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Cortex-A8 Technical Reference Manual - ARM Information Center

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• number of rows of the L2 data, parity, tag and valid physical RAM<br />

• testing of valid RAM separately or in parallel with tag RAM testing<br />

• column address LSB sequencing of 00, 01, 10, 11 or 00, 01, 11, 10.<br />

Table 11-7 shows the bit fields of L2_config[22:0].<br />

L2DLat[3:0]<br />

Design for Test<br />

Table 11-7 L2_config[22:0]<br />

L2_config bit field Field name<br />

L2_config[22:19] L2DLat[3:0]<br />

L2_config[18:17] L2TLat[1:0]<br />

L2_config[16:5] L2Rows[11:0]<br />

L2_config[4] L2ValSer<br />

L2_config[3:0] L2AdLSB[3:0]<br />

Use the L2DLat[3:0] field to select the read and write latency of the L2 data array as Table 11-8<br />

shows. The reset value of the L2DLat[3:0] field is b1111.<br />

Table 11-8 Selecting L2 data array latency with L2DLat[3:0]<br />

L2DLat[3:0] Wait states<br />

b0000 2<br />

b0001 2<br />

b0010 3<br />

b0011 4<br />

b0100 5<br />

b0101 6<br />

b0110 7<br />

b0111 8<br />

b1000 9<br />

b1001 10<br />

b1010 11<br />

b1011 12<br />

b1100 13<br />

b1101 14<br />

b1110 15<br />

b1111 16<br />

<strong>ARM</strong> DDI 0344K Copyright © 2006-2010 <strong>ARM</strong> Limited. All rights reserved. 11-7<br />

ID060510 Non-Confidential

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