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Cortex-A8 R2P2.pdf - ARM Information Center

Cortex-A8 R2P2.pdf - ARM Information Center

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Design for TestOne methodology for testing the shadow logic of the RAMs is to test through theRAMs. The ATPG tool uses this gate for easier testability of this logic for thismethodology. However, if there is a scan chain or bypass wrapper within the RAM, thisgate prevents the clock from toggling during shift and causes the chain or wrapper to beignored during test. If you do not require this gate, you can optimize it out duringsynthesis by setting SAFESHIFTRAMIF, SAFESHIFTRAMLS, orSAFESHIFTRAML2 LOW.NoteWhen removing the safe shift RAM gate from a logical unit, all RAMs in that logicalunit are affected.<strong>ARM</strong> DDI 0344E Copyright © 2006-2008 <strong>ARM</strong> Limited. All rights reserved. 11-41

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