09.12.2012 Views

Cortex-A8 Technical Reference Manual - ARM Information Center

Cortex-A8 Technical Reference Manual - ARM Information Center

Cortex-A8 Technical Reference Manual - ARM Information Center

SHOW MORE
SHOW LESS

You also want an ePaper? Increase the reach of your titles

YUMPU automatically turns print PDFs into web optimized ePapers that Google loves.

In<br />

Design for Test<br />

Figure 11-4 shows the L1 MBIST GO-NOGO Instruction Register contents after loading a<br />

COLBAR with a data seed of 0xF and a READBANG with a data seed of 0x6.<br />

Figure 11-4 L1 MBIST GO-NOGO Instruction Register example with two patterns<br />

The MBISTSHIFTL1 signal must toggle one cycle before initiation and one cycle before<br />

completion of the MBISTDATAINL1 stream as Figure 11-7 on page 11-15 shows. During<br />

GO-NOGO instruction load, MBISTDSHIFTL1 must toggle at the same time as<br />

MBISTSHIFTL1. See Figure 11-8 on page 11-16.<br />

L1 MBIST Datalog Register<br />

The L1 MBIST Datalog Register records information about failing arrays. Figure 11-5 shows<br />

the fields of the L1 MBIST Datalog Register.<br />

ArrayFail[22:0]<br />

Figure 11-5 L1 MBIST Datalog Register bit assignments<br />

Read the ArrayFail[22:0] field to identify arrays that produce failures. The bits in this field<br />

correspond to the bits in the L1_array_sel[22:0] field in the L1 MBIST Instruction Register.<br />

Table 11-5 on page 11-5 shows how each bit corresponds to one of the L1 arrays. Testing more<br />

than one array while not in bitmap test mode can set more than one ArrayFail[22:0] bit to 1. The<br />

least-significant 1 in the ArrayFail[22:0] field indicates the first failing array.<br />

expect_data[3:0]<br />

Read the expect_data[3:0] field for the expected data seed for the first failing array. Because<br />

data seed toggling occurs throughout pattern execution, the value in this field does not always<br />

correspond to the programmed data seed.<br />

fail_addr[16:2]<br />

Read the fail_addr[16:2] field for the physical address of the first failing array. See the address<br />

scramble information contained within the Design for Test implementation documentation for<br />

details on shows how this address is constructed.<br />

failing_bits[37:0]<br />

0_xxxx_xxxxxx<br />

0_xxxx_xxxxxx<br />

1_1111_101111<br />

1_0110_101010<br />

ArrayFail[22:0] fail_addr[16:2] failing_bits[37:0]<br />

expect_data[3:0]<br />

alg_pass[3:0]<br />

0_xxxx_xxxxxx<br />

0_xxxx_xxxxxx<br />

0_xxxx_xxxxxx<br />

0_xxxx_xxxxxx<br />

Read the failing_bits[37:0] field to identify failing bits in the first array that fails. This field<br />

contains the EXCLUSIVE-OR of read data and expect data.<br />

pattern<br />

[5:0]<br />

<strong>ARM</strong> DDI 0344K Copyright © 2006-2010 <strong>ARM</strong> Limited. All rights reserved. 11-11<br />

ID060510 Non-Confidential

Hooray! Your file is uploaded and ready to be published.

Saved successfully!

Ooh no, something went wrong!