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Cortex-A8 Technical Reference Manual - ARM Information Center

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Chapter 11<br />

Design for Test<br />

This chapter describes the DFT features that are included in the Register Transfer Language (RTL).<br />

It contains the following sections:<br />

• MBIST on page 11-2<br />

• ATPG test features on page 11-28.<br />

<strong>ARM</strong> DDI 0344K Copyright © 2006-2010 <strong>ARM</strong> Limited. All rights reserved. 11-1<br />

ID060510 Non-Confidential

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