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U. Glaeser

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Conclusion<br />

An application example of an LSI chip that employs SOI devices has been described here. Against the<br />

backdrop that the SOI CMOS process has been recognized as a key technology for increasing the<br />

performance and reducing the power consumption of logic LSI circuits, there is a strong need by<br />

information distribution services for LSI chips of higher performance and lower power consumption,<br />

improvement of the quality of thin-film SOI substrates based on Si substrates, lower cost, and development<br />

of suitability for mass production. Furthermore, progress in explaining the physical phenomena<br />

of SOI devices is progressing, and another major factor is the establishment of control technology in<br />

both device design and circuit design for the characteristics that bulk Si devices do not have, especially<br />

the floating body effect. On the other hand, it is said that future LSI chips will be oriented to the systemon-a-chip<br />

era, in which memory circuits, RF circuits, analog circuits, etc., will reside on the same chip,<br />

rather than digital logic circuits alone. Although SOI structures are effective in reducing cross talk, as<br />

has already been described, problems exist concerning the establishment of a precise circuit model of<br />

the devices, which is necessary for application of SOI devices to analog circuits as well as ascertaining<br />

the influence of the floating body effect on circuit precision. It is also necessary to continue with studies<br />

on countermeasures for memory pass gate leakage in DRAM, SRAM, etc.<br />

In the future, if progress in finer designs leads to the 0.1 µm era, in which the standard LSI supply<br />

voltage will be reduced to about 1 V, we believe that the superiority of SOI CMOS over Si CMOS will<br />

become even more remarkable.<br />

Acknowledgments<br />

The author thanks Y. Sato, Y. Matsuya, T. Douseki, M. Harada, Y. Ohtomo, J. Kodate, and J. Yamada for<br />

helpful discussions and advice.<br />

References<br />

1. National Technology Roadmap for Semiconductors, 1994 Edition, SIA (Semiconductor Industry<br />

Association).<br />

2. International Technology Roadmap for Semiconductors, 1999 Edition, SIA.<br />

3. Gelsinger, P. P., Microprocessors for the new millennium, ISSCC Digest of Technical Papers, ISSCC,<br />

p. 22, Feb. 2001.<br />

4. Izumi, K., Doken, M., and Ariyoshi, H., CMOS devices fabricated on buried SiO 2 layers formed by<br />

oxygen implantation into silicon, Electron. Lett., 14, p. 593, 1978.<br />

5. Kodate, K., et al., Suppression of substrate crosstalk in mixed analog-digital CMOS circuits by using<br />

high-resistivity SIMOX wafers, Ext. Abstracts of the SSDM, p. 362, 1999.<br />

6. Ohtomo, Y., et al., A single-chip 3.5 Gb/s CMOS/SIMOX transceiver with automatic-gain-control<br />

and automatic-power-control circuits, ISSCC Digest of Technical Papers, p. 58, 2000.<br />

7. Kado, Y., et al., Substantial advantages of fully-depleted CMOS/SIMOX devices as low-power highperformance<br />

VLSI components compared with its bulk-CMOS counterpart, IEDM Technical Digest,<br />

p. 635, 1995.<br />

8. International Technology Roadmap for Semiconductors, 1999 Edition, Front End Processes, Starting<br />

materials technology requirements, SIA.<br />

9. Maszara, W. P., Silicon-on-insulator material for deep submicron technologies, Ext. Abstracts of the<br />

SSDM, p. 294, 1998.<br />

10. Yonehara, T., et al., Epitaxial layer transfer by bond and etch back of porous Si, Appl. Phys. Lett., 64,<br />

p. 2108, 1994.<br />

11. Auberton-Herve, A. J., SOI: Materials to systems, IEDM Technical Digest, p. 3, 1996.<br />

12. Nakashima, S. and Izumi, K., Practical reduction of dislocation density in SIMOX wafers, Electron.<br />

Lett., 26, p. 1647, 1990.<br />

© 2002 by CRC Press LLC

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