> <strong>Semiconductor</strong>, Inc.<br />

JTAG Test Access Port and OnCE<br />

Non-Scan Chain Operation<br />

<strong>MMC2107</strong> features a low-power stop mode. The interaction of the scan<br />

chain interface with low-power stop mode is:<br />

nc...<br />

<strong>Freescale</strong> <strong>Semiconductor</strong>, I<br />

21.10 Non-Scan Chain Operation<br />

21.11 Boundary Scan<br />

1. The TAP controller must be in the test-logic-reset state to either<br />

enter or remain in the low-power stop mode. Leaving the<br />

test-logic-reset state negates the ability to achieve low-power, but<br />

does not otherwise affect device functionality.<br />

2. The TCLK input is not blocked in low-power stop mode. To<br />

consume minimal power, the TCLK input should be externally<br />

connected to V DD .<br />

3. The TMS, TDI, TRST pins include on-chip pullup resistors. In<br />

low-power stop mode, these three pins should remain either<br />

unconnected or connected to V DD to achieve minimal power<br />

consumption.<br />

Keeping the TAP controller in the test-logic-reset state will ensure that<br />

the scan chain test logic is kept transparent to the system logic. It is<br />

recommended that TMS, TDI, TCLK, and TRST be pulled up. TRST<br />

could be connected to ground. However, since there is a pullup on<br />

TRST, some amount of current will result. JTAG will be initialized to the<br />

test-logic-reset state on power-up without TRST asserted low due to the<br />

JTAG power-on-reset internal input. The low-level TAP module in the<br />

M•CORE also has the power-on-reset input.<br />

The <strong>MMC2107</strong> boundary-scan register contains 200 bits. This register<br />

can be connected between TDI and TDO when EXTEST or<br />

SAMPLE/PRELOAD instructions are selected. This register is used for<br />

capturing signal pin data on the input pins, forcing fixed values on the<br />

output signal pins, and selecting the direction and drive characteristics<br />

(a logic value or high impedance) of the bidirectional and three-state<br />

signal pins.<br />

This IEEE 1149.1 standard-compliant boundary-scan register contains<br />

bits for bonded-out and non-bonded signals excluding JTAG signals,<br />

analog signals, power supplies, compliance enable pins, and clock<br />

<strong>MMC2107</strong> – Rev. 2.0<br />

Technical Data<br />

MOTOROLA JTAG Test Access Port and OnCE 547<br />

For More Information On This Product,<br />

Go to: www.freescale.com

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