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STM32F101xx, STM32F102xx, STM32F103xx, STM32F105xx and ...

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RM0008<br />

USB on-the-go full-speed (OTG_FS)<br />

within the USB data RAM. There is one Tx-FIFO push register for each in-endpoint<br />

(peripheral mode) or out-channel (host mode).<br />

The CPU receives the data from the USB by reading 32-bit words from dedicated OTG_FS<br />

addresses (pop registers). The data are then automatically retrieved from a shared Rx-FIFO<br />

configured within the 1.25 KB USB data RAM. There is one Rx-FIFO pop register for each<br />

out-endpoint or in-channel.<br />

The USB protocol layer is driven by the serial interface engine (SIE) <strong>and</strong> serialized over the<br />

USB by the full-/low-speed transceiver module within the on-chip physical layer (PHY).<br />

26.3.2 Full-speed OTG PHY<br />

The embedded full-speed OTG PHY is controlled by the OTG FS Core <strong>and</strong> conveys USB<br />

control & data signals through the full-speed subset of the UTMI+ Bus (UTMIFS). It provides<br />

the physical support to USB connectivity.<br />

The full-speed OTG PHY includes the following components:<br />

● FS/LS transceiver module used by both Host <strong>and</strong> Device. It directly drives transmission<br />

<strong>and</strong> reception on the single-ended USB lines.<br />

● integrated ID pull-up resistor used to sample the ID line for A/B Device identification.<br />

● DP/DM integrated pull-up <strong>and</strong> pull-down resistors controlled by the OTG_FS Core<br />

depending on the current role of the device. As a peripheral, it enables the DP pull-up<br />

resistor to signal full-speed peripheral connections as soon as V BUS is sensed to be at<br />

a valid level (B-session valid). In Host mode, pull-down resistors are enabled on both<br />

DP/DM. Pull-up <strong>and</strong> pull-down resistors are dynamically switched when the device’s<br />

role is changed via the host negotiation protocol (HNP).<br />

● Pull-up/pull-down resistor ECN circuit. The DP pull-up consists of 2 resistors controlled<br />

separately from the OTG_FS as per the resistor Enginering Change Notice applied to<br />

USB Rev2.0. The dynamic trimming of the DP pull-up strength allows for better noise<br />

rejection <strong>and</strong> Tx/Rx signal quality.<br />

● V BUS sensing comparators with hysteresis used to detect V BUS Valid, A-B Session<br />

Valid <strong>and</strong> session-end voltage thresholds. They are used to drive the session request<br />

protocol (SRP), detect valid startup <strong>and</strong> end-of-session conditions, <strong>and</strong> constantly<br />

monitor the V BUS supply during USB operations.<br />

● V BUS pulsing method circuit used to charge/discharge V BUS through resistors during<br />

the SRP (weak drive).<br />

Doc ID 13902 Rev 9 697/995

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