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ARM Cortex-A15 MPCore Processor Technical Reference Manual

ARM Cortex-A15 MPCore Processor Technical Reference Manual

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Functional Description2.2.6 DFT interfaceThe processor implements a Design For Test (DFT) interface that enables an industry standardAutomatic Test Pattern Generation (ATPG) tool to test logic outside of the embedded memories.See DFT and MBIST interfaces on page A-26 for information on these test signals.2.2.7 MBIST controller interfaceThe Memory Built In Self Test (MBIST) controller interface provides support for manufacturingtesting of the memories embedded in the <strong>Cortex</strong>-<strong>A15</strong> <strong>MPCore</strong> processor. MBIST is the industrystandard method of testing embedded memories. MBIST works by performing sequences ofreads and writes to the memory based on test algorithms. See MBIST interface on page A-26 forinformation on the MBIST signals.<strong>ARM</strong> DDI 0438I Copyright © 2011-2013 <strong>ARM</strong>. All rights reserved. 2-7ID062913Non-Confidential

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