Cortex-A8 Technical Reference Manual - ARM Information Center

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11.1.4 Pattern selection CLK MBISTRESULT[1] (fail flag) MBISTDSHIFT MBISTRESULT[0] (data log shift out) Design for Test Figure 11-12 Timing of MBIST end of bitmap datalog retrieval The processor implementation includes a toolbox of patterns for testing the arrays. When creating test vectors, you can select the group of algorithms that is most effective for your fabrication process. Some of the pattern sequence descriptions use the following terms: R Read instruction data seed. W Write instruction data seed. R_ Read inverse of instruction data seed. W_ Write inverse of instruction data seed. incr Increment address starting with 0 until address = addrmax. decr Decrement address starting with addrmax until address = 0. wscan Write entire array. rscan Read entire array. N Total number of accesses per address location. Table 11-19 shows the patterns that are selected using the pttn[5:0] field of the MBIST Instruction Register. Pattern N MBISTRUN Address updating PLL glitchless switch between fast and slow clocking occurs here D[msb–1] D[msb] Description Table 11-19 Summary of MBIST patterns CAMBIST - - Tests CAM compare logic, see CAMBIST on page 11-19 CKBD 4N Row-fast Checkerboard-checkerboard_bar wscan-rscan pattern, see CKBD on page 11-20 COLBAR 4N Column-fast Column bar-stripe wscan-rscan pattern, see COLBAR on page 11-20 ROWBAR 4N Row-fast Row bar-stripe wscan-rscan pattern, see ROWBAR on page 11-21 SOLIDS 4N Row-fast Solid wscan-rscan pattern, see SOLIDS on page 11-21 RWXMARCH 6N Row-fast Standard R W_ increment-decrement march, see RWXMARCH on page 11-22 RWYMARCH 6N Column-fast Standard R W_ increment-decrement march, see RWYMARCH on page 11-22 ARM DDI 0344K Copyright © 2006-2010 ARM Limited. All rights reserved. 11-18 ID060510 Non-Confidential
Pattern N RWRXMARCH 8N Row-fast Standard R W_ R_ increment-decrement march, see RWRXMARCH on page 11-22 RWRYMARCH 8N Column-fast Standard R W_ R_ increment-decrement march, see RWRYMARCH on page 11-23 CAMBIST Design for Test XMARCHC 14N Row-fast Standard marchC, see XMARCHC on page 11-23 R W_ R_ incr, R_ W R_ incr, R W_ R_ decr R_ W R_decr YMARCHC 14N Column-fast Standard marchC, see YMARCHC on page 11-24 R W_ R_ incr, R_ W R_ incr, R W_ R_ decr R_ W R_decr XADDRBAR 4N Row-fast Wscan/rscan through opposite addresses, see XADDRBAR on page 11-24 YADDRBAR 4N Column-fast Wscan/rscan through opposite addresses, see YADDRBAR on page 11-25 WRITEBANG 20N Row-fast Custom bitline stress test, see WRITEBANG on page 11-25 W_ R_ (wsac 5) R_ W READBANG 17N Row-fast Custom bitcell read stress test, see READBANG on page 11-26 FAIL 6N Row-fast R W march with built-in failures, see FAIL on page 11-26 ADDRDECODER N(1 + 2log2N) NA Detection of open decoder faults on address lines, see ADDRESS DECODER on page 11-26 Default GO-NOGO 32N Mix CKBD-RWRYMARCH-WRITEBANG, see GO-NOGO on page 11-27 WCKBD WCOLBAR WROWBAR WSOLIDS RCKBD RCOLBAR RROWBAR RSOLIDS 1N - Single pass wscan for IDDQ and data retention style tests The CAMBIST performs a simultaneous match check across all 32 entries by comparing each entry against an incoming compare value. This function is executed by performing a bitwise XOR of the inverted compare value and each individual CAM entry. If the XOR is true, a hit is determined. CAMBIST tests this compare function by testing that each CAM bit is capable of generating a hit and a miss for both 1 and 0. CAMBIST performs the following sequence: 1. Write all entries with 0xA. 2. Write 0s to entry 0. Address updating 1N - Single pass rscan for IDDQ and data retention style tests 3. Compare 0s and check for hit with 0s. Table 11-19 Summary of MBIST patterns (continued) Description ARM DDI 0344K Copyright © 2006-2010 ARM Limited. All rights reserved. 11-19 ID060510 Non-Confidential
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Copyright © 2006-2010 ARM Limited.
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Web Address http://www.arm.com ARM
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Contents 2.14 The program status re
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Contents 16.6 Instruction-specific
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List of Tables Table 3-16 Debug Fea
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List of Tables Table 3-136 Secure o
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List of Tables Table 12-59 Values t
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List of Figures Cortex-A8 Technical
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List of Figures Figure 3-77 BTB arr
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List of Figures Figure 15-16 CTI Ch
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About this manual Product revision
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old Highlights interface elements,
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Feedback Feedback on the product Fe
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1.1 About the processor Introductio
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1.3 Components of the processor L1
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1.3.6 NEON 1.3.7 ETM The NEON unit
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1.5 Debug Introduction The processo
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1.7 Configurable options Table 1-1
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Introduction • The various data a
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1.9.6 r2p0-r2p1 1.9.7 r2p1-r2p2 1.9
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Chapter 2 Programmers Model This ch
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2.2 Thumb-2 instruction set Program
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Bits Field Function Programmers Mod
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2.4 Jazelle Extension 2.4.1 Jazelle
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2.5 Security Extensions architectur
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2.6 Advanced SIMD architecture Prog
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2.8 Processor operating states 2.8.
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2.10 Memory formats 2.10.1 Byte-inv
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2.12 Operating modes Programmers Mo
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System and User r0 r1 r2 r3 r4 r5 r
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2.14 The program status registers 2
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2.14.5 The GE[3:0] bits Programmers
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Mode bits Programmers Model M[4:0]
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2.15 Exceptions 2.15.1 Exception en
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2.15.5 Interrupt request 2.15.6 Abo
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This restores both the PC and the C
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2.15.13 Exception priorities Progra
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2.17 Hardware consideration for Sec
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SECMONOUT[78] instruction caches at
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Chapter 3 System Control Coprocesso
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System Control Coprocessor Register
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3.1.3 MMU control and configuration
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3.2 System control coprocessor regi
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CRn Op1 CRm Op2 Register or operati
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3.2.2 c0, Main ID Register System C
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3.2.4 c0, TCM Type Register 3.2.5 c
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3.2.7 c0, Processor Feature Registe
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• accessible in privileged modes
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System Control Coprocessor Table 3-
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Bits Field Function [11:8] L1 Harva
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Bits Field Function [11:8] Harvard
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31 28 27 24 23 20 19 16 15 12 11 8
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Table 3-30 shows the results of att
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System Control Coprocessor 31 28 27
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Table 3-36 shows the results of att
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• accessible in privileged modes
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CSSR Size 3.2.24 c0, Cache Size Sel
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System Control Coprocessor 31 30 29
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MCR p15, 0, , c1, c0, 0 ; Write Con
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Bits Field [19] Clock stop request
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Bits Field Security State NS S Tabl
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3.2.28 c1, Secure Configuration Reg
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AW EA Function Table 3-55 shows the
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3.2.32 c2, Translation Table Base R
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System Control Coprocessor Figure 3
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Bits Field Function 3.2.35 c5, Data
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3.2.36 c5, Instruction Fault Status
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3.2.38 c6, Data Fault Address Regis
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System Control Coprocessor Note •
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System Control Coprocessor Figure 3
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3.2.41 c8, TLB operations The data
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Figure 3-38 shows the bit arrangeme
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EN b 3.2.44 c9, Count Enable Clear
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EN b 3.2.46 c9, Software Increment
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EN b 3.2.48 c9, Cycle Count Registe
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EN b Table 3-96 shows the results o
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Value Description 0x44 Any cacheabl
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DBGEN || NIDEN 3.2.51 c9, User Enab
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EN 3.2.53 c9, Interrupt Enable Clea
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Figure 3-48 shows the bit arrangeme
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3.2.55 c9, L2 Cache Auxiliary Contr
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Bits Field Function [8:6] Tag RAM l
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TL bit value 3.2.57 c10, TLB preloa
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The PLE Identification and Status R
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3.2.62 c11, PLE enable commands U b
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Bits Field Function System Control
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U bit PLE bit Table 3-129 shows the
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U bit PLE bit System Control Coproc
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3.2.68 c12, Secure or Nonsecure Vec
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3.2.70 c12, Interrupt Status Regist
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The FCSE PID Register is: • a rea
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TLB CAM read/write TLB ATTR read/wr
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MCR p15 0, , c15, c3, 4 ; I-L1 TLB
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31 27 26 22 21 0 Reserved L1 Data 0
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System Control Coprocessor The L1 H
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3.2.78 c15, L1 data array operation
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Instruction L1 Data 0 register Inst
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Parity/ECC RAM read/write Data RAM
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3.2.82 c15, L2 parity/ECC array ope
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3.2.84 c15, L2 data array operation
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4.1 About unaligned and mixed-endia
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Unaligned Data and Mixed-endian Dat
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Chapter 5 Program Flow Prediction T
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5.2 Predicted instructions Program
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Program Flow Prediction Because ret
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5.4 Guidelines for optimal performa
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5.6 Operating system and predictor
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6.1 About the MMU Memory Management
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6.3 16MB supersection support Memor
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6.5 External aborts 6.5.1 External
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6.7 MMU software-accessible registe
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7.1 About the L1 memory system Leve
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7.2.6 Instruction cache maintenance
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L1 inner policy a L2 outer policy N
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7.5 Data cache features 7.5.1 Data
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7.7 Hardware support for virtual al
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Chapter 8 Level 2 Memory System Thi
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8.2 Cache organization 8.2.1 L2 cac
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8.3 Enabling and disabling the L2 c
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Level 2 Memory System Note It is en
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Level 2 Memory System Note You must
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Lock address : LockAddr Lock free :
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8.7 Parity and error correction cod
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Page 295 and 296: Powering up the debug and ETM domai
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Page 301 and 302: Chapter 11 Design for Test This cha
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Page 309 and 310: Design for Test Not all row setting
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Page 313 and 314: Design for Test When testing the ta
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Page 337 and 338: Instruction Mnemonic Description 12
Page 339 and 340: 12.3.6 Power domains and debug 12.3
Page 341 and 342: Table 12-5 shows the APB interface
Page 343 and 344: 12.4 Debug register descriptions Te
Page 345 and 346: MRC p14, 0, , c0, c0, 0 ; Read Debu
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Page 349 and 350: Bits Field Function [21:20] DTR acc
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Page 357 and 358: 12.4.12 Debug Run Control Register
Page 359 and 360: Table 12-23 shows how the bit value
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12.5 Management registers Offset Th
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Offset Register number Mnemonic Fun
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Bits Field Function [5] nDMAIRQ nDM
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12.5.7 Claim Tag Clear Register 12.
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12.5.10 Authentication Status Regis
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Table 12-45 shows fields that are i
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12.6 Debug events 12.6.1 Software d
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12.6.5 Watchpoint debug events If a
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Table 12-53 shows the values in the
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12.8 Debug state 12.8.1 Entering de
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12.8.4 Writing to the CPSR in debug
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Mode SCR[0] For CP15 instructions,
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12.8.9 Leaving debug state Imprecis
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12.9.3 Cache usage profiling Debug
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Note DBGPWRDWNREQ must be tied LOW
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If software running on the processo
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Rules for accessing the DCC At the
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} While the processor is running, i
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Debug Table 12-59 Values to write t
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12.11.4 Debug state entry Example 1
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} // Step 1. Update the CPSR value
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Writing the CPSR in debug state Exa
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Debug Example 12-21 Reading a word
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} // Step 9. Check for aborts. abor
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12.12 Debugging systems with energy
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MOV r0, r4 POP {r4, pc} Example 12-
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Chapter 13 NEON and VFP Programmers
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13.2 General-purpose registers 13.2
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13.3 Short vectors 13.3.1 About reg
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13.3.2 Operations using register ba
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NEON and VFP Programmers Model The
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Note All hardware ID information is
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Bits Field Function [12:8] - Reserv
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NEON and VFP Programmers Model Tabl
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13.6 Compliance with the IEEE 754 s
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Underflow NEON and VFP Programmers
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14.1 About the ETM 14.1.1 ETM featu
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14.1.3 NEON Bridge and bus matrix A
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14.3 ETM register summary The ETM r
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Bits Field Function [11:8] Major ET
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14.4.4 Peripheral Identification Re
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See the ETM Architecture Specificat
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Embedded Trace Macrocell Table 14-1
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14.5.3 Enabling events 14.5.4 Addre
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14.7 Context ID tracing Embedded Tr
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14.9 Idle state control Embedded Tr
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Chapter 15 Cross Trigger Interface
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CTICHIN[0] CTICHIN[1] CTICHIN[2] CT
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15.2 Trigger inputs and outputs Tri
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15.3 Connecting asynchronous channe
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15.5 CTI register summary Address o
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15.6 CTI register descriptions This
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15.6.4 CTI Application Trigger Clea
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Table 15-10 shows how the bit value
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15.6.12 ASIC Control Register, ASIC
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15.7 CTI Integration Test Registers
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15.7.4 ITTRIGOUTACK, 0xEF0 15.7.5 I
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Cross Trigger Interface Table 15-26
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15.8.3 Device Type Identifier, 0xFC
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Cross Trigger Interface Table 15-31
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16.1 About instruction cycle timing
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Instruction Cycle Timing Example 16
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Table 16-4 shows the operation of m
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Table 16-9 shows the operation of l
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d. See Load/store instructions on p
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Instruction Cycle Timing Table 16-1
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16.4 Other pipeline-dependent laten
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16.4.5 Conditional instructions Ins
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16.6 Instruction-specific schedulin
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Instruction Cycle Timing VNEG Dd,Dm
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VMLA a VMLS a VMLAa VMLSa VQDMLAa V
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VSLI VSRI 16.6.5 Advanced SIMD floa
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16.6.6 Advanced SIMD byte permute i
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Instruction Table 16-23 shows the o
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Instruction VST3 3-reg (unaligned)
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Instruction VLD3 3-reg (unaligned)
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Instruction Single precision cycles
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• FMACS, FNMACS • FMSCS, FNMSCS
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is dual issued with previous instru
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17.1 About setup and hold times AC
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17.2 AXI interface Table 17-2 shows
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17.3 ATB and CTI interfaces Table 1
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AC Characteristics Table 17-4 Timin
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17.6 L2 preload interface AC Charac
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17.8 Miscellaneous signals AC Chara
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A.1 AXI interface Signal Descriptio
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A.3 MBIST and DFT interface A.3.1 M
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A.4 Preload engine interface Table
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A.6 Miscellaneous signals Table A-7
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Signal I/O Reset Description CFGNMF
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Signal I/O Reset Description DBGNOP
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Appendix B Instruction Mnemonics Th
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Instruction Mnemonics Table B-1 Adv
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Appendix C Revisions This appendix
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Revisions Added text to clarify des
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Glossary This glossary describes so
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Glossary Automatic Test Pattern Gen
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Big-endian memory Memory in which:
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Conditional execution Glossary incl
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Glossary Embedded Trace Macrocell (
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Illegal instruction An instruction
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Glossary NaN Not a number. A symbol
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Glossary Significand The component
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Glossary Watchpoint A watchpoint is
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