Cortex-A8 Technical Reference Manual - ARM Information Center

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12.10.2 Authentication signals Debug Note In a system with no ROM Table, DBGROMADDR must be tied off with the physical address of the debug registers that are memory-mapped. Debug software can use the debug component identification registers at the end of the 4KB block addressed by DBGROMADDR to distinguish a ROM table from a processor. DBGSELFADDR must be tied to 0. DBGROMADDRV and DBGSELFADDRV must both be tied to 1. Table 12-57 shows a list of the valid combination of authentication signals along with its associated debug permissions. Authentication signals are used to configure the processor so its activity can only be debugged or traced in a certain subset of processor modes and security states. SPIDEN DBGEN a SPNIDEN NIDEN Secure invasive debug permitted Changing the authentication signals Table 12-57 Authentication signal restrictions Nonsecure invasive debug permitted Secure noninvasive debug permitted 0 0 0 0 No No No No 0 0 0 1 No No No Yes 0 0 1 0 No No No No 0 0 1 1 No No Yes Yes 0 1 0 0 No Yes No Yes 0 1 0 1 No Yes No Yes 0 1 1 0 No Yes Yes Yes 0 1 1 1 No Yes Yes Yes 1 0 0 0 No No No No 1 0 0 1 No No Yes Yes 1 0 1 0 No No No No 1 0 1 1 No No Yes Yes 1 1 0 0 Yes Yes Yes Yes 1 1 0 1 Yes Yes Yes Yes 1 1 1 0 Yes Yes Yes Yes 1 1 1 1 Yes Yes Yes Yes Nonsecure noninvasive debug permitted a. When DBGEN is LOW, the processor behaves as if DSCR[15:14] equals b00 with the exception that halting debug events are ignored when this signal is LOW. The NIDEN, DBGEN, SPIDEN, and SPNIDEN input signals are either tied off to some fixed value or controlled by some external device. ARM DDI 0344K Copyright © 2006-2010 ARM Limited. All rights reserved. 12-67 ID060510 Non-Confidential
If software running on the processor has control over an external device that drives the authentication signals, it must make the change using a safe sequence: Debug 1. Execute an implementation-specific sequence of instructions to change the signal value. For example, this might be a single STR instruction that writes certain value to a control register in a system peripheral. 2. If step 1 involves any memory operation, issue a Data Synchronization Barrier (DSB). 3. Poll the DSCR or Authentication Status Register to check whether the processor has already detected the changed value of these signals. This is required because the processor might not see the signal change until several cycles after the DSB completes. 4. Issue an Instruction Synchronization Barrier (ISB) exception entry or exception return. The software cannot perform debug or analysis operations that depend on the new value of the authentication signals until this procedure is complete. The same rules apply when the debugger has control of the processor through the ITR while in debug state. The relevant combinations of the DBGEN, NIDEN, SPIDEN, and SPNIDEN values can be determined by polling DSCR[17:16], DSCR[15:14], or the Authentication Status Register. ARM DDI 0344K Copyright © 2006-2010 ARM Limited. All rights reserved. 12-68 ID060510 Non-Confidential
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Copyright © 2006-2010 ARM Limited.
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Web Address http://www.arm.com ARM
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Contents 2.14 The program status re
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Contents 16.6 Instruction-specific
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List of Tables Table 3-16 Debug Fea
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List of Tables Table 3-136 Secure o
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List of Tables Table 12-59 Values t
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List of Figures Cortex-A8 Technical
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List of Figures Figure 3-77 BTB arr
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List of Figures Figure 15-16 CTI Ch
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About this manual Product revision
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old Highlights interface elements,
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Feedback Feedback on the product Fe
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1.1 About the processor Introductio
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1.3 Components of the processor L1
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1.3.6 NEON 1.3.7 ETM The NEON unit
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1.5 Debug Introduction The processo
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1.7 Configurable options Table 1-1
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Introduction • The various data a
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1.9.6 r2p0-r2p1 1.9.7 r2p1-r2p2 1.9
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Chapter 2 Programmers Model This ch
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2.2 Thumb-2 instruction set Program
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Bits Field Function Programmers Mod
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2.4 Jazelle Extension 2.4.1 Jazelle
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2.5 Security Extensions architectur
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2.6 Advanced SIMD architecture Prog
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2.8 Processor operating states 2.8.
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2.10 Memory formats 2.10.1 Byte-inv
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2.12 Operating modes Programmers Mo
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System and User r0 r1 r2 r3 r4 r5 r
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2.14 The program status registers 2
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2.14.5 The GE[3:0] bits Programmers
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Mode bits Programmers Model M[4:0]
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2.15 Exceptions 2.15.1 Exception en
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2.15.5 Interrupt request 2.15.6 Abo
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This restores both the PC and the C
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2.15.13 Exception priorities Progra
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2.17 Hardware consideration for Sec
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SECMONOUT[78] instruction caches at
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Chapter 3 System Control Coprocesso
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System Control Coprocessor Register
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3.1.3 MMU control and configuration
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3.2 System control coprocessor regi
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CRn Op1 CRm Op2 Register or operati
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3.2.2 c0, Main ID Register System C
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3.2.4 c0, TCM Type Register 3.2.5 c
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3.2.7 c0, Processor Feature Registe
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• accessible in privileged modes
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System Control Coprocessor Table 3-
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Bits Field Function [11:8] L1 Harva
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Bits Field Function [11:8] Harvard
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31 28 27 24 23 20 19 16 15 12 11 8
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Table 3-30 shows the results of att
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System Control Coprocessor 31 28 27
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Table 3-36 shows the results of att
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• accessible in privileged modes
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CSSR Size 3.2.24 c0, Cache Size Sel
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System Control Coprocessor 31 30 29
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MCR p15, 0, , c1, c0, 0 ; Write Con
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Bits Field [19] Clock stop request
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Bits Field Security State NS S Tabl
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3.2.28 c1, Secure Configuration Reg
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AW EA Function Table 3-55 shows the
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3.2.32 c2, Translation Table Base R
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System Control Coprocessor Figure 3
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Bits Field Function 3.2.35 c5, Data
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3.2.36 c5, Instruction Fault Status
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3.2.38 c6, Data Fault Address Regis
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System Control Coprocessor Note •
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System Control Coprocessor Figure 3
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3.2.41 c8, TLB operations The data
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Figure 3-38 shows the bit arrangeme
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EN b 3.2.44 c9, Count Enable Clear
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EN b 3.2.46 c9, Software Increment
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EN b 3.2.48 c9, Cycle Count Registe
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EN b Table 3-96 shows the results o
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Value Description 0x44 Any cacheabl
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DBGEN || NIDEN 3.2.51 c9, User Enab
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EN 3.2.53 c9, Interrupt Enable Clea
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Figure 3-48 shows the bit arrangeme
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3.2.55 c9, L2 Cache Auxiliary Contr
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Bits Field Function [8:6] Tag RAM l
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TL bit value 3.2.57 c10, TLB preloa
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The PLE Identification and Status R
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3.2.62 c11, PLE enable commands U b
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Bits Field Function System Control
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U bit PLE bit Table 3-129 shows the
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U bit PLE bit System Control Coproc
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3.2.68 c12, Secure or Nonsecure Vec
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3.2.70 c12, Interrupt Status Regist
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The FCSE PID Register is: • a rea
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TLB CAM read/write TLB ATTR read/wr
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MCR p15 0, , c15, c3, 4 ; I-L1 TLB
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31 27 26 22 21 0 Reserved L1 Data 0
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System Control Coprocessor The L1 H
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3.2.78 c15, L1 data array operation
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Instruction L1 Data 0 register Inst
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Parity/ECC RAM read/write Data RAM
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3.2.82 c15, L2 parity/ECC array ope
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3.2.84 c15, L2 data array operation
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4.1 About unaligned and mixed-endia
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Unaligned Data and Mixed-endian Dat
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Chapter 5 Program Flow Prediction T
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5.2 Predicted instructions Program
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Program Flow Prediction Because ret
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5.4 Guidelines for optimal performa
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5.6 Operating system and predictor
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6.1 About the MMU Memory Management
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6.3 16MB supersection support Memor
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6.5 External aborts 6.5.1 External
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6.7 MMU software-accessible registe
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7.1 About the L1 memory system Leve
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7.2.6 Instruction cache maintenance
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L1 inner policy a L2 outer policy N
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7.5 Data cache features 7.5.1 Data
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7.7 Hardware support for virtual al
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Chapter 8 Level 2 Memory System Thi
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8.2 Cache organization 8.2.1 L2 cac
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8.3 Enabling and disabling the L2 c
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Level 2 Memory System Note It is en
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Level 2 Memory System Note You must
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Lock address : LockAddr Lock free :
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8.7 Parity and error correction cod
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9.1 About the external memory inter
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Integer data and CP14 writes Noncac
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9.4 AXI data read/write transaction
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Noncacheable, or strongly ordered,
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Noncacheable store word Noncacheabl
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LA Last Access External Memory Inte
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10.1 Clock domains 10.1.1 AXI clock
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10.2 Reset domains 10.2.1 Power-on
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REFCLK (PLL input) nPORESET ARESETn
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10.3 Power control 10.3.1 Dynamic p
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Clock, Reset, and Power Control the
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ATB APB I/O clamp I/O clamp L/S = L
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ATB APB I/O clamp I/O clamp LS = Le
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Clock, Reset, and Power Control 3.
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Powering up the debug and ETM domai
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7. Perform a normal software reset
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Clock, Reset, and Power Control 5.
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Chapter 11 Design for Test This cha
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In L1 MBIST Instruction Register Fi
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Note Do not test the CAMBIST arrays
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• number of rows of the L2 data,
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Design for Test Not all row setting
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In Design for Test Figure 11-4 show
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Design for Test When testing the ta
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CLK ARESETn MBISTMODE MBISTSHIFT MB
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End-of-test datalog retrieval Desig
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Pattern N RWRXMARCH 8N Row-fast Sta
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4. rscan array, data_seed = invert.
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3. R_, W, R, decr. 4. rscan data fr
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• the data after pass 1 of XADDRB
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(1 + (2 17)) 2 17 = 4,587,520 cycle
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processor input ports WEXTEST WINTE
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Design for Test toggling during shi
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12.1 Debug systems 12.1.1 Debug hos
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12.2.3 Security extensions and debu
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Instruction Mnemonic Description 12
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12.3.6 Power domains and debug 12.3
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Table 12-5 shows the APB interface
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12.4 Debug register descriptions Te
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MRC p14, 0, , c0, c0, 0 ; Read Debu
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Page 369 and 370: 12.5 Management registers Offset Th
Page 371 and 372: Offset Register number Mnemonic Fun
Page 373 and 374: Bits Field Function [5] nDMAIRQ nDM
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Page 413 and 414: Debug Example 12-21 Reading a word
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Page 417 and 418: 12.12 Debugging systems with energy
Page 419 and 420: MOV r0, r4 POP {r4, pc} Example 12-
Page 421 and 422: Chapter 13 NEON and VFP Programmers
Page 423 and 424: 13.2 General-purpose registers 13.2
Page 425 and 426: 13.3 Short vectors 13.3.1 About reg
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Page 429 and 430: NEON and VFP Programmers Model The
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Page 433 and 434: Bits Field Function [12:8] - Reserv
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Page 439 and 440: Underflow NEON and VFP Programmers
Page 441 and 442: 14.1 About the ETM 14.1.1 ETM featu
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Page 445 and 446: 14.3 ETM register summary The ETM r
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14.4.4 Peripheral Identification Re
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See the ETM Architecture Specificat
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Embedded Trace Macrocell Table 14-1
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14.5.3 Enabling events 14.5.4 Addre
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14.7 Context ID tracing Embedded Tr
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14.9 Idle state control Embedded Tr
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Chapter 15 Cross Trigger Interface
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CTICHIN[0] CTICHIN[1] CTICHIN[2] CT
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15.2 Trigger inputs and outputs Tri
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15.3 Connecting asynchronous channe
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15.5 CTI register summary Address o
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15.6 CTI register descriptions This
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15.6.4 CTI Application Trigger Clea
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Table 15-10 shows how the bit value
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15.6.12 ASIC Control Register, ASIC
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15.7 CTI Integration Test Registers
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15.7.4 ITTRIGOUTACK, 0xEF0 15.7.5 I
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Cross Trigger Interface Table 15-26
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15.8.3 Device Type Identifier, 0xFC
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Cross Trigger Interface Table 15-31
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16.1 About instruction cycle timing
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Instruction Cycle Timing Example 16
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Table 16-4 shows the operation of m
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Table 16-9 shows the operation of l
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d. See Load/store instructions on p
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Instruction Cycle Timing Table 16-1
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16.4 Other pipeline-dependent laten
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16.4.5 Conditional instructions Ins
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16.6 Instruction-specific schedulin
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Instruction Cycle Timing VNEG Dd,Dm
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VMLA a VMLS a VMLAa VMLSa VQDMLAa V
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VSLI VSRI 16.6.5 Advanced SIMD floa
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16.6.6 Advanced SIMD byte permute i
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Instruction Table 16-23 shows the o
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Instruction VST3 3-reg (unaligned)
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Instruction VLD3 3-reg (unaligned)
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Instruction Single precision cycles
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• FMACS, FNMACS • FMSCS, FNMSCS
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is dual issued with previous instru
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17.1 About setup and hold times AC
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17.2 AXI interface Table 17-2 shows
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17.3 ATB and CTI interfaces Table 1
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AC Characteristics Table 17-4 Timin
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17.6 L2 preload interface AC Charac
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17.8 Miscellaneous signals AC Chara
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A.1 AXI interface Signal Descriptio
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A.3 MBIST and DFT interface A.3.1 M
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A.4 Preload engine interface Table
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A.6 Miscellaneous signals Table A-7
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Signal I/O Reset Description CFGNMF
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Signal I/O Reset Description DBGNOP
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Appendix B Instruction Mnemonics Th
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Instruction Mnemonics Table B-1 Adv
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Appendix C Revisions This appendix
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Revisions Added text to clarify des
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Glossary This glossary describes so
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Glossary Automatic Test Pattern Gen
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Big-endian memory Memory in which:
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Conditional execution Glossary incl
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Glossary Embedded Trace Macrocell (
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Illegal instruction An instruction
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Glossary NaN Not a number. A symbol
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Glossary Significand The component
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Glossary Watchpoint A watchpoint is
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