15.01.2013 Views

U. Glaeser

U. Glaeser

U. Glaeser

SHOW MORE
SHOW LESS

Create successful ePaper yourself

Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.

to minimize jitter, its size is constrained to less than about 1nF. The charge pump current I CH is constrained<br />

to be greater than about 10 µA depending on the level of charge pump charge injection offsets.<br />

The problem of selecting device parameters is made more difficult by a number of constraining factors.<br />

First, ω N and ζ both depend on all of the device parameters. Second, the maximum limit for C and<br />

minimum limit for I CH will impose a minimum limit on ω N, which already has a maximum limit due to<br />

ω REF and other possible limits due to jitter and reference sideband issues. Third and most important, all<br />

worst-case combinations of device parameters due to process, voltage, and temperature variability must<br />

lead to acceptable loop dynamics.<br />

Handling the interdependence between the loop parameters and device parameters is simplified by<br />

observing some proportionality relationships and scaling rules that directly result from the equations<br />

that relate the loop and device parameters. They are summarized in Table 10.4 and Table 10.5, respectively.<br />

The constant frequency scaling rules can transform one set of device parameters to another without<br />

changing any of the loop parameters. The proportional frequency scaling rules can transform one set of<br />

device parameters, with the resistance, capacitances, or charge pump current held constant, to another<br />

set with scaled loop frequencies and the same damping factor. These rules make it easy to make adjustments<br />

to the possible device parameters with controlled changes to the loop parameters.<br />

With the many constraints on the loop and device parameters established by both the system environment<br />

and the circuit implementation, the design of a PLL typically turns into a compromise between<br />

conflicting design requirements. It is the job of the designer to properly balance these conflicting requirements<br />

and determine the best overall solution.<br />

PLL Design Strategy<br />

Two general approaches can be used to determine the device parameters for a PLL design. The first<br />

approach is based on an open-loop analysis. This approach makes it easier to visualize the stability of the<br />

design from a frequency domain perspective. The open-loop analysis also easily accommodates more<br />

complicated loop filters. The second approach is based on a closed-loop analysis. This approach involves<br />

© 2002 by CRC Press LLC<br />

TABLE 10.4 Proportionality Relationships between PLL Loop and Device<br />

Parameters<br />

I CH<br />

ω N ω C ζ ω C�ω N<br />

0.5<br />

ICH 0.5<br />

indep. ICH 0.5<br />

1/ICH R indep. 1�R R 1�R<br />

C 1�C 0.5<br />

indep. C 0.5<br />

C 0.5<br />

(C >> C2) C2 indep. 1�C2 indep. 1�C2 (C >> C2) TABLE 10.5 PLL Loop and Device Parameter Scaling Rules<br />

Constant frequency scaling: Given x, suppose that<br />

I CH ⋅ x → I CH<br />

C I ⋅ x → C I<br />

R�x → R<br />

Then all parameters, G O, Ω I, and ζ, remain constant<br />

Proportional frequency scaling: Given x, suppose that<br />

I CH ⋅ x→ I CH I CH ⋅ x 2 → I CH I CH→ I CH<br />

C I/x→ C I C I→ C I C I�x 2 → C I<br />

R→ R R�x→ R R ⋅ x→ R<br />

Then, Then,<br />

G O→ G O<br />

ω I ⋅ x→ ω I<br />

ω C/ω N→ ω C/ω N<br />

ζ→ ζ<br />

where C I represents all capacitors and ω Ι represents all frequencies.<br />

s

Hooray! Your file is uploaded and ready to be published.

Saved successfully!

Ooh no, something went wrong!